The present disclosure relates to voltage sensing mechanisms. One example embodiment includes a voltage-measurement device. The voltage-measurement device includes a housing. The voltage-measurement device also includes an extendible gripper configured to be removably attached to a wire under test. Additionally, the voltage-measurement device includes at least one power supply. Further, the voltage-measurement device includes a power management chip electrically coupled to the at least one power supply and configured to manage a range of input voltages from the at least one power supply. The power management chip comprises a synchronous boost voltage regulator. Additionally, the voltage-management device has a microprocessor electrically coupled to the power management chip and the extendible gripper. The microprocessor is configured to receive electrical power from the power management chip. The microprocessor is also configured to receive an electrical signal from the extendible gripper indicative of a voltage associated with the wire under test.

The present disclosure relates to voltage sensing mechanisms. One example embodiment includes a voltage-measurement device. The voltage-measurement device includes a housing. The voltage-measurement device also includes an extendible gripper configured to be removably attached to a wire under test. Additionally, the voltage-measurement device includes at least one power supply. Further, the voltage-measurement device includes a power management chip electrically coupled to the at least one power supply and configured to manage a range of input voltages from the at least one power supply. The power management chip comprises a synchronous boost voltage regulator. Additionally, the voltage-management device has a microprocessor electrically coupled to the power management chip and the extendible gripper. The microprocessor is configured to receive electrical power from the power management chip. The microprocessor is also configured to receive an electrical signal from the extendible gripper indicative of a voltage associated with the wire under test.

The present disclosure relates to voltage sensing mechanisms. One example embodiment includes a voltage-measurement device. The voltage-measurement device includes a housing. The voltage-measurement device also includes an extendible gripper configured to be removably attached to a wire under test. Additionally, the voltage-measurement device includes at least one power supply. Further, the voltage-measurement device includes a power management chip electrically coupled to the at least one power supply and configured to manage a range of input voltages from the at least one power supply. The power management chip comprises a synchronous boost voltage regulator. Additionally, the voltage-management device has a microprocessor electrically coupled to the power management chip and the extendible gripper. The microprocessor is configured to receive electrical power from the power management chip. The microprocessor is also configured to receive an electrical signal from the extendible gripper indicative of a voltage associated with the wire under test.

Electrical switchable glasses production comprising the steps of: (a) providing a first and second cover glass; (b) providing a PDLC or other electrically switchable film; (c) providing a first and second layer of adhesive interlayer; (d) providing a PDLC inspection station further comprising: (i) a levelled-up table; (ii) means for inspecting properties of the PDLC film and/or glasses selected from the group consisting of electric properties, optical properties, mechanical properties and any combination thereof; (e) placing the first cover glass onto the levelled-up table; (f) spreading a first layer of adhesive interlayer (g) spreading the PDLC film over the previously placed adhesive interlayer; (h) spreading a second layer of adhesive interlayer; (i) covering the PDLC film by means of the second cover glass; (j) laminating the PDLC film between the first and second cover glasses; and (k) inspecting the glass properties by means of the PDLC inspection station before and after laminating the PDLC film.

A method of manufacturing a liquid crystal display device according to an exemplary embodiment of the invention includes forming field generating electrodes on at least one of a lower display substrate and an upper display substrate, forming alignment layers on the lower display substrate and the upper display substrate, forming a liquid crystal layer including liquid crystal molecules between the lower display substrate and the upper display substrate, electric-field exposing the liquid crystal layer to pretilt the liquid crystal molecules of the liquid crystal layer, and measuring pretilt angles of the liquid crystal molecules after the electric-field exposing.