The invention relates to a sensor device for examining the coating of a disc as part of a coating process. The sensor device comprises a first optical sensor system for determining the layer thickness of the coating applied to the disc, and comprises a rotation apparatus. The invention is characterized in that the first optical sensor system is designed to simultaneously identify at least one first position-based measured value and one second position-based measured value, the first and the second position-based measured value describing the distance between the sensor systems and the surface of the disc. As a result of this, the sensor system is configured such that the first position-based measured value of a coated region of the disc and the second position-based measured value of an uncoated region of the disc are identified. Furthermore, the first optical sensor system comprises at least one linear guide, which extends from the central region to the edge. In addition, a control and analysis apparatus is provided for calculating the layer thickness of the disc at the position of the first position-based measured value with the aid of the first and the second position-based measured value. Furthermore, the invention relates to a coating for a disc, comprising inspecting the coating for determining the layer thickness of the coating applied to the disc.

A sensor includes a first element part having a first member and a first element. The first member is a acoustic tubular waveguide and extends along a first direction. The acoustic tubular waveguide includes a first opening and a second opening. A direction from the second opening toward the first opening is along the first direction. The first element includes a vibratile first membrane, and a first supporter supporting the first membrane. The second opening is between the first opening and the first membrane in the first direction. The sensor may be a Piezoelectric Micro electro mechanical systems Ultrasonic Transducer and may be used for inspecting paper and/or resin including detecting thickness of a fed through banknote and/or the presence of foreign matter thereon such as tape. An optical element may alternatively measure the vibration of a membrane from acoustic through transmission instead of an acoustic receiver.

An accurate and stable displacement sensor that reads through coated metal substrates achieves better than one micron accuracy includes: an electromagnetic coil positioned in a first enclosure; (ii) means for generating a magnetic field from the electromagnetic coil; (iii) a second enclosure which is spaced apart from the first enclosure, wherein the second enclosure includes dual magnetic sensors, such as fluxgate sensors, that are configured to measure the magnetic field; and (iv) means for calculating the separation between the operative surfaces of the enclosures from magnetic field measurements. A permanent magnet can be used instead of the electromagnetic coil and associated driving energy source. A precise displacement measurement is given by a mathematical function (such as the ratio or difference) of the two magnetic sensors demodulated signals. The displacement sensor can be mounted on a maneuverable C-frame to monitor the caliper of anodes and cathodes produced for lithium ion batteries.

A bridge device for measuring the thickness of mainly flat panels to be placed in a panel production line includes a frame having feet for fixing the bridge device to the floor; a plurality of supports that support measuring contact systems, which are slidable perpendicularly to the conveying direction of the panels so to adjust their positions for a transversal measure of the panels; a plurality of measuring contact systems, of which is one is for each longitudinal side of the panels; a photocell detecting the position of the panels and their lengths; blocking knobs for blocking the supports; and a device transmitting the information concerning the actual thickness of each panel to a machine for treating one of the main surfaces of the panel.

An elongated bending beam for a swivel bending machine has an approximately C-shaped beam cross section and two bending tools, which are opposite one another relative to a preferably horizontal central plane, and which run facing one another in the longitudinal direction of the bending beam, between which a workpiece portion of a workpiece to be bent can be introduced. An angle-measuring system for contactlessly measuring a bending angle is arranged inside the C-shape beam cross section, with which a bending angle can be measured relative to a reference plane at a workpiece section bent by one of the bending tools. The angle-measuring system also includes a first angle-measuring unit arranged below the central plane and having a first measuring region positioned substantially above the central plane, and a second angle-measuring unit arranged above the central plane and having a second measuring region positioned substantially below the central plane.

A shape measurement method includes: acquiring first data of a change of a distance between a first probe and a calibration measurement object and acquiring second data of a change of a distance between a second probe and the calibration measurement object while moving the calibration measurement object in a first direction, the calibration measurement object being rotationally symmetric around an axis parallel to the first direction, the first probe and the second probe being arranged in a second direction orthogonal to the first direction; estimating an error of the movement included in the first data based on the first and second data; acquiring third data of a change of a distance between the first probe and a measurement object while moving the measurement object relative to the first probe in the first direction; and correcting the third data by using the error.

The present disclosure relates to a THz measuring device for measuring a measuring object and a THz measuring method for measuring a measuring object.

A method includes emitting a laser including a plurality of laser points onto a surface of a conveyor belt, capturing a plurality of first images of the surface of the conveyor belt during a first cycle of the conveyor belt, creating a first three-dimensional image of the surface of the conveyor belt during the first cycle, each of a plurality of locations of the surface of the conveyor belt in the first three-dimensional image being assigned first position data, capturing a plurality of second images of the surface of the conveyor belt during a second cycle of the conveyor belt; creating a second three-dimensional image of the surface during the second cycle, each of the plurality of locations of the surface in the second three-dimensional image being assigned second position data; and determining whether a difference between the first and second position data exceeds a predetermined threshold.

The invention provides a method and an apparatus for measuring a thickness of each layer of a tire tread or a tire component, wherein the tire tread or tire component has conductive and non-conductive layers. One or more sensors are used, which emit radiation beams or pulses that travel through one or more of the layers. The radiation beams or pulses are reflected from the surfaces and interfaces of the layers and received by a receiving device of the one or more sensors. The reflected radiation beams or pulses are used to determine a thickness of each tread layer.

A lamination apparatus configured to manufacture an electrode cell assembly may include a lamination part configured to manufacture the electrode cell assembly through lamination, an inspection part configured to detect a defective electrode cell assembly by measuring a thickness of the manufactured electrode cell assembly, a discharge part configured to separate and discharge the defective electrode cell assembly from a normal electrode cell assembly, and a control part configured to perform control so as to calculate a time point at which the defective electrode cell assembly reaches the discharge part on the basis of distance data between a point at which the defective electrode cell assembly is detected and the discharge part and separate and discharge the defective electrode cell assembly when the defective electrode cell assembly reaches the discharge part. A method of discharging a defective electrode cell assembly by the lamination apparatus is also disclosed.