C09D161/34

ANTI-REFLECTIVE HARDMASK COMPOSITION
20200233305 · 2020-07-23 ·

Provided is an anti-reflective hardmask composition including: (a) a polymer composed of an indolocarbazole represented by the following Chemical Formula 1 or a polymeric blend containing the same; and (b) an organic solvent.

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ANTI-REFLECTIVE HARDMASK COMPOSITION
20200233305 · 2020-07-23 ·

Provided is an anti-reflective hardmask composition including: (a) a polymer composed of an indolocarbazole represented by the following Chemical Formula 1 or a polymeric blend containing the same; and (b) an organic solvent.

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FLUOROPOLYMER ADHESIVES AND METHODS THEREOF
20200199299 · 2020-06-25 ·

Examples of the present disclosure provide fluoropolymers and methods for forming and using such fluoropolymers. Fluoropolymers include polyfluorobenzoxazines and polyfluoroimides. Methods for forming polyphthalonitriles are also provided. The present disclosure is further directed to compositions containing one or more fluoropolymers and one or more metal oxides.

FLUOROPOLYMER ADHESIVES AND METHODS THEREOF
20200199299 · 2020-06-25 ·

Examples of the present disclosure provide fluoropolymers and methods for forming and using such fluoropolymers. Fluoropolymers include polyfluorobenzoxazines and polyfluoroimides. Methods for forming polyphthalonitriles are also provided. The present disclosure is further directed to compositions containing one or more fluoropolymers and one or more metal oxides.

PROCESS FOR PREPARING LIQUID COMPOSITIONS OF ETHERIFIED MELAMINE FORMALDEHYDE RESINS

The present invention relates to a process for preparing liquid compositions of etherified melamine formaldehyde resins, namely melamine formaldehyde resins etherified with a primary C.sub.1-C.sub.6-alkanol, which have low formaldehyde contents. The invention also relates to such liquid compositions of etherified melamine formaldehyde resins having a content of free formaldehyde of less than 0.3% by weight. The liquid compositions of etherified melamine formaldehyde resins are useful as crosslinking agents in coating compositions.

PROCESS FOR PREPARING LIQUID COMPOSITIONS OF ETHERIFIED MELAMINE FORMALDEHYDE RESINS

The present invention relates to a process for preparing liquid compositions of etherified melamine formaldehyde resins, namely melamine formaldehyde resins etherified with a primary C.sub.1-C.sub.6-alkanol, which have low formaldehyde contents. The invention also relates to such liquid compositions of etherified melamine formaldehyde resins having a content of free formaldehyde of less than 0.3% by weight. The liquid compositions of etherified melamine formaldehyde resins are useful as crosslinking agents in coating compositions.

Novolac curing agent with alkoxysilyl group, method for preparing the same, composition containing the same, the cured product, and use thereof

A new novolac curing agent with an alkoxysilyl group exhibiting excellent heat resistance such as a low CTE and an high Tg when a composite is formed, a preparing method of the same, a composition including the same, a cured article, and an use thereof, are provided. The new novolac curing agent having an alkoxysilyl group of Formulae I-1 to I-4, a preparing method of the new novolac curing agent by alkenylation and alkoxysilylation of the novolac curing agent, a preparing method of the new novolac curing agent by alkoxysilylation of a novolac curing agent, a composition including a novolac curing agent having an alkoxysilyl group of Formulae I-1 to I-4, a cured article and a use thereof, are provided. A composite including a novel novolac curing agent having an alkoxysilyl group exhibits a low CTE and a high glass transition temperature.

Novolac curing agent with alkoxysilyl group, method for preparing the same, composition containing the same, the cured product, and use thereof

A new novolac curing agent with an alkoxysilyl group exhibiting excellent heat resistance such as a low CTE and an high Tg when a composite is formed, a preparing method of the same, a composition including the same, a cured article, and an use thereof, are provided. The new novolac curing agent having an alkoxysilyl group of Formulae I-1 to I-4, a preparing method of the new novolac curing agent by alkenylation and alkoxysilylation of the novolac curing agent, a preparing method of the new novolac curing agent by alkoxysilylation of a novolac curing agent, a composition including a novolac curing agent having an alkoxysilyl group of Formulae I-1 to I-4, a cured article and a use thereof, are provided. A composite including a novel novolac curing agent having an alkoxysilyl group exhibits a low CTE and a high glass transition temperature.

Resist multilayer film-attached substrate and patterning process

The present invention provides a resist multilayer film-attached substrate, including a substrate and a resist multilayer film formed on the substrate, in which the resist multilayer film has an organic resist underlayer film difficultly soluble in ammonia hydrogen peroxide water, an organic film soluble in ammonia hydrogen peroxide water, a silicon-containing resist middle layer film, and a resist upper layer film laminated on the substrate in the stated order. There can be provided a resist multilayer film-attached substrate that enables a silicon residue modified by dry etching to be easily removed in a wet manner with a removing liquid harmless to a semiconductor apparatus substrate and an organic resist underlayer film required in the patterning process, for example, an ammonia aqueous solution containing hydrogen peroxide called SC1, which is commonly used in the semiconductor manufacturing process.

Resist multilayer film-attached substrate and patterning process

The present invention provides a resist multilayer film-attached substrate, including a substrate and a resist multilayer film formed on the substrate, in which the resist multilayer film has an organic resist underlayer film difficultly soluble in ammonia hydrogen peroxide water, an organic film soluble in ammonia hydrogen peroxide water, a silicon-containing resist middle layer film, and a resist upper layer film laminated on the substrate in the stated order. There can be provided a resist multilayer film-attached substrate that enables a silicon residue modified by dry etching to be easily removed in a wet manner with a removing liquid harmless to a semiconductor apparatus substrate and an organic resist underlayer film required in the patterning process, for example, an ammonia aqueous solution containing hydrogen peroxide called SC1, which is commonly used in the semiconductor manufacturing process.