Various embodiments improve the performance and reliability of coordinate measuring machines by verifying that coordinate measuring machine is configured to use the appropriate probe or stylus for measuring an object. In some embodiments, confirmation that the appropriate probe or stylus is mounted is built into an automated part of the CMM's measurement process, thereby assuring that a confirmation step is performed and that the outcome is correct.

A pipeline monitoring system, utilizing RFID sensors. The pipeline monitoring system includes a pipeline having at least one RFID sensor for a wireless remote detection of any one or more of pipeline conditions including hydrocarbons presence, moisture presence, temperature and strain, and an RF interrogator or transceiver capable of interrogating said sensor.

A wireless radio-frequency identification (RFID) strain sensor including: a substrate; an antenna on the substrate; and an integrated circuit on the substrate and electrically connected to the antenna. At least one of the substrate and the antenna includes a magnetoelastic material.

A set of respective self-configuring probe interface circuit boards (SC-MPIC's) are disclosed for use with a measurement system comprising host electronics and respective interchangeable measurement probes. Member SC-MPICs each comprises: a local circuit (LS) for probe identification, signal processing and inter-board signal control; and higher-direction and lower-direction connectors “pointing” toward and away from the measurement probe, respectively. Member SC-MPICs establish a processing hierarchy by generating lower board present signals on their higher-direction connector, higher board present signals on their lower-direction connector, and determining whether they are the highest and/or lowest SC-MPIC based on receiving those signals from adjacent SC-MPICs. They can independently perform probe identification matching operations using probe identification data from compatible and incompatible probes, and the highest SC-MPIC does this first. Member SC-MPICs advantageously pass through or isolate signals from other members in the set depending on the hierarchy, various received signals, and internal processing.

A method and system to measure a parameter associated with a component, device, or system with a specified accuracy, including: providing one or more sensors operably disposed to detect the parameter; obtaining a coarse measurement of the parameter within a first range using the one or more sensors, wherein the first range includes minimum and maximum values for the parameter; obtaining a fine measurement of the parameter within a second range using the one or more sensors, wherein the second range is smaller than the first range and has a specified ratio to the first range that provides the specified accuracy; determining a current value of the parameter by combining the coarse and fine measurements; and providing the current value of the parameter to a communications interface, a storage device, a display, a control panel, a processor, a programmable logic controller, or an external device.

An optical interferometric range sensor includes a light source that emits light with a changing wavelength, a light splitter that splits the light emitted from the light source into a plurality of beams to be incident on a plurality of spots, an interferometer that generates, for each of the plurality of beams of the split light incident on a corresponding spot of the plurality of spots, interference light based on measurement light and reference light, a light receiver that receives the interference light to convert the interference light to an electric signal, a processor that calculates a distance from a sensor head to a measurement target based on the electric signal, an identifier that identifies the sensor head based on a beat signal generated by the interferometer, and a light adjuster that adjusts an amount of light to be incident on the measurement target based on the sensor head.

An optical interferometric range sensor includes a light source that emits light with a changing wavelength, an interferometer that receives the light emitted from the light source and generates interference light based on measurement light emitted from a sensor head to a measurement target and reflected from the measurement target and reference light traveling on an optical path at least partially different from an optical path of the measurement light, a light receiver that receives the interference light from the interferometer to convert the interference light to an electric signal, a processor that calculates a distance from the sensor head to the measurement target based on the electric signal resulting from conversion performed by the light receiver, an identifier that identifies the sensor head based on a beat signal generated by the interferometer, and a setter that sets a measurement condition corresponding to the sensor head identified by the identifier.

The present disclosure provides an image processing method, an image processing apparatus, a computer readable storage medium, and an electronic device. The method includes: in response to detecting that a camera component is turned on, controlling the camera component to collect a speckle image, the speckle image being an image formed by illuminating an object with laser speckles; detecting a target temperature of the camera component, and acquiring a corresponding reference image based on the target temperature, the reference image being an image with reference depth information and collected when calibrating the camera component; and calculating based on the speckle image and the reference image to acquire a depth image.

A coordinate measuring machine for measuring coordinates or properties of a workpiece includes an extended stylus. The extended stylus includes an extension element and a connection element. The extension element includes a carrier portion mounted at the connection element so as to be rotatable about an axis of rotation. The extension element includes, on a side remote from the connection element, a shaft portion that is aligned so as to deviate from the axis of rotation. The coordinate measuring machine includes a measurement head to which the extended stylus is attached. The measurement head is configured to measure deflections of the stylus resulting from contacts of the extended stylus to the workpiece.

Three-dimensional (3D) measurement systems and methods are provided. The systems and methods include a 3D imager and a marker. The marker includes an adapter and a marker element, wherein the adapter is arranged to be at least one of installed, placed, and attached to a fixed object of a scanned environment and the marker element includes a coded identifier that is detectable by the 3D imager, wherein the coded identifier identifies the specific location of the fixed object within the scanned environment.