Semiconductor structures and methods of the forming the same are provided. A semiconductor structure according to the present disclosure includes a source feature and a drain feature, an active region between the source feature and the drain feature, a gate structure over the active region, a frontside interconnect structure disposed over the source feature, the drain feature, and the gate structure, a backside interconnect structure disposed below the source feature, the drain feature, and the gate structure, and a storage element disposed in the backside interconnect structure.

Provided are a memory device and a method of forming the same. The memory device includes a plurality of bit lines extending along a first direction; a plurality of word lines extending along a second direction different from the first direction; a plurality of memory pillars; and a selector. The plurality of word lines are disposed over the plurality of bit lines. The plurality of memory pillars are disposed between the plurality of bit lines and the plurality of word lines, and respectively positioned at a plurality of intersections of the plurality of bit lines and the plurality of word lines. The selector is disposed between the plurality of memory pillar and the plurality of word lines. The selector extends from a top surface of one memory pillar to cover a top surface of an adjacent memory pillar. A semiconductor device having the memory device is also provided.

In an embodiment, a semiconductor device includes a first dielectric layer over a substrate and a first access transistor and a second access transistor in a memory cell of a memory array, the first access transistor and the second access transistor each including a bottom electrode in the first dielectric layer, a conductive gate in a second dielectric layer, where the second dielectric layer is over the bottom electrode and the first dielectric layer, a channel region extending through the conductive gate to contact the bottom electrode, and a top electrode over the channel region.

A semiconductor memory device includes a substrate having a conductor region thereon, an interlayer dielectric layer on the substrate, and a conductive via electrically connected to the conductor region. The conductive via has a lower portion embedded in the interlayer dielectric layer and an upper portion protruding from a top surface of the interlayer dielectric layer. The upper portion has a rounded top surface. A storage structure conformally covers the rounded top surface.

A package structure includes an integrated circuit package and a magnetic shielding structure. The integrated circuit package includes a semiconductor chip. The magnetic shielding structure surrounds the integrated circuit package, in which the magnetic shielding structure including a top plate and a bottom plate disposed on two opposite sides of the integrated circuit package.

An integrated circuit (IC) device may include a single substrate that includes a single chip, and a plurality of memory cells spaced apart from one another on the substrate and having different structures. Manufacturing the IC device may include forming a plurality of first word lines in a first region of the substrate, and forming a plurality of second word lines in or on a second region of the substrate. Capacitors may be formed on the first word lines. Source lines may be formed on the second word lines. An insulation layer that covers the plurality of capacitors and the plurality of source lines may be formed in the first region and the second region. A variable resistance structure may be formed at a location spaced apart from an upper surface of the substrate by a first vertical distance, in the second region.

A method of making an integrated circuit includes depositing a first ferromagnetic material over a substrate. The method includes applying a first magnetic field to the first ferromagnetic material. The method includes annealing the first ferromagnetic material while applying the first magnetic field to the first ferromagnetic material to set a magnetic field orientation in the first ferromagnetic material. The method includes depositing barrier material over the first ferromagnetic material. The method includes depositing a second ferromagnetic material over the barrier material. The method includes depositing an antiferromagnetic material over the second ferromagnetic material. The method includes etching the first ferromagnetic material, the barrier material, the second ferromagnetic material to define a magnetic tunneling junction, and the antiferromagnetic material, wherein the etching includes defining a sidewall of the antiferromagnetic material aligned with a sidewall of the first ferromagnetic material.

The present disclosure relates to an integrated chip. The integrated chip includes one or more lower interconnect layers arranged within one or more stacked inter-level dielectric (ILD) layers over a substrate. An etch stop structure is disposed over the one or more lower interconnect layers and a bottom electrode is disposed over the etch stop structure. The bottom electrode electrically contacts the one or more lower interconnect layers. A magnetic tunnel junction (MTJ) stack is disposed over the bottom electrode. The MTJ stack has sidewalls arranged at a first angle with respect to a bottom surface of the MTJ stack. A top electrode is disposed over the MTJ stack. The top electrode has sidewalls arranged at a second angle with respect to a bottom surface of the top electrode. The second angle is greater than the first angle.

A semiconductor device includes logic circuitry including a transistor disposed over a substrate, multiple layers each including metal wiring layers and an interlayer dielectric layer, respectively, disposed over the logic circuitry, and memory arrays. The multiple layers of metal wiring include, in order closer to the substrate, first, second, third and fourth layers, and the memory arrays include lower multiple layers disposed in the third layer.

A method for fabricating magnetoresistive random-access memory cells (MRAM) on a substrate is provided. The substrate is formed with a magnetic tunneling junction (MTJ) layer thereon. When the MTJ layer is etched to form the MRAM cells, there may be metal components deposited on a surface of the MRAM cells and between the MRAM cells by chemical reaction. The metal components are then removed by chemical reaction.