Patent classifications
H04N5/372
Bidirectional TDI line image sensor
The present disclosure provides a bidirectional TDI line image sensor. The bidirectional TDI line image sensor according to one embodiment of the present invention comprises: a pixel unit, which has N line sensors having M CCDs arranged in a line and being arranged in a scan direction, moves, in the scan direction, charges accumulated in the respective columns of the line sensors, and accumulates the same; and an output unit for parallelly receiving as inputs the charges accumulated in the pixel unit from the respective columns, performing analog-to-digital conversion on and storing the charges, and then sequentially outputting same.
IN PIXEL TIME AMPLIFIER FOR LIDAR APPLICATIONS
Techniques, systems, architectures, and methods for amplifying the time difference between events detected on a focal plane array, allowing greater resolution than that afforded by a reference clock are herein disclosed.
Data readout power saving techniques for shift register structure
A data transmission circuit of an image sensor. In one embodiment, the data transmission circuit includes a plurality of banks coupled in a series. A peripheral bank of the plurality of transmission banks is coupled to a function logic. Each bank includes a plurality of local buffers coupled to a local buffer control and a plurality of global buffers coupled to a global buffer control. The local buffers are settable to their enabled or disabled state by a bank enable command at the local buffer control. The enabled local buffers are configured to transfer local data to shift registers of their respective bank. The disabled local buffers are configured not to transfer the local data to the shift register of their respective bank.
RAMAN SPECTROMETER
There are disclosed methods and apparatus (10) for measuring Raman spectral features (52) of a sample (12), from which background light of variable intensity is also received, for example due to the incidence of ambient light (14) or due to variable fluorescence. Detection pixels (42) and storage pixels (44) are defined on a CCD device (40). Laser probe light (22) is directed to the sample. In a repeated cycle of first and second intervals, in each first interval background light is received at detection pixels, and in each second interval both background light and scattered laser probe light is received at the detection pixels. The accumulated signal from each of the first and second intervals is retained in the storage pixels during the second and first intervals respectively. In other aspects laser probe light is directed to the sample during both of the first and second intervals, but has a different wavelength in each interval.
CCD PHOTODETECTOR AND ASSOCIATED METHOD FOR OPERATION
A CCD photodetector and an associated method for operation. A CCD photodetector for LIDAR systems is described, including a shift register including a plurality of consecutively situated register cells, including a first register cell and a last register cell, a loading line for loading the shift register, and a read-out amplifier for unloading the shift register, the loading line and the read-out amplifier each being connected to the first register cell. A corresponding method for operating a CCD photodetector is also described.
SOLID-STATE IMAGING DEVICE AND IMAGING APPARATUS
The present technique relates to a solid-state imaging device and an imaging apparatus that enable provision of a solid-state imaging device having superior color separation and high sensitivity.
The solid-state imaging device includes a semiconductor layer in which a surface side becomes a circuit formation surface, photoelectric conversion units PD1 and PD2 of two layers or more that are stacked and formed in the semiconductor layer, and a longitudinal transistor Tr1 in which a gate electrode is formed to be embedded in the semiconductor layer from a surface of the semiconductor layer. The photoelectric conversion unit PD1 of one layer in the photoelectric conversion units of the two layers or more is formed over a portion of the gate electrode of the longitudinal transistor Tr1 embedded in the semiconductor substrate and is connected to a channel formed by the longitudinal transistor Tr1.
IMAGE SYNCHRONIZATION DEVICE AND IMAGE INFORMATION GENERATION APPARATUS INCLUDING THE SAME
In accordance with an embodiment of the present disclosure, an image synchronization device includes a light emitting source configured to emit light at intervals of a predetermined time, a sampling phase calibration circuit configured to calibrate a sampling phase of each of the first image sensor and the second image sensor on the basis of a light emitting timing of the light emitting source and a delay calibration circuit configured to generate delay information on the basis of a result of comparison between first image information transmitted from the first image sensor and second image information transmitted from the second image sensor.
Device for machining an object by application of laser radiation
A device for machining an object by laser radiation, by photodisruption. The device includes an observation device for imaging the object and a laser scanning device by which the laser radiation is passed over a predetermined sector of the object for scanning the sector. The device includes the observation device with a first lens for imaging the object; the laser scanning device with a second lens, through which the laser radiation is guided, in which both lenses with regard to the dimension of the regions to be produced in the images and/or with regard to their focal intercept are different from each other. The device alternately images the respective region of the object in a first operating mode by the first lens and in a second operating mode by the second lens. It is thus possible to use in both operating modes a lens adapted to the intended imaging purpose.
IMAGE SENSOR
An image sensor includes a pixel array; a logic circuit configured to convert an image signal generated from the pixel array during a first period into image data; and a memory. The image data may be written in the memory during a second period, of which at least a portion overlaps the first period. The logic circuit may write dummy data in the memory during a third period overlapping the first period and not overlapping the second period.
Image sensor post processing
In one example, an apparatus is provided. The apparatus comprises an image sensor configured to generate a first raw output to represent a first intensity of incident light based on a first relationship, and to generate a second raw output to represent a second intensity of incident light based on a second relationship. The apparatus further comprises a post processor configured to: generate a first post-processed output based on the first raw output and based on the first relationship such that the first post-processed output is linearly related to the first intensity based on a third relationship, and to generate a second post-processed output based on the second raw output and based on the second relationship such that the second post-processed output is linearly related to the second intensity based on the third relationship.