Patent classifications
B81B7/0048
PHYSICAL QUANTITY SENSOR
A physical quantity sensor includes a substrate, an anchor portion, a surrounding portion, a detecting element, a moving portion, and a beam portion. The anchor portion is formed on the same side as a principal surface of the substrate and fixed to the substrate. The surrounding portion is formed on the same side as the principal surface of the substrate and surrounds the anchor portion. The detecting element detects a physical quantity as a target of detection. The moving portion is provided with at least a part of the detecting element, formed on the same side as the principal surface of the substrate, and connected to the surrounding portion. The beam portion is formed on the same side as the principal surface of the substrate and connects the anchor portion and the surrounding portion together.
ATTACHMENT FOR REDUCING TEMPERATURE SENSITIVITY
Embodiments provide a method and mechanism for reducing changes in the resonant frequency of a MEMS mirror structure with temperature due to a mismatch between the CTE of the MEMS die and the package substrate. A die attach layer with a low Young's modulus, such as less than 15,000 psi, is used to allow absorption of some of the stress due to the mismatch in the CTE of the MEMS die and the package substrate. In addition, in embodiments a thicker die attach layer than normal is used to absorb some of the stress, increasing the height of the die attach layer from the normal range around 25 μm to between 50-150 μm thick. In further embodiments a pattern of open cavities is etched in the bottom of the die substrate. The die substrate may be made thicker to provide room for the cavities.
Sensor Arrangement and Method for Producing a Sensor Arrangement
In an embodiment a sensor arrangement includes a substrate, at least one spacer arranged directly onto a surface of the substrate, wherein the spacer comprises a soft material and a sensor chip attached to the substrate by an adhesive, wherein both the at least one spacer and the adhesive are arranged at least partly between the sensor chip and the substrate, and wherein the spacer is adapted and arranged to define a bond line thickness of the adhesive.
Hermetic Heterogeneous Integration Platform for Active and Passive Electronic Components
A platform for hermetic heterogeneous integration of passive and active electronic components is provided herein. The platform can include a substrate that provides a hermetic electrical interconnection between integrated circuits and passive devices, such as resistors, capacitors, and inductors. Such substrates can be formed of a dielectric, such as a ceramic, and include electrical interconnects and can further include one or more passive devices. The substrate can include one or more cavities, at least a primary cavity dimensioned to receive an active device and one or more secondary cavities can be included for secondary connector pads for interfacing with the active and passive devices and which can be separately hermetically sealed. The substrate can include a multi-coil inductor defined within alternating layers of the substrate within sidewalls that surround the primary cavity to minimize size of the device package while optimizing the size of the coil.
No-gel pressure sensor package
A no-gel sensor package is disclosed. In one embodiment, the package includes a microelectromechanical system (MEMS) die having a first substrate, which in turn includes a first surface on which is formed a MEMS device. The package also includes a polymer ring with an inner wall extending between first and second oppositely facing surfaces. The first surface of the polymer ring is bonded to the first surface of the first substrate to define a first cavity in which the MEMS device is contained. A molded compound body having a second cavity that is concentric with the first cavity, enables fluid communication between the MEMS device and an environment external to the package.
MEMS stress reduction structure embedded into package
A microelectromechanical system (MEMS) sensor package includes a laminate that provides physical support and electrical connection to a MEMS sensor. A resin layer is embedded within an opening of the laminate and a MEMS support layer is embedded within the opening by the resin layer. A MEMS structure of the MEMS sensor is located on the upper surface of the MEMS support layer.
Carrier substrate for stress sensitive device and method of manufacture
A carrier substrate and a method for making a carrier substrate are disclosed. In an embodiment a carrier substrate includes a substrate body having a multilayer structure, electrical connection pads on a top surface of the substrate body, an organic cushion layer on the top surface of the substrate body, electrically conductive elongated parts arranged on top of the cushion layer, wherein each conductive elongated part is contacted to a respective electric connection pad and a solder pad located at an end of each elongated part distant from the respective connection pad.
Pressure measuring device having a footprint of a first joint area of a support body
Disclosed is a pressure measuring device, whose pressure sensor is protected against thermomechanical stresses, comprising a carrier, a support body arranged on the carrier, a pressure sensor arranged on the support body, a first joint including a joint material connecting the support body with the pressure sensor, and a second joint including a joint material connecting the support body with the carrier. The support body has on a face opposite the pressure sensor a first groove configured such that the first groove surrounds a joint area of the support body. The joint area of the support body and a footprint of the first joint are essentially equally large and significantly less than a base area of the pressure sensor opposite the first joint.
MICROMECHANICAL SENSOR DEVICE AND CORRESPONDING MANUFACTURING METHOD
A micromechanical sensor device and a corresponding manufacturing method are described. The micromechanical sensor device is fitted with a substrate including a front side and a rear side; a micromechanical sensor chip including a sensor area attached to the front side of the substrate; and a capping unit attached to the front side of the substrate, which is formed at least partially by an ASIC chip. The capping unit surrounds the micromechanical sensor chip in such a way that a cavity closed toward the front side of the substrate is formed between the sensor area of the micromechanical sensor chip and the ASIC chip. A mold package is formed above the capping unit.
MEMS assembly substrates including a bond layer
A method of forming a micro electro mechanical system (MEMS) assembly comprises providing a substrate having an electrically conductive layer disposed thereon. The method also comprises depositing, on the substrate over the electrically conductive layer, a bonding material having an elastic modulus of less than 500 MPa so as to form a bond layer. The bond layer is completely cured, and a MEMS die is attached to the completely cured bond layer.