Apparatus and associated methods relate to an alignment system including an alignment source module (ASM) and an alignment indicator module (AIM) configured to be releasably coupled to a first unit and a second unit, respectively, of a pair of optoelectronic arrays. In an illustrative example, the ASM may be oriented, when coupled, to emit an optical beam in substantial alignment with a first optical axis of the first unit. The AIM may, for example, be configured, when coupled, to provide a visible indication when the optical beam is within a predetermined near-alignment orientation range relative to a second optical axis of the second unit. Each of the AIM and the ASM may, for example, be configured to axially couple along respective longitudinal axes of the first unit and the second. Various embodiments may advantageously facilitate manipulation of the pair of optoelectronic arrays into near alignment with each other.

Apparatus and associated methods relate to an alignment system including an alignment source module (ASM) and an alignment indicator module (AIM) configured to be releasably coupled to a first unit and a second unit, respectively, of a pair of optoelectronic arrays. In an illustrative example, the ASM may be oriented, when coupled, to emit an optical beam in substantial alignment with a first optical axis of the first unit. The AIM may, for example, be configured, when coupled, to provide a visible indication when the optical beam is within a predetermined near-alignment orientation range relative to a second optical axis of the second unit. Each of the AIM and the ASM may, for example, be configured to axially couple along respective longitudinal axes of the first unit and the second. Various embodiments may advantageously facilitate manipulation of the pair of optoelectronic arrays into near alignment with each other.

A method and apparatus for a structured light measuring device, having a preferable VCSEL array in its previous illuminated cross plane, using the laser array to be projected through said device's objective and collect the reflected beams through the same objective lens. A motorized stage is attached to the objective focusing, enabling back and forth focusing on different external planes. A software algorithm running on a computer device will analyze the reflected laser beam and find its central point and further translate it to angular deviations, similar to Autocollimation principles. Furthermore, this could be displayed as a cross on the user GUI for better user interface. The focusing function has the capability to focus the laser array at various planes, and analyze if the reflected beam is at its best focal point or deviates. By moving the focal point back and forth, a 3-D reconstruction can be achieved, preferable for lenses and calculating the center location relative to the device's line of sight.

An automatically aligning riflescope display adapter (RDA) system can illuminate toward an eyepiece with a beam from a light emitter. The RDA system can activate a display which includes an electronic reticle visible through the eyepiece. Additionally, the RDA system can track, with a tracking sensor, a location of a scope reticle based on back reflection of the beam from direction of the eyepiece. The RDA system can detect an amount of optical misalignment between the scope reticle and rhe electronic reticle. The RDA systen can align the scope reticle with the electronic reticle.

A measurement system for frames of heavy duty trucks and trailers does not require a dimensional reference database. A plurality of electronic targets are attached to selected target points on the frame. A position of the laser scanner from the selected target points is determined. Measurement data for additional targets is determined. The frame dimensions are then analyzed for defects that are greater than a pre-set tolerance. Measurements outside of a tolerance range can be flagged with contrasting color. The results of the frame analysis are shown on the user's screen, on the electronic target, and can be printed out or emailed for future inspection. The frame can be repaired while the targets and laser scanner are still deployed so that the measurement system can continue to display the status of the measurement points in real time and the success of the repairs can be confirmed.

A system of generating a three-dimensional (3D) scan of an environment includes multiple 3D scanners including a first 3D scanner at respective first and second positions. The system further includes a controller coupled to the 3D scanners via a common communications network. The first scanner and second scanner transmit a subset of data to the controller while acquiring a set of 3D coordinates. The controller registers the subsets of data to each other while the sets of 3D coordinates is being acquired.

A minimal contact end-effector is described that may be used for handling microelectronic and similar types of devices. In one example the end-effector has a vacuum pad to generate a lifting force and a standoff fastened to the vacuum pad. The standoff has a plurality of legs with chamfered edges to contact the edges of a microelectronic device to hold the device against the lifting force.

An electronic device comprises a camera and a retaining member. The camera includes an objective portion configured to collect light from a subject, a sensor portion reversibly separable from the objective portion, and a computer configured to return an indication of alignment of the objective and sensor portions based on output of one or more optical sensor elements of the sensor portion. The retaining member is configured to couple the objective portion to the sensor portion when the objective and sensor portions are aligned and also when the objective portion is separated from the sensor portion.

A measurement system includes a measurement device to detect measurement information relating to a position-modifiable component of a printing station during movement thereof. A calculation unit receives the measurement information from the measurement device. The calculation unit determines actual-position data of the position-modifiable component from the measurement data received and compares it with predetermined reference-position data to determine calibration information based on the actual-position data and the reference-position data. An interface permits then permits transfer of this calibration information.

A method of measuring a surface of an optical element and an interferometric measuring device for measuring a surface or profile of the optical element. The optical element having a first surface and a second surface opposite the first surface. The method includes defining at least a first measurement point, a second measurement point and a third measurement point on a measurement surface of the optical element being one of the first surface and the second surface, measuring a first position of the first measurement point by directing a measurement beam from a measurement head onto the first measurement point and by detecting a measurement beam portion reflected at the first measurement point, subsequently measuring at least a second position of the second measurement point and a third position of the third measurement point by directing the measurement beam onto the second measurement point and onto the third measurement point and by detecting a measurement beam portion reflected at the second measurement point and the third measurement point, respectively, and determining at least one of a decenter and a tilt of the measurement surface relative to a reference axis on the basis of at least the first position, the second position and the third position.