An automatic loading system for vehicles includes an overhead platform, a transporting machine, and a cargo carrying mechanism. The overhead platform includes two rails. The transporting machine is disposed on the rails and configured to move on the rails along a first direction. The transporting machine includes a hoist mechanism and a fork assembly disposed on the hoist mechanism. The hoist mechanism is configured to drive the fork assembly to move along a second direction which is perpendicular to the first direction. The fork assembly includes forks disposed side by side and separately. Each fork includes at least a conveyer belt. The cargo carrying mechanism is configured to carry cargos and includes a conveyer belt platform. When the fork assembly is close to the cargo carrying mechanism, the conveyer belt and the conveyer belt platform are configured to transport the cargos to the forks from the conveyer belt platform.

An underwater towing test device including a driving mechanism, an observation platform disposed under the driving mechanism, a towing member, and a towed body. The driving mechanism includes an operation platform, an extended platform connected to the operation platform, a crane, a first railing, a lifebuoy, a control center, a power distribution room, and a plurality of bus ports. The operation platform includes two rail grooves disposed in parallel and a moon pool provided with two pool slots on both ends thereof. The crane includes a chassis provided with a plurality of first guide rollers. The first railing is positioned along the edge of the operation platform and the extended platform, with the lifebuoy hanging thereon. The control center, the power distribution room, the plurality of bus ports, and the moon pool are fixedly disposed on the operation platform.

A system for a semiconductor fabrication facility includes a manufacturing tool including a load port, a maintenance crane, a rectangular zone overlapping with the load port of the manufacturing tool, a plurality of first sensors at corners of the rectangular zone, an OHT vehicle, a second sensor on the OHT vehicle, a third sensor on the load port, and a control unit. The first sensors are configured to detect a location of the maintenance crane and to generate a first location data. The second sensor is configured to generate a second location data. The control unit is configured to receive the first location data of the maintenance crane and the second location data of the OHT vehicle. The control unit further sends signals to the second sensor and the third sensor or to cut off the signal to the second sensor.

A system for a semiconductor fabrication facility includes a manufacturing tool including a load port, a maintenance crane, a rectangular zone overlapping with the load port of the manufacturing tool, a plurality of first sensors at corners of the rectangular zone, an OHT vehicle, a second sensor on the OHT vehicle, a third sensor on the load port, and a control unit. The first sensors are configured to detect a location of the maintenance crane and to generate a first location data. The second sensor is configured to generate a second location data. The control unit is configured to receive the first location data of the maintenance crane and the second location data of the OHT vehicle. The control unit further sends signals to the second sensor and the third sensor or to cut off the signal to the second sensor.

A system for a semiconductor fabrication facility includes a maintenance tool, a control unit, a first track, a second track, a maintenance crane movably mounted on the first track, a plurality of first sensors disposed on the first track, an OHT vehicle movably mounted on the second track, and a second sensor on the OHT vehicle. The first sensors detect a location of the maintenance crane and generate a first location data to the control unit. The second sensor generates a second location data to the control unit.

A system for a semiconductor fabrication facility includes a maintenance tool, a control unit, a first track, a second track, a maintenance crane movably mounted on the first track, a plurality of first sensors disposed on the first track, an OHT vehicle movably mounted on the second track, and a second sensor on the OHT vehicle. The first sensors detect a location of the maintenance crane and generate a first location data to the control unit. The second sensor generates a second location data to the control unit.

A system for a semiconductor fabrication facility includes a manufacturing tool including a load port, a maintenance tool including a first track and at least one maintenance crane on the first track, a rectangular zone overlapping with the load port, a plurality of first sensors on the first track and at corners of the rectangular zone configured to detect a location of the maintenance crane and generate a first location date, a transporting tool including a second track and a OHT vehicle on the second track, at least a second sensor on the OHT vehicle and configured to generate a second location data, at least a third sensor on the load port, and a control unit configured to receive the first location data and the second location data, and send signals to the second sensor and the third sensor or to cut off the signal to the second sensor.

A system for a semiconductor fabrication facility includes a manufacturing tool including a load port, a maintenance tool including a first track and at least one maintenance crane on the first track, a rectangular zone overlapping with the load port, a plurality of first sensors on the first track and at corners of the rectangular zone configured to detect a location of the maintenance crane and generate a first location date, a transporting tool including a second track and a OHT vehicle on the second track, at least a second sensor on the OHT vehicle and configured to generate a second location data, at least a third sensor on the load port, and a control unit configured to receive the first location data and the second location data, and send signals to the second sensor and the third sensor or to cut off the signal to the second sensor.

A system for servicing a nuclear reactor module comprises a crane operable to attach to the nuclear reactor module, wherein the crane includes provisions for routing signals from one or more sensors of the nuclear reactor module to one or more sensor receivers.

A levelling machine includes a pair of spaced apart rail assemblies, a gantry assembly and a face mill assembly. The spaced apart rail assemblies define an x axis. The gantry assembly is moveably attached to the pair of spaced apart rail assemblies whereby the gantry assembly defines a y axis. The gantry assembly is moveable in the x axis along the pair of spaced apart rail assemblies. The face mill assembly is moveably attached to the gantry assembly and is moveable in the y axis along the gantry assembly. The face mill assembly has a plurality of saw blades, the saw blades being generally in an x-y plane defined by the x axis and y axis. The saw blades have a plurality of teeth that extend downwardly generally in a z axis. The face mill assembly is moveable in the z axis.