G01B21/24

Autofocusing microscope objective

The invention relates to an autofocusable microscope objective having an optical system of a plurality of optical components each formed by a lens or lens group. Here, one of the plurality of optical components is a liquid lens to effect autofocusing of the microscope objective, and the optical system is formed as a stationary system.

System and Method for Adjusting Wheel Alignment of Vehicle
20220410382 · 2022-12-29 ·

The present disclosure relates to a system for adjusting wheel alignment of a vehicle, the system including a base configured to be moved by a robot. The system further includes an adjustment arm movably disposed on the base and configured to be moved by an actuator. The system further includes a fixing unit provided at an upper end of the adjustment arm and configured to fix a bolt head or a nut. The system further includes a control unit configured to control the robot to allow the base to enter a toe adjustment part or a camber adjustment part for a vehicle suspension, the control unit being configured to control the actuator to allow the fixing unit of the adjustment arm to manipulate a bolt and a nut of the toe adjustment part or the camber adjustment part to adjust the wheel alignment of the vehicle.

System and Method for Adjusting Wheel Alignment of Vehicle
20220410382 · 2022-12-29 ·

The present disclosure relates to a system for adjusting wheel alignment of a vehicle, the system including a base configured to be moved by a robot. The system further includes an adjustment arm movably disposed on the base and configured to be moved by an actuator. The system further includes a fixing unit provided at an upper end of the adjustment arm and configured to fix a bolt head or a nut. The system further includes a control unit configured to control the robot to allow the base to enter a toe adjustment part or a camber adjustment part for a vehicle suspension, the control unit being configured to control the actuator to allow the fixing unit of the adjustment arm to manipulate a bolt and a nut of the toe adjustment part or the camber adjustment part to adjust the wheel alignment of the vehicle.

SELF-CALIBRATED OVERLAY METROLOGY USING A SKEW TRAINING SAMPLE

An overlay metrology system may receive overlay data for in-die overlay targets within various fields on a skew training sample from one or more overlay metrology tools, wherein the in-die overlay targets within the fields have a range programmed overlay offsets, wherein the fields are fabricated with a range of programmed skew offsets. The system may further generate asymmetric target signals for the in-die overlay targets using an asymmetric function providing a value of zero when physical overlay is zero and a sign indicative of a direction of physical overlay. The system may further generate corrected overlay offsets for the in-die overlay targets on the asymmetric target signals, generate self-calibrated overlay offsets for the in-die overlay targets based on the programmed overlay offsets and the corrected overlay offsets, generate a trained overlay recipe, and generate overlay measurements for in-die overlay targets on additional samples using the trained overlay recipe.

SELF-CALIBRATED OVERLAY METROLOGY USING A SKEW TRAINING SAMPLE

An overlay metrology system may receive overlay data for in-die overlay targets within various fields on a skew training sample from one or more overlay metrology tools, wherein the in-die overlay targets within the fields have a range programmed overlay offsets, wherein the fields are fabricated with a range of programmed skew offsets. The system may further generate asymmetric target signals for the in-die overlay targets using an asymmetric function providing a value of zero when physical overlay is zero and a sign indicative of a direction of physical overlay. The system may further generate corrected overlay offsets for the in-die overlay targets on the asymmetric target signals, generate self-calibrated overlay offsets for the in-die overlay targets based on the programmed overlay offsets and the corrected overlay offsets, generate a trained overlay recipe, and generate overlay measurements for in-die overlay targets on additional samples using the trained overlay recipe.

Driveshaft misalignment measurement systems and methods
11518544 · 2022-12-06 · ·

A driveshaft misalignment measurement system for a drivetrain of an aircraft includes a driveshaft having a first end forming a driveshaft spline and a drivetrain subsystem including a spline adapted to connect to the driveshaft spline to form a splined connection. Rotational energy is transferred between the drivetrain subsystem and the driveshaft via the splined connection. The driveshaft misalignment measurement system also includes accelerometers coupled to the drivetrain configured to detect acceleration data and a flight control computer configured to measure misalignment at the splined connection using the acceleration data.

Driveshaft misalignment measurement systems and methods
11518544 · 2022-12-06 · ·

A driveshaft misalignment measurement system for a drivetrain of an aircraft includes a driveshaft having a first end forming a driveshaft spline and a drivetrain subsystem including a spline adapted to connect to the driveshaft spline to form a splined connection. Rotational energy is transferred between the drivetrain subsystem and the driveshaft via the splined connection. The driveshaft misalignment measurement system also includes accelerometers coupled to the drivetrain configured to detect acceleration data and a flight control computer configured to measure misalignment at the splined connection using the acceleration data.

System and method for characterizing particulates in a fluid sample

A system for characterizing at least one particle from a fluid sample is disclosed. The system includes a filter disposed upstream of an outlet, and a luminaire configured to illuminate the at least one particle at an oblique angle. An imaging device is configured to capture and process images of the illuminated at least one particle as it rests on the filter for characterizing the at least one particle. A system for characterizing at least one particle using bright field illumination is also disclosed. A method for characterizing particulates in a fluid sample using at least one of oblique angle and bright field illumination is also disclosed.

Enhanced detection of sensor misalignments by coordinating sensors utilizing multiple sensing modalities

The techniques disclosed herein detect sensor misalignments in a display device by the use of sensors operating under different modalities. In some configurations, a near-to-eye display device can include a number of sensors that can be used to track movement of the device relative to a surrounding environment. The device can utilize multiple sensors operating under multiple modalities. For each sensor, there is a set of intrinsic and extrinsic properties that are calibrated. The device is also configured to determine refined estimations of the intrinsic and extrinsic properties at runtime. The refined estimations of the intrinsic and extrinsic properties can then be used to derive knowledge on how the device has deformed over time. The device can then use the refined estimations of the intrinsic and extrinsic properties and/or any other resulting data that quantifies any deformations of the device to make adjustments to rendered images at runtime.

Enhanced detection of sensor misalignments by coordinating sensors utilizing multiple sensing modalities

The techniques disclosed herein detect sensor misalignments in a display device by the use of sensors operating under different modalities. In some configurations, a near-to-eye display device can include a number of sensors that can be used to track movement of the device relative to a surrounding environment. The device can utilize multiple sensors operating under multiple modalities. For each sensor, there is a set of intrinsic and extrinsic properties that are calibrated. The device is also configured to determine refined estimations of the intrinsic and extrinsic properties at runtime. The refined estimations of the intrinsic and extrinsic properties can then be used to derive knowledge on how the device has deformed over time. The device can then use the refined estimations of the intrinsic and extrinsic properties and/or any other resulting data that quantifies any deformations of the device to make adjustments to rendered images at runtime.