A method for creating at least one recess, in particular an aperture, in a transparent or transmissive material, includes: selectively modifying the material along a beam axis by electromagnetic radiation; and creating the at least one recess by one or more etching steps, using different etching rates in a modified region and in non-modified regions. The electromagnetic radiation produces modifications having different characteristics in the material along the beam axis such that the etching process in the material is heterogeneous and the etching rates differ from one another in regions modified with different characteristics under unchanged etching conditions.

A method for creating at least one recess, in particular an aperture, in a transparent or transmissive material, includes: selectively modifying the material along a beam axis by electromagnetic radiation; and creating the at least one recess by one or more etching steps, using different etching rates in a modified region and in non-modified regions. The electromagnetic radiation produces modifications having different characteristics in the material along the beam axis such that the etching process in the material is heterogeneous and the etching rates differ from one another in regions modified with different characteristics under unchanged etching conditions.

Methods and systems for photopatterning and miniaturization. In some examples, a method for patterning a substrate includes irradiating a pattern onto the substrate with ultraviolet light and heating the substrate, causing the substrate and the pattern to shrink in at least one dimension to form a miniaturized pattern on the substrate. In some examples, a system for patterning a substrate includes an ultraviolet light source, a heater, and a controller configured for irradiating a pattern onto the substrate with ultraviolet light and heating the substrate, causing the substrate and the pattern to shrink in at least one dimension to form a miniaturized pattern on the substrate.

A cutting method includes: forming a reformed region in a workpiece; and after forming the reformed region in the workpiece, cutting the workpiece along an intended cut line. In the cutting the workpiece, a dry etching process is performed from a front surface toward a rear surface of the workpiece while the workpiece is fixed on a support member at least under its own weight or by suction, to form a groove from the front surface to reach the rear surface of the workpiece.

A cutting method includes: forming a reformed region in a workpiece; and after forming the reformed region in the workpiece, cutting the workpiece along an intended cut line. In the cutting the workpiece, a dry etching process is performed from a front surface toward a rear surface of the workpiece while the workpiece is fixed on a support member at least under its own weight or by suction, to form a groove from the front surface to reach the rear surface of the workpiece.

A femtosecond laser source according to an embodiment of the present invention includes: a pulse generator that converts a continuous wave laser into an optical pulse train; a burst generator that separates the optical pulse train into a plurality of burst pulses; a pulse amplification and spectral broadening unit that expands the spectrum by amplifying a plurality of burst pulses; and a pulse compressor that compresses a plurality of amplified burst pulses to generate a femtosecond laser with a pulse width of 1 picosecond (10.sup.−12 s) or less.

A decoating method for the edge decoating of glass sheets, the glass sheets having at least on one of their two glass surfaces a protective coating in the form of a peel-off protective film or in the form of a polymer protective layer that cannot be peeled off, and preferably having a functional coating situated under the protective coating, the protective film being partially mechanically removed, in particular ground away, for the edge decoating, in the form of at least one film strip, laser traces being introduced into the protective film before the mechanical removal of the film strip, and the laser traces being introduced in such a way that the film strip is removed in the form of individual film strip partial pieces separated from one another by the laser traces; or the polymer protective layer being removed using laser radiation.

A laminated wafer grinding method includes applying a laser beam having such a wavelength as to be transmitted through a first wafer to the first wafer along a first annular street set on the inner side of a peripheral edge of the first wafer to form a first annular modified layer, and applying the laser beam to the first wafer along at least one second street set in an annular region extending from the first street to the peripheral edge of the first wafer to form a second modified layer that partitions the annular region into two or more parts, causing a cutting blade to cut into the annular region to a predetermined depth of the first wafer to cut the annular region, and grinding a second surface side of the first wafer to thin the first wafer to a finished thickness and removing the annular region.

An inspecting apparatus for inspecting an ingot having a polished surface includes a holding table configured to hold the ingot with the polished surface of the ingot exposed, a light source configured to irradiate the polished surface of the ingot held by the holding table with light at a predetermined incidence angle, an imaging unit configured to condense and photograph reflected light reflected by the polished surface of the ingot, and form a photographed image emphasizing unevenness produced on the polished surface by a crack extending in the ingot, and a control unit including a determining section configured to determine the state of the ingot by comparing the formed photographed image with a preset condition.

A laser processing apparatus includes a laser oscillator configured to emit a laser beam, a slit configured to narrow a width of the laser beam emitted from the laser oscillator to a width corresponding to a dividing groove to form the dividing groove of a predetermined width, a slit moving mechanism configured to move the slit in a direction corresponding to a width direction of the dividing groove, and an adjusting unit configured to make the center of the slit and the cross-sectional center of the laser beam entering the slit coincide with each other in a direction in which the slit moving mechanism moves the slit.