Methods for using electron diffraction holography to investigate a sample, according to the present disclosure include the initial steps of emitting a plurality of electrons toward the sample, forming the plurality of electrons into a first electron beam and a second electron beam, and modifying the focal properties of at least one of the two beams such that the two beams have different focal planes. Once the two beams have different focal planes, the methods include focusing the first electron beam such that it has a focal plane at or near the sample, and focusing the second electron beam so that it is incident on the sample, and has a focal plane in the diffraction plane. An interference pattern of the first electron beam and the diffracted second electron beam is then detected in the diffraction plane, and then used to generate a diffraction holograph.

A quality evaluation method has a step of producing a silicon for evaluation in which a single crystal silicon is grown to extend radially from a core wire 9 while polycrystalline silicon is grown in a reactor 20; and a step of performing an evaluation using the single crystal silicon.

It is an object to provide a stress history measurement method and a stress sensor by which the stress history of an object being measured can be measured easily with high accuracy over a wide stress measurement range. In the stress history measurement method, the stress history to which the object being measured has been subjected is measured on the basis of the ratio of twinned calcite particles after the object to be measured has been subjected to an external force, the object having a stress sensor embedded therein and capable of being deformed elastically when being subjected to the external force, the sensor including a number of calcite particles. The stress sensor is configured such that a number of calcite particles are hardened by a resin with adjacent particles kept in contact with each other.

A sensor apparatus for determining and/or monitoring a process variable of a medium in a containment includes: a crystal body including at least one defect; a magnetic field system for producing a magnetic field in the region of the crystal body and in the region of the medium within the containment, wherein the crystal body and the magnetic field system are arrangeable from the outside at a wall of the containment; a detection unit for detecting a magnetic field-dependent, fluorescent signal from the crystal body, wherein the detection unit has an excitation unit for optical exciting of the defect and a detector for detecting the fluorescent signal; and an evaluation unit for ascertaining at least one piece of information concerning the process variable based on the fluorescent signal.

Methods for using electron diffraction holography to investigate a sample, according to the present disclosure include the initial steps of emitting a plurality of electrons toward the sample, forming the plurality of electrons into a first electron beam and a second electron beam, and modifying the focal properties of at least one of the two beams such that the two beams have different focal planes. Once the two beams have different focal planes, the methods include focusing the first electron beam such that it has a focal plane at or near the sample, and focusing the second electron beam so that it is incident on the sample, and has a focal plane in the diffraction plane. An interference pattern of the first electron beam and the diffracted second electron beam is then detected in the diffraction plane, and then used to generate a diffraction holograph.

Methods for using electron diffraction holography to investigate a sample, according to the present disclosure include the initial steps of emitting a plurality of electrons toward the sample, forming the plurality of electrons into a first electron beam and a second electron beam, and modifying the focal properties of at least one of the two beams such that the two beams have different focal planes. Once the two beams have different focal planes, the methods include focusing the first electron beam such that it has a focal plane at or near the sample, and focusing the second electron beam so that it is incident on the sample, and has a focal plane in the diffraction plane. An interference pattern of the first electron beam and the diffracted second electron beam is then detected in the diffraction plane, and then used to generate a diffraction holograph.

Systems and methods are disclosed to analyze sediment and sedimentary rock properties. Example systems and methods transform data representing physical particles and burial histories into a three-dimensional representation of solids and pores in sediments and sedimentary rocks by analyzing effects of deposition, grain rearrangement, compaction, and chemical reactions. Resulting output may include three-dimensional representations which may be the basis of physical objects or media for laboratory tests. In an example, output may provide a basis for evaluating present-day properties for areas where sample material is unavailable, reconstructing properties for times in the geologic past, and forecasting the effects of engineering and industrial activities on properties.

Methods for using electron diffraction holography to investigate a sample, according to the present disclosure include the initial steps of emitting a plurality of electrons toward the sample, forming the plurality of electrons into a first electron beam and a second electron beam, and modifying the focal properties of at least one of the two beams such that the two beams have different focal planes. Once the two beams have different focal planes, the methods include focusing the first electron beam such that it has a focal plane at or near the sample, and focusing the second electron beam so that it is incident on the sample, and has a focal plane in the diffraction plane. An interference pattern of the first electron beam and the diffracted second electron beam is then detected in the diffraction plane, and then used to generate a diffraction holograph.

Systems and methods are disclosed to analyze sediment and sedimentary rock properties. Example systems and methods transform data representing physical particles and burial histories into a three-dimensional representation of solids and pores in sediments and sedimentary rocks by analyzing effects of deposition, grain rearrangement, compaction, and chemical reactions. Resulting output may include three-dimensional representations which may be the basis of physical objects or media for laboratory tests. In an example, output may provide a basis for evaluating present-day properties for areas where sample material is unavailable, reconstructing properties for times in the geologic past, and forecasting the effects of engineering and industrial activities on properties.