Patent classifications
B81C99/0025
MICROELECTRO-MECHANICAL SYSTEM DEVICE AND METHOD FOR ELECTROSTATIC BONDING THE SAME
A microelectro-mechanical system (MEMS) device includes a substrate of a semiconductor material having thereon a movable component, a glass substrate bonded to the substrate, an electrostatic biasing layer disposed between the movable component and the glass substrate. A cavity is defined between the movable component and a top surface of the glass substrate. The electrostatic biasing layer completely overlaps with the movable component.
Adhesive tape separating tool, manufacturing apparatus of semiconductor chip, manufacturing apparatus of MEMS device manufacturing apparatus of liquid ejecting head, and separating method of adhesive tape
Provided is an adhesive tape separating tool which separates adhesive tape bonded to one face of a work which includes an opening on the one face from the work, in which a protrusion portion forming region in which a plurality of protrusion portions are formed is provided on a face on a side which comes into contact with the work in the tape separating tool, and the protrusion portion forming region is disposed at a position separated from a position facing the opening on the one face of the work.
Mems Manufacturing Method and Mems Manufacturing Apparatus
For the purpose of shortening the MEMS manufacturing TAT, the MEMS manufacturing method according to the present invention includes a step of extracting the first MEMS with first characteristic in a range approximate to the required characteristic from the plurality of MEMS preliminarily prepared on the main surface of the substrate, and a step of forming a second MEMS having the required characteristic by directly processing the first MEMS.
ADDITIVE MANUFACTURING PROCESSES AND MANUFACTURED ARTICLE
An additive manufacturing process includes forming an object material stack using sheet materials without use of binder material between the sheet materials and forming features of the cross-sectional layers of a 3D object in the corresponding sheet materials. Another process involves forming features of the cross-sectional layers of a 3D object in soot layers of a laminated soot sheet. A manufactured article includes three or more glass layers laminated together without any binder material between the glass layers. At least one of the glass layers is composed of silica or doped silica, and at least one feature is formed in at least one of the glass layers.
Method of selectively removing an anti-stiction layer on a eutectic bonding area
A microelectromechanical systems (MEMS) package includes a eutectic bonding structure free of a native oxide layer and an anti-stiction layer, while also including a MEMS device having a top surface and sidewalls lined with the anti-stiction layer. The MEMS device is arranged within a MEMS substrate having a first eutectic bonding substructure arranged thereon. A cap substrate having a second eutectic bonding substructure arranged thereon is eutectically bonded to the MEMS substrate with a eutectic bond at the interface of the first and second eutectic bonding substructures. The anti-stiction layer lines a top surface and sidewalls of the MEMS device, but not the first and second eutectic bonding substructures. A method for manufacturing the MEMS package and a process system for selective plasma treatment are also provided.
Device manufacturing method and device manufacturing apparatus
The device manufacturing method includes a length measuring step (S5) of, on the basis of an observation target image of an SEM image taken from a direction having a predetermined angle from a direction perpendicular to a plane of a substrate, measuring the thickness of a target object, or the depth of etching, formed on the substrate. In addition, in the length measuring step, an etching angle made by a cross section of the etching and the direction perpendicular to the plane of the substrate is calculated from processing data of the target object, and the thickness of the target object or the depth of the etching is measured on the basis of the calculated etching angle.
METHODS AND SYSTEMS FOR FAST IMPRINTING OF NANOMETER SCALE FEATURES IN A WORKPIECE
The subject matter described herein relates to methods and systems for fast imprinting of nanometer scale features in a workpiece. According to one aspect, a system for producing nanometer scale features in a workpiece is disclosed. The system includes a die having a surface with at least one nanometer scale feature located thereon. A first actuator moves the die with respect to the workpiece such that the at least one nanometer scale feature impacts the workpiece and imprints a corresponding at least one nanometer scale feature in the workpiece.
Ultra-high speed anisotropic reactive ion etching
A system and method for reactive ion etching (RIE) system of a material is provided. The system includes a plasma chamber comprising a plasma source and a gas inlet, a diffusion chamber comprising a substrate holder for supporting a substrate with a surface comprising the material and a gas diffuser, and a source of a processing gas coupled to the gas diffuser. In the system and method, at least one radical of the processing gas is reactive with the material to perform etching of the material, the gas diffuser is configured to introduce the processing gas into the processing region, and the substrate holder comprises an electrode that can be selectively biased to draw ions generated by the plasma source into the processing region to interact with the at least one processing gas to generate the at least one radical at the surface.
Methods and systems for fast imprinting of nanometer scale features in a workpiece
The subject matter described herein relates to methods and systems for fast imprinting of nanometer scale features in a workpiece. According to one aspect, a system for producing nanometer scale features in a workpiece is disclosed. The system includes a die having a surface with at least one nanometer scale feature located thereon. A first actuator moves the die with respect to the workpiece such that the at least one nanometer scale feature impacts the workpiece and imprints a corresponding at least one nanometer scale feature in the workpiece.
CIRCUIT BOARD MODULE COMPRISING A CONTINUOUS CAVITY, ASSOCIATED SONIC TRANSDUCER ASSEMBLY, AND PRODUCTION METHOD
The invention relates to a circuit board module (2) for a sound transducer assembly (1) for generating and/or detecting sound waves in the audible wavelength spectrum, with a circuit board (4), which features a recess (6) with a first opening (7), and at least a part of a MEMS sound transducer (5), which is arranged in the area of the first opening (7), such that the recess (6) at least partially forms a cavity (9) of the MEMS sound transducer (5). In accordance with the invention, the recess (6) features a second opening (8) opposite to the first opening (7), such that the recess (6) extends completely through the circuit board (4). In addition, the invention relates to a sound transducer assembly (1) with such a circuit board module (2) along with a method for manufacturing such sound transducer assembly (1).