A method of monitoring a property of a dissolution of an at least partially solid dosage form during a dissolution process is disclosed. The method includes at least partially dissolving the dosage form, and during the dissolution of the dosage form, simultaneously monitoring the property of the dissolution of the dosage form in progress by low coherence interferometry.

A method for thermally-sensitive coating analysis of a component includes imaging the coated, exposed component over a range of distinct frequencies as selected by a narrowband variable filter; estimating parameters of non-uniformity correction (NUC) for every pixel at every wavelength; constructing a 2D temperature map on a pixel-by-pixel basis using the non-uniformity correction; and mapping the 2D temperature map to a 3D computer aided design (CAD) model.

The present invention is to provide a method capable of visualizing a coating state of a protein adsorbent even on a substrate having a complicated structure, in particular, for use on a surface of an apparatus for culturing or growing living cells. The method comprises coating a series of substrates with selected protein adsorbents and fluorescent dye, irradiating selected coated substrates and determining a coating state from color development of the substrates.

A system and method for automatically and dynamically controlling a height of a cutting element on a swather or other agricultural machine based on feedback from NIR testing of the cut plant material. An NIR testing system receives and analyzes NIR reflected by the material cut at a particular cut height, and generates an actual value for an RFV or other property of interest. A user interface allows for entering a desired target value. A cut controller compares the actual value and the target value, and adjust (e.g., raises or lowers) a cutting element (by, e.g., changing a pitch of the cutting element) to change the particular cut height if the actual value for the property is different from the target value. If the actual value is substantially similar to the target value, then the cut controller maintains the position of the cutting element.

The invention relates to a measuring System, a measuring arrangement and a method for detecting measuring signals during a penetration movement of a penetration body (41) into a surface of a test body (14), in particular for hardness measurement or for determining the Scratch resistance of the surface of the test body (14), or for detecting measuring signals during a scanning movement of the penetration body (41) on the surface of the test body (14), in particular for determining the surface roughness, comprising a housing (47) provided with a power generating device (44) which is operatively connected to a penetration body (41) for generating a displacement movement of the penetration body (41) along a displacement axis (48) of the penetration body (41) and which actuates a penetration movement of the penetration body (41) into the surface to be examined of the test body (14), or which positions the penetration body (41) on the surface of the test body (14) for scanning, and further comprising at least one first measuring device (78) for measuring the penetration depth in the surface of the test body (14) or a displacement movement of the penetration body (41) along its displacement axis (48) during a scanning movement on the surface of the test body (14), wherein the power generating device (44) actuates the displacement movement of the penetration body (41) by means of a magnetic force.

A biochemical detection device with a controlled reaction incubation time includes a substrate; a probe disposed on the substrate; a dissolvable material layer disposed on the substrate, wherein the dissolvable material layer has a first opening defined therein, wherein the probe is received in the first opening; an absorbing material layer disposed on the dissolvable material layer and having a second opening defined therein, wherein the first opening communicates with the second opening and is smaller than the second opening; and a non-dissolvable material layer disposed on an inner face of the second opening of the absorbing material layer and on an exposed top face of the dissolvable material layer.

The disclosure provides methods for the direct optical visualization of graphene and its nanoscale defects on transparent substrates.

A quality control method for the preparation of dry compressed gas cylinder including passivating and/or preparing the compressed gas cylinder with the technique to be validated, filling the passivated/prepared compressed gas cylinder with gaseous carbon dioxide to a normal working pressure, wherein the gaseous carbon dioxide has a known .sup.18O isotope ratio, maintaining the pressurized gas cylinder at ambient temperature for a first predetermined period of time, and gradually emptying the pressurized gas cylinder, while simultaneously measuring the .sup.18O isotopic ratio, wherein a predetermined variation in the measured isotopic ratio of .sup.18O indicates a properly prepared cylinder.

The present invention provides a detection device, and the device comprises a testing element, wherein the testing element comprises a detection area used for detecting a presence of an analyte in a liquid sample; and a transparent area through which the test result on the detection area is read, and the transparent area includes a hydrophilic area and a hydrophobic area. Thus, the detection device reduces formation of droplets on the transparent area is reduced, that is, it avoids formation of a mist layer on the transparent area; or avoids accumulation of small droplets on the transparent area, thus to make the result on the test area be clearly read.

Embodiments of the disclosure generally relate to a system, apparatus and method for testing a coating over a semiconductor chamber component. In one embodiment, a test station comprises a hollow tube, a sensor coupled to a top end of the tube and a processing system communicatively coupled to the sensor. The hollow tube has an open bottom end configured for sealingly engaging a coating layer of the semiconductor chamber component. The sensor is configured to detect the presence of a gaseous byproduct of a reaction between a reagent disposed in the hollow tube and a base layer disposed under the coating layer. The processing system is configured to determine exposure of the base layer through the coating layer in response to information about the presence of the gaseous byproduct. In another embodiment, the processing system is communicatively coupled to each sensor of a plurality of test stations.