C01B2210/0042

Gas Purifier

The invention relates to a gas purifier that removes moisture and oxygen from inert gases and reducing gases, for example, at sub-atmospheric pressures. The purifier can remove part per million levels of moisture in a gas stream to less than 100 parts per trillion by volume, and has a low pressure drop and a sharp breakthrough curve.

Gas purifier

The invention relates to a gas purifier that removes moisture and oxygen from inert gases and reducing gases, for example, at sub-atmospheric pressures. The purifier can remove part per million levels of moisture in a gas stream to less than 100 parts per trillion by volume, and has a low pressure drop and a sharp breakthrough curve.

Production method for high-purity hydrogen chloride gas

A method for producing a high-purity hydrogen chloride gas comprises performing a purification process that includes the steps 1) to 3) below on a byproduct hydrogen chloride gas: 1) a crude hydrochloric acid generation step of allowing water to absorb the byproduct hydrogen chloride gas; 2) a volatile organic impurity-removed hydrochloric acid generation step of bringing the crude hydrochloric acid obtained in the step 1) into contact with an inert gas at a liquid temperature of 20 to 45 C. to dissipate volatile organic impurities; and 3) a high-purity hydrogen chloride gas generation step of supplying the volatile organic impurity-removed hydrochloric acid obtained in the step 2) to a distillation column and performing distillation under conditions of a column bottom temperature of higher than 60 C. and 108 C. or lower and a column top temperature of 60 C. or lower to distill out a high-purity hydrogen chloride gas.

Hydrogen separation filter and method for manufacturing hydrogen separation filter

Provided is a hydrogen separation filter allowing a hydrogen purification at a lower temperature than conventional one, and a method for manufacturing the same. A hydrogen separation filter includes a porous substrate, a lattice expansion layer formed on the porous substrate and containing a first material, and a hydrogen dissociation and transmission layer formed on the lattice expansion layer and containing a second material selected from the group consisting of Pd, V, Ta, Ti, Nb, and alloys thereof. The first material and the second material have a same crystalline structure. A lattice constant a.sub.1, bulk of a first bulk material having a same composition and a same crystalline structure as the first material and a lattice constant a.sub.2, bulk of a second bulk material having a same composition and a same crystalline structure as the second material satisfy a formula (1):
1.03a.sub.2, bulka.sub.1, bulk1.15a.sub.2, bulk(1).

METHOD FOR PRODUCING HIGH-PURITY HYDROCHLORIC ACID

The present invention provides a method including bringing hydrogen chloride gas into gas-liquid contact with crude hydrochloric acid that has a hydrogen chloride concentration of less than the saturation value and that contains low-boiling-point impurities, suitably at least one selected from hydrogen, nitrogen, oxygen, methane, ethylene, and acetylene, wherein the gas-liquid contact of the hydrogen chloride gas is further continued after the hydrogen chloride concentration reaches the saturation value until an excess amount of 0.1% or more of the mass of the saturated hydrochloric acid has been subjected to the contact treatment.

System for obtaining high purity nitrogen in nitrogen gas purification applications and a method thereof

Disclosed is a system developed for obtaining high purity (minimum 99.999%) nitrogen gas in nitrogen gas purification applications and drying obtained nitrogen gas before applying it on areas of use, and to an operating method of the system.

SYSTEM AND METHOD FOR PRODUCTION OF ULTRA-HIGH PURITY OXYGEN
20260035243 · 2026-02-05 ·

A system and method of ultra-high purity (UHP) oxygen production from an argon and oxygen producing cryogenic air separation unit incorporating a dedicated methane rejection column or column section having a liquid to vapor (L/V) ratio lower than the L/V ratio in the associated argon rectifier is provided.