H01L2224/48482

Remapped Packaged Extracted Die
20180047685 · 2018-02-15 · ·

A remapped extracted die is provided. The remapped extracted die includes an extracted die removed from a previous integrated circuit package. The extracted die includes a plurality of original bond pads having locations that do not correspond to desired pin assignments of a new package base and an interposer, bonded to the extracted die. The interposer includes first bond pads configured to receive new bond wires from the plurality of original bond pads, and second bond pads corresponding to desired pin assignments of the new package base, each individually electrically coupled to one of the first bond pads and configured to receive new bond wires from package leads or downbonds of the new package base.

FLEXIBLY-WRAPPED INTEGRATED CIRCUIT DIE

Embodiments of a flexibly-wrapped integrated circuit die device and a method for mounting a flexibly-wrapped integrated circuit die to a substrate are disclosed. In some embodiments, the flexibly-wrapped integrated circuit die device includes a substrate and a flexible integrated circuit die coupled to the substrate in a substantially vertical orientation with reference to a surface of the substrate.

Ball bond impedance matching

Methods and apparatus for providing an interconnection including a stack of wirebond balls having a selected impedance. The wirebond balls may have a size, which may comprise a radius, configured for the selected impedance. The stack may comprise a number of wirebond balls configured for the selected impedance and/or may comprise a material selected for the selected impedance. In embodiments, the selected impedance is primarily resistive (e.g., 50 Ohms), such that the overall reactance is minimized.

SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF
20250372567 · 2025-12-04 · ·

A semiconductor device according to the present embodiment includes a first pad, a second pad, a third pad, a first bonding wire joined to the first pad, a second bonding wire provided on the second pad with a second stud bump in between, and a third bonding wire joined to the third pad. The second pad is positioned between the first and third pads. The second bonding wire includes a second ball portion and a second wire portion, the second ball portion being joined to the second stud bump, the second wire portion extending from the second ball portion.