Patent classifications
B23K1/008
WARPAGE SUPPRESSING REFLOW OVEN
Disclosed is a warpage suppressing reflow oven, which comprises a reflow oven body, where a perforated steel plate circulating device comprising a perforated steel plate is disposed at a reflow-oven inner oven. A plurality of downdraft modules is arranged in the perforated steel plate, and the downdraft acting forces thereof face the upper panel. More than one air extractor is communicated with the plurality of downdraft modules via a plurality of pipelines. Under actuation of the air extractors, the downdraft modules generate downdraft acting forces to the bottom surfaces of the products, so that the products are flatly attached to the universal perforated carriers without warpage in a heat soldering process. Thereby, more uniform heating of the products and better contact of solder joints and effectively improving the yield of reflow soldering operations are achieved.
PROTECTIVE HEAT SHIELDS FOR THERMALLY SENSITIVE COMPONENTS AND METHODS FOR PROTECTING THERMALLY SENSITIVE COMPONENTS
A method of manufacturing a printed circuit board assembly includes providing a circuit board, positioning a plurality of components including at least one thermally-sensitive component having a maximum temperature threshold on the circuit board, positioning a customized protective heat shield on the thermally-sensitive component, exposing the circuit board (having the thermally-sensitive component disposed thereon and the customized protective heat shield disposed on the thermally-sensitive component) to a high-temperature environment wherein temperatures exceed the maximum temperature threshold of the thermally-sensitive component, and removing the customized protective heat shield from the thermally-sensitive component. Customized protective heat shields are also provided.
PROTECTIVE HEAT SHIELDS FOR THERMALLY SENSITIVE COMPONENTS AND METHODS FOR PROTECTING THERMALLY SENSITIVE COMPONENTS
A method of manufacturing a printed circuit board assembly includes providing a circuit board, positioning a plurality of components including at least one thermally-sensitive component having a maximum temperature threshold on the circuit board, positioning a customized protective heat shield on the thermally-sensitive component, exposing the circuit board (having the thermally-sensitive component disposed thereon and the customized protective heat shield disposed on the thermally-sensitive component) to a high-temperature environment wherein temperatures exceed the maximum temperature threshold of the thermally-sensitive component, and removing the customized protective heat shield from the thermally-sensitive component. Customized protective heat shields are also provided.
SCREEN TO BE USED DURING BRAZING OF HEAT EXCHANGER AND BRAZING METHOD FOR HEAT EXCHANGER
A screen for brazing a heat exchanger including a plurality of core plates and a base plate. The plurality of core plates may be formed from an aluminum alloy brazing sheet containing magnesium and may have a shape having a taper portion at a periphery. The base plate may be larger and thicker than a core plate of the plurality of core plates. The plurality of core plates and the base plate may be heated and brazed under an inert gas atmosphere. The screen may include a metal tube enclosing a stacked body of the plurality of core plates. The tube may follow the outer border of the plurality of core plates such that a specific minute gap is defined between an inner wall face of the tube and a tip edge of the taper portion.
COPPER/CERAMIC BONDED BODY, INSULATING CIRCUIT BOARD, METHOD FOR PRODUCING COPPER/CERAMIC BONDED BODY, AND METHOD FOR PRODUCING INSULATING CIRCUIT BOARD
This copper/ceramic bonded body includes: a copper member made of copper or a copper alloy; and a ceramic member made of nitrogen-containing ceramics, the copper member and the ceramic member are bonded to each other, in which, between the copper member and the ceramic member, an active metal nitride layer containing nitrides of one or more active metals selected from Ti, Zr, Nb, and Hf is formed on a ceramic member side, and a Mg solid solution layer in which Mg is solid-dissolved in a Cu matrix is formed between the active metal nitride layer and the copper member, and Cu-containing particles composed of either one or both of Cu particles and compound particles of Cu and the active metal are dispersed in an interior of the active metal nitride layer.
CENTER SUPPORT FOR SUPPORTING SOLDER MATERIAL, TRANSPORT UNIT, AND SOLDERING SYSTEM HAVING A CENTER SUPPORT
Center support for supporting solder material during the transport along a transport direction through a soldering system, transport unit, and soldering system having such a center support.
Reflow oven
The present disclosure provides a reflow oven, which comprises: a soldering section configured to treat a circuit board to be soldered and provided with N soldering sub-zones; a purification section comprising M purification sub-zones, wherein each of the M purification sub-zones is in communication with one of the N soldering sub-zones, and M is less than or equal to N; a controllable discharge pipeline and K discharge branch pipes, each of the K discharge branch pipes communicating one of the M purification sub-zones with the controllable discharge pipeline; and a valve device configured to, at the inlet thereof, connect with the outlet of the controllable discharge pipeline to control open/close of the communication between the controllable discharge pipeline and the external environment. The reflow oven provided by the present disclosure can work in an air mode and in an inert gas mode.
Reflow oven
The present disclosure provides a reflow oven, which comprises: a soldering section configured to treat a circuit board to be soldered and provided with N soldering sub-zones; a purification section comprising M purification sub-zones, wherein each of the M purification sub-zones is in communication with one of the N soldering sub-zones, and M is less than or equal to N; a controllable discharge pipeline and K discharge branch pipes, each of the K discharge branch pipes communicating one of the M purification sub-zones with the controllable discharge pipeline; and a valve device configured to, at the inlet thereof, connect with the outlet of the controllable discharge pipeline to control open/close of the communication between the controllable discharge pipeline and the external environment. The reflow oven provided by the present disclosure can work in an air mode and in an inert gas mode.
Reflow method and system
A system for reflowing a semiconductor workpiece including a stage, a first vacuum module and a second vacuum module, and an energy source is provided. The stage includes a base and a protrusion connected to the base, the stage is movable along a height direction of the stage relative to the semiconductor workpiece, the protrusion operably holds and heats the semiconductor workpiece, and the protrusion includes a first portion and a second portion surrounded by and spatially separated from the first portion. The first vacuum module and the second vacuum module respectively coupled to the first portion and the second portion of the protrusion, and the first vacuum module and the second vacuum module are operable to respectively apply a pressure to the first portion and the second portion. The energy source is disposed over the stage to heat the semiconductor workpiece held by the protrusion of the stage.
Reflow method and system
A system for reflowing a semiconductor workpiece including a stage, a first vacuum module and a second vacuum module, and an energy source is provided. The stage includes a base and a protrusion connected to the base, the stage is movable along a height direction of the stage relative to the semiconductor workpiece, the protrusion operably holds and heats the semiconductor workpiece, and the protrusion includes a first portion and a second portion surrounded by and spatially separated from the first portion. The first vacuum module and the second vacuum module respectively coupled to the first portion and the second portion of the protrusion, and the first vacuum module and the second vacuum module are operable to respectively apply a pressure to the first portion and the second portion. The energy source is disposed over the stage to heat the semiconductor workpiece held by the protrusion of the stage.