H10P14/6684

POST-GAP FILL TREATMENT FOR SEAM REDUCTION

Exemplary processing methods may include performing a silicon-containing atomic layer deposition (ALD) process. The silicon-containing ALD process may deposit a silicon-containing material in a feature defined in a substrate disposed in a processing region of a semiconductor processing chamber. The methods may include providing an oxygen-containing precursor to a processing region. The methods may include contacting the substrate with the oxygen-containing precursor. The contacting may at least partially reduce a presence of a seam in the silicon-containing material.

TREATMENTS TO CONTROL THICKNESS OF OXYGEN-CONTAINING MATERIALS

Exemplary processing methods may include providing one or more deposition precursors to a processing region of a semiconductor processing chamber. A substrate including a plurality of layers of a silicon-containing material may be housed within the processing region. Adjacent layers of the silicon-containing material may be vertically spaced apart to define a plurality of lateral gaps. One or more features may extend through the plurality of layers of the silicon-containing material and into the substrate. The methods may include depositing a flowable oxygen-containing material on the substrate in the plurality of lateral gaps and in the one or more features extending into the substrate. The methods may include providing a hydrogen-containing precursor to the processing region of the semiconductor processing chamber. The methods may include contacting the substrate with the hydrogen-containing precursor while applying a bias power. The contacting may reduce a thickness of the flowable oxygen-containing material.

Selective deposition of silicon oxide on metal surfaces

Methods for selective deposition of silicon oxide films on metal or metallic surfaces relative to dielectric surfaces are provided. A dielectric surface of a substrate may be selectively passivated relative to a metal or metallic surface, such as by exposing the substrate to a silylating agent. Silicon oxide is then selectively deposited on the metal or metallic surface relative to the passivated oxide surface by contacting the metal surface with a metal catalyst and a silicon precursor comprising a silanol.