A method includes forming a package substrate comprising forming through-openings in a glass substrate, filling the through-openings to form through-vias in the glass substrate, forming a first interconnect structure underlying the glass substrate, and forming a second interconnect structure overlying the glass substrate. The method further includes forming an interposer over the package substrate, and bonding package components over and electrically connected to the package substrate through the interposer.

A substrate structure includes an insulating layer and a circuit structure disposed on an upper surface of the insulating layer. The upper surface of the insulating layer includes a chip placement region for placing a chip. The circuit structure includes a first circuit located outside the chip placement region and having a first conductive trace, and a second circuit located within the chip placement region and having a second conductive trace. A width of a region covered by the second circuit is greater than a width of the first circuit. Therefore, the width of the region covered by the circuit passing through the chip placement region is widened and is greater than the width of the circuit outside the chip placement region, thereby increasing the contact area between the chip and the circuit, and dispersing the reaction force from the circuit that the chip receives during hot pressing process.

A composite component containing one or more electronic components. The composite component includes a Si base layer having a first main surface, and a second main surface facing the first main surface, a redistribution layer disposed on the first main surface, a through-Si via extending through the Si base layer and the adhesive layer to electrically connect the redistribution layer and the electronic component, and extending through the Si base layer, an electronic component electrically connected to the through-Si via, and disposed on the second main surface, sidewall portions surrounding the electronic component, and disposed to form a recessed portion together with the Si base layer, and a resin sealing portion sealing the electronic component.

In an output circuit of a semiconductor integrated circuit device, an output transistor part including a transistor connected between VSS and an output terminal has first and second active regions overlapping each other in planar view. A power line and an output line are placed in an interconnect layer on the back side so as to overlap the first and second active regions in planar view. The power line is connected to the lower face of the portion that is to be the source of the first active region through a via, and the output line is connected to the lower face of the portion that is to be the drain of the first active region through a via.

An integration process including an etch stop layer for high density memory and logic applications and methods of fabrication are described. While various examples are described with reference to FeRAM, capacitive structures formed herein can be used for any application where a capacitor is desired. For instance, the capacitive structure can be used for fabricating ferroelectric based or paraelectric based majority gate, minority gate, and/or threshold gate.

A power converter assembly includes an interposer; an integrated circuit, such as a power management integrated circuit, arranged in a cavity or pocket of the interposer or monolithically integrated in the interposer; one or more electrical components stacked on a top side of the interposer; and one or more vias arranged in the interposer forming electrical connections in the interposer, wherein the integrated circuit and the electrical components are configured to perform a power conversion of an input voltage to an output voltage.

A semiconductor package includes: a base chip; semiconductor chips disposed on the base chip and including front pads disposed on a front surface opposing the base chip, rear pads disposed on a rear surface opposing the front surface, and through-vias; bumps disposed between the semiconductor chips; a dam structure disposed on at least a portion of the rear pads; and insulating adhesive layers at least partially surrounding the bumps and the dam structure, wherein the rear pads include first pads that are disposed in a center region that crosses a center of the rear surface and that are electrically connected to the through-vias, and second pads that are disposed in a peripheral region adjacent to the center region, wherein the second pads include a line pad of which at least a portion has a polygonal shape, and wherein the dam structure has a bent shape.

Novel tools and techniques are provided for implementing mixed dielectric materials for improving signal integrity of integrated electronics packages or semiconductor packages. In various embodiments, a substrate for a semiconductor device includes: a first layer made of a first material; a second layer made of a second material; and a third layer disposed between the first and second layers, and that is made of a third material different from the first and second materials. In some cases, the first, second, and third layers each contains a plurality of gas-filled regions (e.g., but not limited to, an aerogel core of the third layer and/or polymer resin matrix embedded with hollow silica spheres or aerogel spheres of the first and second layers, or the like). Coaxial ground shields around signal lines in the substrate can be used to improve signal integrity. High dielectric constant lossy lines between signal lines can reduce crosstalk.

A semiconductor composite device includes active elements and passive elements constituting a voltage regulator and disposed in association with a plurality of channels, a load to be supplied with a direct-current voltage regulated by the voltage regulator, and a wiring board electrically connected to the active elements, the passive elements, and the load. A plurality of capacitors disposed in the channels include an integrally formed capacitor array including a plurality of capacitor portions disposed in a plane. The capacitor array includes a plurality of through hole conductors extending through the capacitor array in a direction perpendicular to a mounting surface of the wiring board. At least a part of the capacitor array is positioned to overlap the load when viewed from the mounting surface of the wiring board.

A semiconductor package includes a first substrate, a first semiconductor chip, a first bonding wire, a second substrate, a second semiconductor chip and a second bonding wire. The first substrate has a window through a center portion of the first substrate. The first semiconductor chip is located on the first substrate. The first bonding wire is in the window of the first substrate and electrically connects to the first semiconductor chip and the first substrate. The second substrate is located on the first semiconductor chip, and has a window through a center portion of the second substrate. The second substrate electrically connects to the first substrate. The second semiconductor chip is located on the second substrate. The second bonding wire is in the window of the second substrate and electrically connects to the second semiconductor chip and the second substrate.