In an aspect, a mixed metal oxide comprises or consists essentially of: a mixture comprises or consisting essentially of 0.30 to 0.69 parts by mole Mg, 0.20 to 0.69 parts by mole Zn, 0.01 to 0.30 parts by mole of a third element selected from Al and Ga, and, either, when the third element is Al, 0.00 to 0.31 parts by mole of other elements selected from metals and metalloids, or, when the third element is Ga, 0.00 to 0.15 parts by mole of other elements selected from metals and metalloids, wherein the sum of all parts by mole of Mg, Zn, the third element, and the other elements amounts to 1.00, wherein the amount in parts by mole of the other elements is lower than the amount in parts by mole of Mg and is lower than the amount in parts by mole of Zn; oxygen; and less than 0.01 parts by mole of non-metallic and non-metalloid impurities.

The present invention concerns a new solid material according to general formula (I) as follows: Li.sub.4−2xZn.sub.xP.sub.2S.sub.6 (I) wherein 0<x≤1. The invention also refers to a method for producing a solid material comprising at least bringing at least lithium sulfide, phosphorous sulfide, and a zinc compound, optionally in one or more solvents. The invention also refers to said solid materials and their use as solid electrolytes notably for electrochemical devices.

A solid electrolyte material contains Li, M, and X. M is at least one selected from metallic elements, and X is at least one selected from the group consisting of Cl, Br, and I. A plurality of atoms of X form a sublattice having a closest packed structure. An average distance between two adjacent atoms of X among the plurality of atoms of X is 1.8% or more larger than a distance between two adjacent atoms of X in a rock-salt structure composed only of Li and X.

A core-shell quantum dot including a core including a first semiconductor nanocrystal, the first semiconductor nanocrystal including zinc, tellurium, and selenium and a semiconductor nanocrystal shell disposed on the core, the semiconductor nanocrystal shell including zinc and selenium, sulfur, or a combination thereof and a production thereof are disclosed, wherein the core-shell quantum dot does not include cadmium, lead, mercury, or a combination thereof, wherein the core-shell quantum dot(s) includes chlorine, wherein in the core-shell quantum dot, a mole ratio of chlorine with respect to tellurium is greater than or equal to about 0.01:1 and wherein a quantum efficiency of the core-shell quantum dot is greater than or equal to about 10%.

Nanostructures including a first semiconductor nanocrystal including zinc and selenium, and a second semiconductor nanocrystal including a zinc chalcogenide, wherein a composition of the second semiconductor nanocrystal is different from a composition of the first semiconductor nanocrystal, wherein the nanostructures further include tellurium, wherein in the nanostructures, a mole ratio of selenium to tellurium is greater than or equal to about 0.83:1 and less than or equal to about 10:1, wherein a derivative thermogravimetry curve of the nanostructures has an extreme value in a temperature range of greater than or equal to about 250° C. and less than or equal to about 420° C.

A novel material and a transistor using a novel material are provided. A composite oxide includes at least two regions, one of which includes In, Zn and an element M1 (the element M1 is one or more of Al, Ga, Si, B, Y, Ti, Fe, Ni, Ge, Zr, Mo, La, Ce, Nd, Hf, Ta, W, Mg, V, Be, and Cu), and the other of which includes In, Zn, and an element M2 (the element M2 is one or more of Al, Ga, Si, B, Y, Ti, Fe, Ni, Ge, Zr, Mo, La, Ce, Nd, Hf, Ta, W, Mg, V, Be, and Cu). The proportion of the element M1 to In, Zn, and the element M1 in the region including the element M1 is less than that of the element M2 to In, Zn, and the element M2 in the region including the element M2. In an analysis of the composite oxide by X-ray diffraction, the diffraction pattern result in the X-ray diffraction is asymmetric with the angle at which the peak intensity of X-ray diffraction is detected as the symmetry axis.

A positive electrode material contains a positive electrode active material and a first solid electrolyte material. The first solid electrolyte material contains Li, M, and X; M at least contains yttrium; and X is at least one selected from the group consisting of Cl, Br, and I.

A hydrotalcite is represented by formula (1):
(M.sup.2+).sub.1-X(M.sup.3+).sub.X(OH).sub.2(A.sup.n−).sub.X/n.Math.mH.sub.2O  (1), wherein M.sup.2+ indicates a divalent metal, M.sup.3+ indicates a trivalent metal, A.sup.n− indicates an n-valent anion, n indicates an integer of 1 to 6, 0.17≤x≤0.36, and 0≤m≤10. The hydrotalcite has (A) a lattice strain in the <003> direction is 3×10.sup.−3 or less as measured using an X-ray diffraction method; (B) primary particles with an average width between 5 nm and 200 nm inclusive per a SEM method; and (C) a degree of monodispersity of 50% or greater (degree of monodispersity (%)=(average width of primary particles as measured using the SEM method/average width of secondary particles as measured using a dynamic light scattering method)×100). A resin containing the hydrotalcite, a suspension containing the hydrotalcite and a method for producing the hydrotalcite are disclosed.

A solid electrolyte material contains Li, Y, at least one selected from the group consisting of Mg, Ca, Sr, Ba, Zn, Sc, La, Sm, Bi, Zr, Hf, Nb, and Ta, and at least one selected from the group consisting of Cl, Br, and I. An X-ray diffraction pattern of the solid electrolyte material obtained by using Cu-Kα radiation as the X-ray source includes peaks within the range in which the diffraction angle 2θ is 25° or more and 35° or less, and also includes at least one peak within the range in which the diffraction angle 2θ is 43° or more and 51° or less.

A solid electrolyte material contains Li; Y; at least one selected from the group consisting of Mg, Ca, Sr, Ba, Zn, Zr, Nb, and Ta; and at least one selected from the group consisting of Cl, Br, and I. An X-ray diffraction pattern of the solid electrolyte material obtained using Cu—Kα radiation as an X-ray source includes peaks in a range of diffraction angles 2θ of 30° or more and 33° or less, in a range of diffraction angles 2θ of 39° or more and 43° or less, and in a range of diffraction angles 2θ of 47° or more and 51° or less.