B01D2258/0216

Device and system for decomposing and oxidizing gaseous pollutant
10898853 · 2021-01-26 · ·

The invention provides a device and system for decomposing and oxidizing of gaseous pollutants. A novel reaction portion reduces particle formation in fluids during treatment, thereby improving the defect of particle accumulation in a reaction portion. Also, the system includes the device, wherein a modular design enables the system to have the advantage of easy repair and maintenance.

Ozone abatement method for semiconductor manufacturing system

An apparatus and method for abating ozone and reducing sulfuric acid from an exhaust stream. In a semiconductor manufacturing plant the processing of wafers involves the cleaning and etching of wafers, the resultant processing may produce gasses which must be abated. The apparatus and method utilizes UV light in high doses to convert ozone (O.sub.3) to oxygen (O.sub.2). By ensuring laminar flow through the UV light chambers, the efficiency of the system is sufficient to allow for the remaining impurities in the exhaust air to be removed through the use of an RTO.

Apparatus And Method For Solvent Recovery From Drying Process
20210008488 · 2021-01-14 ·

Method and apparatus for condensing a majority of the solvent in a process gas stream at low temperatures, e.g., below the freezing point of water, ca. 5 C. The gas stream exiting the condenser step may be further processed in one or more emission control devices, such as a single or multi-step series of concentrator devices, such as zeolite concentrator devices. One or more emission control operations can be carried out downstream of the single or multi-step concentrators. The aforementioned condensing process enables the one or more concentrators to operate in a favorable temperature range for removal of 99% or more of VOC, thereby meeting or exceeding strict environmental regulations.

Apparatus for gaseous byproduct abatement and foreline cleaning
10889891 · 2021-01-12 · ·

Embodiments disclosed herein include an abatement system and method for abating compounds produced in semiconductor processes. The abatement system includes a remote plasma source for generating an oxidizing plasma for treating exhaust gases from a deposition process performed in the processing chamber, the treatment assisting with the trapping particles in an exhaust cooling apparatus. The remote plasma source then generates a cleaning plasma for treating exhaust gases from a cleaning process performed in the processing chamber, the cleaning plasma reacting with the trapped particles in the exhaust cooling apparatus and cleaning the exhaust cooling apparatus.

SUBSTRATE PROCESSING APPARATUS HAVING EXHAUST GAS DECOMPOSER, AND EXHAUST GAS PROCESSING METHOD THEREFOR
20210002761 · 2021-01-07 ·

Disclosed is a substrate processing apparatus and the method of processing an exhaust gas. The substrate processing apparatus and the method of processing an exhaust gas according to the present invention, an exhaust gas decomposition module may decompose a source gas exhausted from a process chamber to decompose a ligand of the source gas. Also, the ligand and the source gas of which the ligand has been decomposed may be put in a stabilized state by reacting with separately supplied O.sub.2, N.sub.2O, or O.sub.3, and then, may be changed to a mixed gas including a reactant gas mixed therewith. Subsequently, the mixed gas may flow into the exhaust pump and may be emitted. Alternatively, the ligand and the source gas may be mixed with the reactant gas and may be emitted. Therefore, the ligand and the source gas of which the ligand has been decomposed may not react with the reactant gas or heat which occurs in the exhaust pump, and thus, the ligand-decomposed source gas and the ligand flowing into the exhaust pump are not deposited on an inner surface of the exhaust pump. Also, the ligand-decomposed source gas and ligands piled in the exhaust pump are not exploded.

ABATEMENT SYSTEM FOR PYROPHORIC CHEMICALS AND METHOD OF USE

An abatement system for pyrophoric chemicals where the materials are captured or controlled by a hazard volume and fed to a vaporizer in an oxygen deprived environment. Materials are heated until vaporized while mixed with nitrogen. The mixture exits the system through a reaction column. The system is monitored by oxygen sensors, smoke detectors and temperature sensors.

Substrate transfer device and substrate transfer method

An atmospheric transfer device 20 includes a wafer transfer mechanism 101 holding and transferring a wafer W; a housing 100 accommodating the wafer transfer mechanism 101; a gas supply unit 110 supplying an inert gas into the housing 100; a gas circulation unit 140 returning a gas discharged from the housing 100 back into the housing 100; and a foreign substance removing unit 150 removing a foreign substance contained in the gas discharged from the housing 100. The foreign substance removing unit 150 includes a humidifying unit 160 configured to add moisture to the gas discharged from the housing 100; a filter 170 configured to adsorb and remove, by using the moisture, the foreign substance contained in the gas humidified by the humidifying unit 160; and a dehumidifying unit 180 configured to remove the moisture from the gas from which the foreign substance is removed by the filter 170.

Apparatus for collection and subsequent reaction of liquid and solid effluent into gaseous effluent

Embodiments disclosed herein include an abatement system for abating compounds produced in semiconductor processes. The abatement system includes an exhaust cooling apparatus located downstream of a plasma source. The exhaust cooling apparatus includes a plate and a cooling plate disposed downstream of the plate. During operation, materials collected on the plate react with cleaning radicals to form a gas. The temperature of the plate is higher than the temperature of the cooling plate in order to improve the reaction rate of the reaction of the cleaning radicals and the materials on the plate.

GAS ABATEMENT APPARATUS

Embodiments of the present disclosure relate to gas abatement apparatus and effluent management. The apparatus described herein include a high pressure process chamber and a containment chamber surrounding the process chamber. A high pressure fluid delivery module is in fluid communication with the high pressure process chamber and is configured to deliver a high pressure fluid to the process chamber. An effluent management module includes a muffler assembly to effluent pressure reduction and a plurality of scrubbers provide for treatment of effluent.

METHODS AND SYSTEMS FOR REMOVING AMMONIA FROM A GAS MIXTURE

Described are methods, devices, and systems useful for removing gaseous ammonia from a gas mixture at a pressure in an ambient pressure range by allowing the ammonia to adsorb onto a solid adsorbent, as well as related systems and methods.