A semiconductor package structure includes a first package and a second package. The first package includes a first redistribution layer, a second redistribution layer, a third redistribution layer, at least one first chip, at least one second chip, multiple first conductive elements, multiple second conductive elements, a first encapsulant, a second encapsulant, and multiple solders. The second redistribution layer is located between the first redistribution layer and the third redistribution layer and includes multiple chip connectors. Each chip connector includes a connecting pad, a nickel layer, and a gold layer. The connecting pad has top surface and a peripheral surface. The nickel layer covers the top surface and the peripheral surface of the connecting pad, and the gold layer covers the nickel layer located on the top surface of the connecting pad. The second encapsulant is disposed on the third redistribution layer and is electrically connected to the first encapsulant.

A package structure includes a first dielectric layer disposed on a first patterned circuit layer, a first conductive via in the first dielectric layer and electrically connected to the first patterned circuit layer, a circuit layer on the first dielectric layer, a second dielectric layer on the first dielectric layer and covering the circuit layer, a second patterned circuit layer on the second dielectric layer and including conductive features, a chip on the conductive features, and a molding layer disposed on the second dielectric layer and encapsulating the chip. The circuit layer includes a plurality of portions separated from each other and including a first portion and a second portion. The number of pads corresponding to the first portion is different from that of pads corresponding to the second portion. An orthographic projection of each portion overlaps orthographic projections of at least two of the conductive features.

A package structure including a semiconductor die, a redistribution layer, a plurality of antenna patterns, a die attach film, and an insulating encapsulant is provided. The semiconductor die have an active surface and a backside surface opposite to the active surface. The redistribution layer is located on the active surface of the semiconductor die and electrically connected to the semiconductor die. The antenna patterns are located over the backside surface of the semiconductor die. The die attach film is located in between the semiconductor die and the antenna patterns, wherein the die attach film includes a plurality of fillers, and an average height of the die attach film is substantially equal to an average diameter of the plurality of fillers. The insulating encapsulant is located in between the redistribution layer and the antenna patterns, wherein the insulating encapsulant encapsulates the semiconductor die and the die attach film.

A packaging structure and a formation method thereof are provided. The packaging structure includes a carrier board, and a plurality of semiconductor chips adhered to the carrier board. Each semiconductor chip has a functional surface and a non-functional surface opposite to the functional surface, and a plurality of pads are formed on the functional surface of a semiconductor chip of the plurality of chips. A metal bump is formed on a surface of a pad of the plurality of pads, and a first encapsulation layer is formed on the functional surface. The packaging structure also includes a second encapsulation layer formed over the carrier board.

An interconnect for a semiconductor device includes a first bonding pad having a first surface, a second bonding pad having a second surface bonded to the first surface of the first bonding pad, and a first guard dummy adjacent the second bonding pad and having a third surface substantially coplanar with the second surface of the second bonding pad.

A method of forming a semiconductor structure includes forming a photoresist over a first conductive pattern. The method further includes patterning the photoresist to define a plurality of first openings. The method further includes depositing a conductive material in each of the plurality of first openings. The method further includes disposing a molding material over the first conductive pattern, wherein the molding material surrounds a die. The method further includes removing a portion of the molding material to form a second opening. The method further includes disposing a dielectric material into the opening to form a dielectric member. The method further includes forming a redistribution structure over the molding material and the dielectric member, wherein the redistribution structure includes an antenna structure over the dielectric member and electrically connected to the die.

A die assembly is disclosed. The die assembly includes a die, one or more die pads on a first surface of the die and a die attach film on the die where the die attach film includes one or more openings that expose the one or more die pads and that extend to one or more edges of the die.

A semiconductor package includes: a substrate; a chip stack on the substrate; a first interface, in a first region of the substrate and having a first circuit layer; a second interface, in a second region of the substrate and having a second circuit layer, and the chip stack between the first and second interface; a first bonding wire, connected to a first chip and having a first contact point; a second bonding wire, connected to a second chip and having a second contact point; an encapsulation layer, surrounding the chip stack, the first and second interface, the first and second bonding wire on the substrate, and exposing the first and second contact point, and the first and second circuit layer; and a redistribution layer, on the encapsulation layer and connecting the first contact point and the second contact point to the first circuit layer and the second circuit layer.

A fan-out semiconductor package includes a semiconductor chip; a metal pillar disposed on the semiconductor chip; a bonding metal layer disposed on the metal pillar; a bonding wire disposed on the bonding metal layer; a sealing layer over the semiconductor chip, and surrounding the metal pillar, the bonding metal layer, and the bonding wire; and a redistribution layer disposed on the sealing layer and the bonding wire.

A method of forming one or more semiconductor packages includes mounting one or more semiconductor dies on the metal strip such that the one or more semiconductor dies are in a flip chip arrangement whereby terminals of the one or more semiconductor dies face the upper surface of the metal strip, forming an electrically insulating encapsulant material on the upper surface of the metal strip that encapsulates the one or more semiconductor dies, and forming package terminals that are electrically connected with the terminals of the one or more semiconductor dies, wherein the package terminals are formed from the metal strip or from metal that is deposited after removing the metal strip.