Some implementations described herein a provide a multi-die package and methods of formation. The multi-die package includes a dynamic random access memory integrated circuit die over a system-on-chip integrated circuit die, and a heat transfer component between the system-on-chip integrated circuit die and the dynamic random access memory integrated circuit die. The heat transfer component, which may correspond to a dome-shaped structure, may be on a surface of the system-on-chip integrated circuit die and enveloped by an underfill material between the system-on-chip integrated circuit die and the dynamic random access memory integrated circuit die. The heat transfer component, in combination with the underfill material, may be a portion of a thermal circuit having one or more thermal conductivity properties to quickly spread and transfer heat within the multi-die package so that a temperature of the system-on-chip integrated circuit die satisfies a threshold.

A resonator device includes: a resonator element; a heat generating unit; a first package including a first base at which the resonator element and the heat generating unit are disposed, and a first lid bonded to the first base so as to accommodate the resonator element between the first lid and the first base; and a low emissivity layer that is disposed at an inner surface of the first lid and that has an emissivity lower than an emissivity of the first lid. In addition, a constituent material of the first lid is silicon, and the emissivity of the low emissivity layer at room temperature is less than 0.5.

A switching component configured to switch an electrical signal, the switching component includes a substrate bearing several elementary components each ensuring the switching of the electrical signal, a baseplate onto which the substrate is fixed, the baseplate being configured to discharge heat emitted in the switchings of the switching component, two electrical conductors each connected to one of the elementary components and respectively ensuring the input and the output of the elementary component concerned for the signal (I.sub.C) to be switched, a magnetic core produced in a ferromagnetic material, the magnetic core surrounding the elementary component concerned without surrounding others of the elementary components and being disposed in the component in such a way that a displacement current between the surrounded elementary component and the baseplate induces a magnetic induction in the magnetic core, and in such a way that the path followed by a conduction current of the electrical signal switched by the component does not form a turn around the magnetic core.

A wireless transistor outline (TO) package structure includes a carrying module, a chip and a lead frame both mounted on the carrying module, a sheet-like bonding module mounted on the chip and the lead frame in a flip chip manner, and an encapsulant that covers the above components therein. A connection pad of the chip and a connection segment of the lead frame are coplanar with each other. The sheet-like bonding module includes a ceramic substrate and a plurality of circuit layers that are stacked and formed on the ceramic substrate in a direct plated copper (DPC) manner. Areas of the circuit layers gradually decrease in a direction away from the ceramic substrate, and thicknesses of the circuit layers gradually increase in the same direction. The circuit layer arranged away from the ceramic substrate connects the connection pad and the connection segment for establishing an electrical connection therebetween.

A semiconductor package may include a first redistribution substrate, a first semiconductor chip and a second semiconductor chip, which are mounted on the first redistribution substrate and are horizontally spaced apart from each other, a first mold layer provided to surround the first and second semiconductor chips and expose bottom surfaces of the first and second semiconductor chips, a bridge chip mounted on the bottom surfaces of the first and second semiconductor chips, a second mold layer provided on the first redistribution substrate to embed the first and second semiconductor chips, the first mold layer, and the bridge chip, a second redistribution substrate disposed on the second mold layer, an upper package mounted on the second redistribution substrate, and a vertical connection structure provided adjacent to the first mold layer to connect the first and second redistribution substrates to each other. The first redistribution substrate may have a recess provided in a top surface of the first redistribution substrate, and the bridge chip may be disposed in the recess.

A semiconductor device includes a die carrier, a semiconductor die, a first set of external connectors, and a second set of external connectors. The semiconductor die includes at least a first load electrode and a second load electrode, and is mounted onto the die carrier with the first load electrode being electrically connected to the die carrier. The first set of external connectors is electrically and thermally connected to the die carrier. The second set of external connectors is spaced apart from the die carrier and electrically connected to the second load electrode. An overall wire size of the second set of external connectors is greater than an overall wire size of the first set of external connectors.

A method of manufacturing a semiconductor package includes the following steps. A first integrated circuit is encapsulated by a first encapsulant. A first passivation layer is formed over the first integrated circuit and the first encapsulant. A first thermal pattern is formed in the first passivation layer. A second passivation layer is formed on the first passivation layer and the first thermal pattern, wherein the first thermal pattern is exposed by a first opening of the second passivation layer. A second integrated circuit is adhered to the second passivation layer through an adhesive layer, wherein the adhesive layer is partially disposed in the first opening of the second passivation layer.

An integrated circuit containing an embedded resistor in close proximity to an embedded thermoelectric device. An integrated circuit containing an embedded resistor in close proximity to an embedded thermoelectric device composed of thermoelectric elements and at least one switch to disconnect at least one thermoelectric element from the thermoelectric device. Methods for testing embedded thermoelectric devices.

Techniques are provided for containing magnetic fields generated by an integrated switching package and for reducing electromagnetic interference generated from an integrated switching package.

An object is to provide a technique capable of enhancing the heat dissipation characteristics of a semiconductor device. The semiconductor device includes a heat dissipation plate, a layer member connected to the heat dissipation plate, a first semiconductor element, and a second semiconductor element. The first semiconductor element and the second semiconductor element are connected to the layer member on a side opposite to the heat dissipation plate, and separated from each other by a gap. The heat dissipation plate includes a thick portion and a thin portion thinner than the thick portion. The thin portion is in contact with a groove portion provided on a surface of the heat dissipation plate opposite to the layer member, and overlaps the gap in plan view.