G01B11/2408

Measurement Device and Measurement Method for Measuring Roundness of Coating Roll for Manufacturing Battery

Disclosed herein is a roundness measuring device and a roundness measuring method of a coating roll for battery manufacturing. The roundness measuring device of a coating roll that supports an electrode sheet when the electrode sheet is coated with an electrode slurry, the roundness measuring device comprising: a displacement sensor spaced apart from the coating roll and configured to measure roundness of the coating roll in a non-contact manner; and a support member on which the displacement sensor is installed and which extends in a length direction of the coating roll, wherein the displacement sensor is installed as a plurality of displacement sensors on the support member in the length direction of the coating roll.

THREE-DIMENSIONAL OPTICAL MEASURING APPARATUS FOR ROPES WITH LIGHTING DEVICE

A calibrated three-dimensional optical measuring apparatus for three-dimensional measurement of geometric parameters of a rope has a frame defining and arranged around a rope receiving cavity. Image acquisition devices acquiring digital images of regions of an outer surface of the rope are fixed to the frame and arranged around the rope when the calibrated three-dimensional optical measuring apparatus receives the rope in the rope receiving cavity. An electronic digital image processing device processes a multiplicity of digital images and obtains a three-dimensional photogrammetric reconstruction of points of the digital images of the rope. Having defined a circumferential direction running around a main extension axis of the rope and lying on a plane incident or perpendicular to the main extension axis of the rope, the image acquisition devices are arranged on the frame circumferentially spaced apart from one another along the circumferential direction. A lighting device is arranged along the circumferential direction between a pair of adjacent image acquisition devices.

Method and system for map-free inspection of semiconductor devices

A system and method for defect detection in a hole array on a substrate is disclosed herein. In one embodiment, a method for defect detection in a hole array on a substrate, includes: scanning a substrate surface using at least one optical detector, generating at least one image of the substrate surface; and analyzing the at least one image to detect defects in the hole array on the substrate surface based on a set of predetermined criteria.

Method ad Apparatus for Digital Thread Inspection
20230204346 · 2023-06-29 ·

A compact inspection assembly comprising digital sensors and/or laser measurement systems to measure and validate attributes of pipe and associated threaded connections. A custom designed end-effector sensor assembly is selectively attached to a robotic arm having software and control systems. An automated sensor assembly, selectively positioned relative to a pipe section, measures data regarding the pipe and associated threaded connections. The measured and recorded data can be inspected for defects and/or compared to predetermined standards (such as, for example, original equipment manufacturer and/or end user specifications or requirements) to verify pipe/connection compliance with desired standards.

MEASUREMENT APPARATUS, MEASUREMENT METHOD, AND CORRECTION METHOD
20170355532 · 2017-12-14 ·

A measurement apparatus 1 according to the present invention includes a table 10 that has an axis of rotation 14 and supports a disc-shaped object 40, a first driving unit that rotates the table 10 around the axis of rotation 14, a light source 50 that produces illumination light with which an end portion 45 of the disc-shaped object 40 is illuminated, an objective lens 60 that collects the illumination light reflected from the end portion 45, a second driving unit that moves the objective lens 60 along an optical axis 64, an imaging unit 70 that captures an image of the end portion 45 by detecting the reflected light collected by the objective lens 60, and an autofocus optical system 80 that determines a position of the objective lens 60 where the image of the end portion 45 is brought into focus in the imaging unit 70.

WATER-IMMERSED HIGH PRECISION LASER FOCUS SPOT SIZE MEASUREMENT APPARATUS

A measurement apparatus for measuring a laser focus spot size, which includes a two-dimensional image detector and an imaging system which forms a magnified image of a focus spot located an object plane onto the image detector. The imaging system includes at least an objective lens. A sealed liquid container is secured over a part of the objective lens such as the optical surface of the objective lens is immersed in the liquid (e.g. water) within the container. The liquid container has a window through which the laser beam enters. An image processing method is also disclosed which processes the image obtained by the image detector to obtain the focus spot size while implementing an algorithm that corrects for the effect of ambient vibration.

METHOD OF INSPECTING PIPE JOINTS FOR USE IN A SUBSEA PIPELINE

A method of inspecting a pipe joint for use in a subsea pipeline and a method of manufacturing a pipe joint for use in a subsea pipeline employing said inspection method are disclosed, the inspection method comprising the steps of: receiving a pipe joint; measuring the ovality of the pipe joint to obtain ovality data; determining that the ovality data does not exceed a predetermined maximum pipe joint ovality value; and carrying out external pressure collapse tests on a ring cut from one end of the received pipe joint, resulting in data representative of the hydrostatic collapse pressure of said pipe joint for use in confirming that the pipe joint is suitable for its intended use.

Drift and measurement tools and methods

A drifting and measurement tool is disclosed. The tool includes a first portion configured to mount on a first end of a tubular segment, and a second portion configured to mount on a second end of the tubular segment. The first portion has a rotatable component configured to rotate about a longitudinal axis of the tubular segment. The rotatable component includes a laser device configured to emit light toward the second portion and receive reflected light.

METHOD AND SYSTEM FOR MAP-FREE INSPECTION OF SEMICONDUCTOR DEVICES

A system and method for defect detection in a hole array on a substrate is disclosed herein. In one embodiment, a method for defect detection in a hole array on a substrate, includes: scanning a substrate surface using at least one optical detector, generating at least one image of the substrate surface; and analyzing the at least one image to detect defects in the hole array on the substrate surface based on a set of predetermined criteria.

Device for measuring the internal profile of a hollow shaft
09797757 · 2017-10-24 · ·

A sensor is placed on a plate lowered into the hollow of the shaft and guided by taut wires between a lower attachment device and an upper motorized winder. The deformations, responsible for measurement errors and caused either by static deformations, produced by the weight or poor construction of the apparatus, or by vibrations, are to a large extent eliminated.