A CMOS optical sensor comprises spare readout channels to replace readout channels found defective at the end of the manufacturing process. These spare readout channels are dispatched over the width of the optical sensor (corresponding to the row direction) in the form of spare groups G.sub.m1, G.sub.m2, Gm.sub.3 of m spare readout channels each, m integer at least equal to 1. Each spare group is inserted between two successive default groups Gn.sub.1 and Gn.sub.2 of n default readout channels each and coupling means SW1 are configured to replace a defective default readout channel in a default group as well as any default readout channels of the group between the defective one and the spare group next to the default group of concern. Advantageously, for a row Row.sub.i being currently selected for CDS reading each pixel in the row, a row noise level V.sub.RN.sub.i is obtained from the A spare readout channels that are not used in the implemented repairing scheme, by sampling an analogic DC reference signal by each of the A spare readout channels and averaging the A values Sp.sub.k obtained. The row reference value V.sub.RN.sub.i is then subtracted from each of the pixel digital signal S.sub.i,j outputs for the current selected row, to finally obtain a signal value d.sub.i,j with row noise suppression.

Systems and methods are disclosed herein to detect pixels exhibiting anomalous behavior in captured image frames. In some examples, temporal anomalous behavior may be identified, such as flickering pixels exhibiting large magnitude changes in pixel values that vary rapidly from frame-to-frame. In some examples, spatial anomalous behavior may be identified, such as pixels exhibiting values that deviate from an expected linear response in comparison with other neighbor pixels.

A solid-state imaging device includes a photodetecting section, a vertical shift register section, first row selection lines, and second row selection lines. The vertical shift register section provides the row selection lines of the m-th row with common row selection signals.

An imaging system may include an array of image pixels and column readout circuits coupled to each column. The column readout circuits may include test data injection circuitry and converter circuitry coupled to column memory via switching circuits. The injection circuitry may enable the switching circuits so that pixel data is stored on the column memory as rows of an image frame. The injection circuitry may disable the switching circuits and may inject test bits onto the column memory while the switching circuits are disabled. The column memory may store the test bits as one or more rows of the image frame interspersed among rows of the pixel data. Verification circuitry coupled to the column readout circuits may process the test data bits in the image frame to verify proper functionality of some or all of the imaging system without disrupting normal imaging operations by the imaging system.

An image processing apparatus comprises: an acquisition unit configured to acquire a first viewpoint image corresponding to a first partial pupil region of an exit pupil of as imaging optical system divided into a plurality of partial pupil regions in a first direction, and a captured image corresponding to the exit pupil; and a correction unit configured to correct shading of a first pixel of a first pixel group based on a first ratio of a sum of the first pixel group of the first viewpoint image arranged in a second direction orthogonal to the first direction to a sum of a pixel group of the captured image corresponding to a position of the first pixel group.

There is provided an encoding apparatus. An acquiring unit acquires an index value of a noise amount by analyzing at least a part of an optical black area that is included in raw data. A quantizing unit quantizes the raw data based on the index value. An encoding unit encodes the quantized raw data. If the index value is a first value, the quantizing unit quantizes the raw data with a first quantization step. If the index value is a second value corresponding to a larger noise amount than a noise amount in a case where the index value is the first value, the quantizing unit quantizes the raw data with a second quantization step that is larger than the first quantization step.

A radiation imaging apparatus, comprising a sensor array in which a plurality of sensors are arranged, each includes a first holding unit for holding a first signal obtained with a first sensitivity and a second holding unit for holding a second signal obtained with a second sensitivity, a row selecting unit for selecting each sensor on a row basis, a signal readout unit for reading out a signal from each of the selected sensors, and a control unit configured to perform first control to control the sensor array so as to make the first holding units hold the first signals and make the second holding units hold the second signals, and perform second control to control the row selecting unit so as to make the signal readout unit read out the first and the second signals.

A method of defect pixel correction, includes, receiving at least one center pixel signal in a plurality of frames, receiving a plurality of neighboring pixel signals adjacent the center pixel in the plurality of frames, determining a brightness of the center pixel signal, determining the brightness of the plurality of neighboring pixel signals, determining if the brightness of the center pixel signal exceeds a wounded pixel threshold of the plurality of neighboring pixel signals, determining a location of the center pixel having the brightness greater than the wounded pixel threshold in at least one frame, determining a number of reoccurrences of the center pixel having the brightness greater than the wounded pixel threshold, determining if the number of reoccurrences exceeds a defect pixel threshold and updating the at least one center pixel signal to a mean of the plurality of neighboring pixel signals.

A third line that supplies a first potential to a first semiconductor region of a first detection pixel and a fourth line that supplies a second potential to the first semiconductor region of a second detection pixel are provided. An interval between a partial line of the third line and a partial line of the fourth line is longer than an interval between a partial line of a first line and a partial line of a second line which extend along the partial line of the third line and the partial line of the fourth line.

A defective-pixel detection method included in an image-processing procedure, including a pixel-processing procedure applied to pixels of an image supplied by an image sensor. Each pixel is associated with a classification value representing a state of said pixel. The method includes, for each pixel: applying the pixel-processing procedure; analysing a result of the pixel-processing procedure; in the event of obtaining an unusual result representing a defect on a photosite of the image sensor that supplied said pixel, incrementing a number of detections of an unusual result for said pixel; and associating said pixel with a classification value representing a defective pixel when said number reaches a first threshold.