Patent classifications
B65H2511/16
METHOD AND APPARATUS FOR MEASURING PROCESS KIT CENTERING
Embodiments disclosed herein include a sensor wafer. In an embodiment, the sensor wafer comprises a substrate, wherein the substrate comprises a first surface, a second surface opposite the first surface, and an edge surface between the first surface and the second surface. In an embodiment, the sensor wafer further comprises a plurality of sensor regions formed along the edge surface, wherein each sensor region comprises a self-referencing capacitive sensor.
SHEET CONVEYANCE APPARATUS
When an open hole is detected at the front end of a sheet at a conveyance start position, a registration operation to correct a tilt posture of the sheet is avoided, and the present velocity is retrained to convey the sheet without temporarily stopping the sheet having the tilt posture.
Method and apparatus for measuring process kit centering
Embodiments disclosed herein include a sensor wafer. In an embodiment, the sensor wafer comprises a substrate, wherein the substrate comprises a first surface, a second surface opposite the first surface, and an edge surface between the first surface and the second surface. In an embodiment, the sensor wafer further comprises a plurality of sensor regions formed along the edge surface, wherein each sensor region comprises a self-referencing capacitive sensor.
Long range capacitive gap measurement in a wafer form sensor system
Embodiments disclosed herein include a sensor wafer. In an embodiment, the sensor wafer comprises a substrate, wherein the substrate comprises a first surface and a second surface opposite the first surface. In an embodiment, the sensor wafer further comprises a first conductive pad with a first surface area, wherein the first conductive pad has a surface that is substantially coplanar with the first surface of the substrate. In an embodiment, the sensor wafer further comprises a second conductive pad with a second surface area that is smaller than the first surface area, wherein the second conductive pad has a surface that is substantially coplanar with the first surface of the substrate.
Image forming apparatus
An image forming apparatus includes an image forming unit configured to form an image on a sheet fed from a container; a trailing edge regulating plate, which is movable in a feeding direction inside the container, and is configured to regulate a trailing edge position of the sheet; a detector configured to automatically detect a sheet size based on the position of the trailing edge regulating plate; and a receiver configured to receive a size of the sheet to be set for the container as a user set size.
Image forming apparatus
An image forming apparatus includes an image forming unit configured to form an image on a sheet fed from a container; a trailing edge regulating plate, which is movable in a feeding direction inside the container, and is configured to regulate a trailing edge position of the sheet; a detector configured to automatically detect a sheet size based on the position of the trailing edge regulating plate; and a receiver configured to receive a size of the sheet to be set for the container as a user set size.
LONG RANGE CAPACITIVE GAP MEASUREMENT IN A WAFER FORM SENSOR SYSTEM
Embodiments disclosed herein include a sensor wafer. In an embodiment, the sensor wafer comprises a substrate, wherein the substrate comprises a first surface and a second surface opposite the first surface. In an embodiment, the sensor wafer further comprises a first conductive pad with a first surface area, wherein the first conductive pad has a surface that is substantially coplanar with the first surface of the substrate. In an embodiment, the sensor wafer further comprises a second conductive pad with a second surface area that is smaller than the first surface area, wherein the second conductive pad has a surface that is substantially coplanar with the first surface of the substrate.
METHOD AND APPARATUS FOR MEASURING PROCESS KIT CENTERING
Embodiments disclosed herein include a sensor wafer. In an embodiment, the sensor wafer comprises a substrate, wherein the substrate comprises a first surface, a second surface opposite the first surface, and an edge surface between the first surface and the second surface. In an embodiment, the sensor wafer further comprises a plurality of sensor regions formed along the edge surface, wherein each sensor region comprises a self-referencing capacitive sensor.
Printing apparatus capable of performing printing on partially-thick sheets
A printing apparatus includes: a sheet discharge tray having an upstream portion tilted to extend downward in a direction of gravity; an upper member limiting a height of a space above the sheet discharge tray; a full sensor configured to detect an upstream end of a top sheet of sheets stacked on the sheet discharge tray; a counter configured to count a number of the sheets discharged onto the sheet discharge tray; and a controller. The controller determines whether to stop discharging of the sheets to the sheet discharge tray, based on a detection result of the full sensor upon the sheets to be stacked on the sheet discharge tray including only sheets each with uniform thickness and based on a count value of the counter upon the sheets to be stacked on the sheet discharge tray including a sheet with thickness varying partly.
Printing apparatus capable of performing printing on partially-thick sheets
A printing apparatus includes: a sheet discharge tray having an upstream portion tilted to extend downward in a direction of gravity; an upper member limiting a height of a space above the sheet discharge tray; a full sensor configured to detect an upstream end of a top sheet of sheets stacked on the sheet discharge tray; a counter configured to count a number of the sheets discharged onto the sheet discharge tray; and a controller. The controller determines whether to stop discharging of the sheets to the sheet discharge tray, based on a detection result of the full sensor upon the sheets to be stacked on the sheet discharge tray including only sheets each with uniform thickness and based on a count value of the counter upon the sheets to be stacked on the sheet discharge tray including a sheet with thickness varying partly.