A powder which is composed of particles that are mainly composed of calcium titanate having a perovskite crystal structure, and primary particles of which have a generally spherical shape and an average particle diameter within the range of from 20 nm to 100 nm (inclusive). This powder is produced by a method which comprises: the production of calcium titanate by subjecting a mixed liquid that contains a sugar, an alkali, a water-soluble compound containing calcium, and a compound which is obtained by deflocculating a hydrolysis poroduct of a titanium compound with use of a monobasic acid to a high-pressure liquid-phase reaction that includes heating to a temperature of from 100° C. to 270° C. (inclusive),; and a subsequent calcium removal treatment.

A sandwich-structured dielectric material for pulse energy storage is provided as well as a preparation method thereof. Employing a sandwich structure and combining the properties of ceramic-glass materials prepares a high performance dielectric material for pulse energy storage, in which the ceramic dielectric is core-shell structured powder of Ba.sub.xSr.sub.1-xTiO.sub.3 coated with SiO.sub.2, and the glass material is alkali-free glass AF45, of which the chemical composition is 63% SiO.sub.2-12% BaO-16% B.sub.2O.sub.3-9% Al.sub.2O.sub.3. AF45 alkali-free glass paste is spin-coated on both sides of the ceramic and calcined to get a layer-structured material of glass-ceramic-glass.

Provided is a dielectric ceramic composition comprising a main component of forsterite and calcium strontium titanate. A content ratio of forsterite in the main component is from 84.0 to 92.5 parts by mole, and a content ratio of calcium strontium titanate is from 7.5 to 16.0 parts by mole. (Sr+Ca)/Ti in the calcium strontium titanate is from 1.03 to 1.20 in terms of a molar ratio. With respect to a total of 100 parts by mass of the main component and a subcomponent except for Li-containing glass, from 2 to 10 parts by mass of Li-containing glass is added. The Li-containing glass includes Al.sub.2O.sub.3 in an amount of from 1% by mass to 10% by mass.

A novel titanate aqueous solution is provided that is capable of easily preparing titanate compounds composed of alkali metals or alkaline earth metals, wherein the titanate aqueous solution contains titanate ions and quaternary ammonium cations in water, and the titanate aqueous solution is characterized in that 30 g of the titanate aqueous solution (25° C.) adjusted to a concentration containing 9% by mass of titanium in terms of TiO.sub.2 is added with 30 mL of a sodium hydroxide aqueous solution (25° C.) having a concentration of 2.2% by mass while stirring to form a precipitate composed of Na.sub.2Ti.sub.3O.sub.7 hydrate, or has a transmittance at a wavelength of 360 nm being 50% or less.

A method of manufacturing a ceramic dielectric, including: heat-treating a barium precursor or a strontium precursor, a titanium precursor, and a donor element precursor to obtain a conducting or semiconducting oxide, preparing a mixture including the conducting or semiconducting oxide and a liquid-phase acceptor element precursor, and sintering the mixture to form a ceramic dielectric, wherein the ceramic dielectric includes a plurality of grains and a grain boundary between adjacent grains, and wherein the plurality of grains including an insulating oxide comprising an acceptor element derived from the acceptor element precursor.

A mixed conductor represented by Formula 1:
A.sub.4+xM.sub.5-yM′.sub.yO.sub.12-δ,  Formula 1
wherein, in Formula 1, A is a monovalent cation, M is at least one of a divalent cation, a trivalent cation, or a tetravalent cation, M′ is at least one of a monovalent cation, a divalent cation, a trivalent cation, a tetravalent cation, a pentavalent cation, or a hexavalent cation, M and M′ are different from each other, and 0.3≤x<3, 0.01<y<2, and 0≤δ≤1 are satisfied.

A dielectric powder includes a core-shell structure including a core region formed in an inner portion thereof and a shell region covering the core region. The core region includes barium titanate (BaTiO.sub.3) doped with a metal oxide, and the shell region is formed of a ferroelectric material.

A dielectric ceramic composition includes a main component of a perovskite type compound represented by a general formula of ABO.sub.3, in which A is an element in an A-site, B is an element in a B-site, and O is an oxygen element. A includes Ba. B includes Ti and Zr. A sintered-body lattice volume obtained by X-ray diffraction method is 64.50 Å.sup.3 or above.

According to a novel fabrication method, a new composition of matter includes a large percentage (e.g., 75% or higher percentage) of primary nanoparticles in the new composition of matter. The novel fabrication method reduces the size of nanoparticle clusters in material of the new composition of matter, allows fabrication of specific nanoparticle cluster sizes, and allows fabrication of primary nanoparticles. This new composition of matter can include a high permittivity and high resistivity dielectric compound. This new composition of matter, according to certain examples, has high permittivity, high resistivity, and low leakage current. In certain examples, the new composition of matter constitutes a dielectric energy storage device that is a battery with very high energy density, high operating voltage per cell, and an extended battery life cycle.

A dielectric film includes a main component of a complex oxide represented by a general formula of (Sr.sub.1-xCa.sub.x).sub.yTiO.sub.3. 0.40x0.90 and 0.90y1.10 are satisfied. A ratio of a diffraction peak intensity on (1, 1, 2) plane of the complex oxide to a diffraction peak intensity on (0, 0, 4) plane of the complex oxide in an X-ray diffraction chart of the dielectric film is 3.00 or more. Instead, a ratio of an intensity of a diffraction peak appearing at a diffraction angle 2 of 32 or more and 34 or less to an intensity of a diffraction peak appearing at a diffraction angle 2 of 46 or more and 48 or less in an X-ray diffraction chart of the dielectric film obtained by an X-ray diffraction measurement with Cu-K ray as an X-ray source is 3.00 or more.