Calibration systems, additive manufacturing systems employing the same, and methods of calibrating include a plurality of electron beam guns. One calibration system includes an imaging device positioned to capture one or more images of an impingement of electron beams emitted from the plurality of electron beam guns on a surface within a build chamber of the electron beam additive manufacturing system and an analysis component communicatively coupled to the imaging device. The analysis component is programmed to receive image data corresponding to the one or more images, determine one or more calibration parameters from the image data, and transmit one or more instructions to the plurality of electron beam guns in accordance with the one or more calibration parameters.

Devices, systems and methods for calibrating and operating an additive manufacturing system are disclosed. A calibration system for an electron beam additive manufacturing system having a plurality of electron beam guns includes a calibration probe positioned in a build chamber of the electron beam additive manufacturing system, a sensing device positioned to measure and acquire a response generated as a result of impingement of electron beams emitted from the plurality of electron beam guns on the calibration probe, the sensing device generating a response signal as a result of the measured and acquired response, and an analysis component communicatively coupled to the sensing device and programmed to analyze and evaluate the response signal.

Devices, systems and methods for calibrating and operating an additive manufacturing system are disclosed. A calibration system for an electron beam additive manufacturing system having a plurality of electron beam guns includes a calibration probe positioned in a build chamber of the electron beam additive manufacturing system, a sensing device positioned to measure and acquire a response generated as a result of impingement of electron beams emitted from the plurality of electron beam guns on the calibration probe, the sensing device generating a response signal as a result of the measured and acquired response, and an analysis component communicatively coupled to the sensing device and programmed to analyze and evaluate the response signal.

Devices, systems, and methods for calibrating for an electron beam additive manufacturing system. The electron beam manufacturing system includes electron beam guns. A calibration system includes an optical pyrometer. The optical pyrometer captures thermal radiation emitted from raw material. An analysis component is communicatively coupled to the optical pyrometer. The analysis component is programmed to determine calibration parameters from information from the optical pyrometer and a phase transition temperature.

Devices, systems, and methods for calibrating for an electron beam additive manufacturing system. The electron beam manufacturing system includes electron beam guns. A calibration system includes an optical pyrometer. The optical pyrometer captures thermal radiation emitted from raw material. An analysis component is communicatively coupled to the optical pyrometer. The analysis component is programmed to determine calibration parameters from information from the optical pyrometer and a phase transition temperature.

Apparatus for additively manufacturing three-dimensional objects by means of successive layerwise selective irradiation and consolidation of layers of a build material which can be consolidated by means of an energy beam, which apparatus comprises an irradiation device adapted to guide an energy beam across a build plane, wherein a calibration device is provided comprising a positioning unit, a determination unit and a calibration unit, preferably arranged in a process chamber of the apparatus, that is adapted to at least partially reflect the energy beam, wherein the irradiation device is adapted to guide the energy beam to the calibration unit for generating a reflected part of the energy beam, wherein the positioning unit is adapted to position the irradiation device dependent on at least one parameter of the reflected part of the energy beam determined via the determination unit.

Examples of a method of operating an additive manufacturing system, a three-dimensional (3D) printing system and a non-transitory machine-readable medium are described. In an example, a build material is supplied to a print region of an additive manufacturing system. A temperature distribution, corresponding to a pattern, of at least a surface of the build material is generated. An image of the pattern is captured using a thermal sensor. Image data representative of the image of the pattern is compared with data representative of an expected position of the pattern. On the basis of the comparing, difference data indicative of a difference between a position of the thermal sensor during capture of the image and an expected position of the thermal sensor associated with the expected position of the pattern is generated. Operation of the additive manufacturing system is controlled at least in dependence on the difference data.

An electron beam source including a cathode, an anode, a means for deflecting an electron beam over a target surface and at least one vacuum pump, the electron beam source further including a contraction area arranged between the anode and the means for deflecting the electron beam where a hole in the contraction area is aligned with a hole in the anode with respect to the cathode, a first vacuum pump is arranged between the contraction area and the anode and a second vacuum pump is arranged above the anode, a gas inlet is provided between the contraction area and the means for deflecting the electron beam, wherein a first crossover of the electron beam is arranged between the cathode and the anode and a second crossover is arranged at or in close proximity to the contraction area.

A method includes illuminating a drop with a pulse of light from a light source. A duration of the pulse of light is from about 0.0001 seconds to about 0.1 seconds. The method also includes capturing an image, video, or both of the drop. The method also includes detecting the drop in the image, the video, or both. The method also includes characterizing the drop after the drop is detected. Characterizing the drop includes determining a size of the drop, a location of the drop, or both in the image, the video, or both.

A method includes illuminating a drop with a pulse of light from a light source. A duration of the pulse of light is from about 0.0001 seconds to about 0.1 seconds. The method also includes capturing an image, video, or both of the drop. The method also includes detecting the drop in the image, the video, or both. The method also includes characterizing the drop after the drop is detected. Characterizing the drop includes determining a size of the drop, a location of the drop, or both in the image, the video, or both.