A workpiece inspection device 1 includes a table (3), image capturing unit fixing part (7), first light projection unit (4), second light projection unit (5), linear movement mechanism (8), turning mechanism (9), quality determination unit (10), and control unit (11). The control unit (11) performs first image capturing step of causing first light projection unit (4) to project light and causing image capturing unit (6) to capture image, detailed inspection portion-determination step of setting, portion of workpiece (2) determined to require detailed inspection based on image captured in the first image capturing step, second image capturing step of causing second light projection unit (5) to project light onto the workpiece (2) and causing image capturing unit (6) to capture image of the detailed inspection-requiring portion, and quality determination step of determining quality of the detailed inspection-requiring portion based on image captured in the second image capturing step.

A system for simultaneously measuring the indentation hardness properties, span properties, and resilience properties of a mattress includes a first indentation means and a second indentation means, and means for urging the first indentation means and the second indentation means into the mattress with a predetermined force, and also includes laser means for projecting a laser line configured to map, preferably by photographic triangulation, the amplitude, shape, and time-dependency of the resultant deflection of the mattress surface between the first indentation means and the second indentation means. A method for simultaneously measuring the indentation hardness properties, span properties, and resilience properties of a mattress is also provided.

A non-destructive inspection apparatus is provided. The non-destructive inspection apparatus includes at least one memory configured to store commands for performing predetermined operations, and at least one processor operatively coupled to the at least one memory and configured to execute the commands. The at least one processor is configured to obtain information on a transmission amount of an X-ray by emitting the X-ray to a part of a bicycle, generate a gray scale image based on the information on the transmission, measure an amount of change in a gray value from one end to the other end of the part of the bicycle represented in the gray scale image along an extending direction of the part, and detect an area in which the amount of change in the gray value is equal to or greater than a threshold, as an abnormal area.

A separator is placed on a surface of a substrate to prepare a test piece. A puncturing tool is stuck into the separator, from a side of the test piece opposite to where the substrate is placed, in a thickness direction of the separator. An electrical resistance between the puncturing tool and the substrate is measured. The separator is evaluated based on a magnitude of a load applied to the puncturing tool at the time when the electrical resistance has decreased to a predetermined value. Each of the substrate and the puncturing tool is electrically conductive.

An interferometric system is provided that includes detects, authenticates and quantifies analytes such as taggants. Methods of using such systems as part of an authentication and material tracking processes are also provided.

A non-destructive inspection apparatus is provided. The non-destructive inspection apparatus includes at least one memory configured to store commands for performing predetermined operations, and at least one processor operatively coupled to the at least one memory and configured to execute the commands. The at least one processor is configured to obtain information on a transmission amount of an X-ray by emitting the X-ray to a part of a bicycle, generate a gray scale image based on the information on the transmission, measure an amount of change in a gray value from one end to the other end of the part of the bicycle represented in the gray scale image along an extending direction of the part, and detect an area in which the amount of change in the gray value is equal to or greater than a threshold, as an abnormal area.

A valence of a target element of a sample and crystallinity of a sample can be detected with a small device. The analysis device 100 includes: a placement holder 110 for placing a sample S; an X-ray source 11 for irradiating the sample S with X-rays; a first detector 141 for detecting characteristic X-rays generated from the sample S by the irradiation of the X-rays; a second detector 142 for detecting X-rays diffracted by the sample; and a signal processing device 20. The signal processing device 20 detects the valence of the target element of the sample based on the characteristic X-rays detected by the first detector 141, and detects the crystallographic data of the sample based on the X-rays detected by the second detector 142.

A system for simultaneously measuring the indentation hardness properties, span properties, and resilience properties of a mattress includes a first indentation means and a second indentation means, and means for urging the first indentation means and the second indentation means into the mattress with a predetermined force, and also includes laser means for projecting a laser line configured to map, preferably by photographic triangulation, the amplitude, shape, and time-dependency of the resultant deflection of the mattress surface between the first indentation means and the second indentation means. A method for simultaneously measuring the indentation hardness properties, span properties, and resilience properties of a mattress is also provided.

Systems and methods for detecting an incorrectly attached heat sink component on an electronic device. The system includes one or more temperature sensors secured to the electronic device and a controller unit comprising one or more processors and one or more computer-readable media, the computer-readable media having stored thereon executable instructions that are executable by the one or more processors to perform a method for detecting incorrectly attached heat sink components. The method includes receiving temperature data, calculating a thermal ramp rate, comparing the thermal ramp rate to a predetermined threshold ramp rate, and transmitting a fault signal when the calculated thermal ramp rate exceeds the predetermined threshold ramp rate.

A non-destructive inspection apparatus is provided. The non-destructive inspection apparatus includes at least one memory configured to store commands for performing predetermined operations, and at least one processor operatively coupled to the at least one memory and configured to execute the commands. The at least one processor is configured to obtain information on a transmission amount of an X-ray by emitting the X-ray to a part of a bicycle, generate a gray scale image based on the information on the transmission, measure an amount of change in a gray value from one end to the other end of the part of the bicycle represented in the gray scale image along an extending direction of the part, and detect an area in which the amount of change in the gray value is equal to or greater than a threshold, as an abnormal area.