A device for detecting a layer thickness of a coated component, particularly a brake disc for a disc brake of a motor vehicle, includes at least one holding device and a guiding device. The holding device has a bearing surface for the component. The guiding device is configured to hold and guide a sensor in order to measure the layer thickness. The sensor is configured to be moved by the guiding device along a vertical axis and pivot about a first axis of rotation that is oriented horizontally. The sensor is further configured to be moved by the guiding device along a horizontal axis.

A method can include identifying an inspected object with an inspection device; viewing the inspected object through an augmented reality device to identify points; and measuring a thickness of a layer at the inspection points. In response to detecting a region of interest on the surface of the inspected object, an image of the region of interest can be taken. By operation of communication circuits, at least the thickness measurements and images can be transmitted to a server system. A value of the inspected object can be adjusted based on at least the thickness measurements and images from the at least one inspection device. Corresponding devices and systems are also disclosed.

A method for predetermining a thickness of a coating which is to be arranged on a substrate is provided. A spray spot is arranged on a surface of the substrate or a test substrate. The volume of the spray spot is determined, and based on the determined volume, the thickness of a layer which is to be applied is worked out. An arrangement for predetermining the thickness of a coating is further provided.

Disclosed herein is a gauge for slurry coating thickness determination. The gauge includes a body and at least three probes extending from the body. The at least three probes provide a go-no-go indicator including a first demarcation that defines a minimum slurry coating thickness and a second demarcation that defines a maximum slurry coating thickness. A minimum no-go region is defined between the first demarcation and a probe tip, a maximum no-go region is defined between the second demarcation and the body, and a go region is defined between the first demarcation and the second demarcation.

A method of evaluating a thickness of a film on a substrate includes detecting atomic force responses of the film to exposure of electromagnetic radiation in the infrared portion of the electromagnetic spectrum. The use of atomic force microscopy to evaluate thicknesses of thin films avoids underlayer noise commonly encountered when optical metrology techniques are utilized to evaluate film thicknesses. Such underlayer noise adversely impacts the accuracy of the thickness evaluation.

A device measures a frictional force and a film thickness of a lubricating oil film in different surface velocity directions. The device includes an experiment bench. A translation stage is mounted to the experiment bench, and is linearly movable. A main shaft system is mounted to the experiment bench. A glass disc is mounted to the main shaft system and is rotatable. An arcuate guide rail is disposed on the translation stage. A rotary base is mounted to the arcuate guide rail and is movable along the arcuate guide rail. A loading system is mounted to the rotary base. A steel ball of the loading system and the glass disc are movable relative to each other. A rotary bearing in the rotary base is configured to convert a frictional force generated from the relative movement to a pressure allowed to be collected by a pressure sensor on the rotary base.

A method of testing the hiding power of a coating using a plurality of black-and-white hiding testing materials each having a black-and-white pattern includes: applying the coating to the plurality of black-and-white hiding testing materials without the applied coating in which the number of times of the coating is changed stepwise depending on the black-and-white hiding testing materials so as to achieve target film thickness values differing stepwise; curing the coating applied to the plurality of black-and-white hiding testing materials; evaluating the black-and-white hiding power of the coating by comparing the plurality of black-and-white hiding testing materials with each other obtained by the curing.

An apparatus for shrouding the coated field joint area of connected line pipe segments, the shroud having first and second housing halves which have end walls which cooperate to form registering openings matching the diameter of the pipe to be shrouded, the housing halves forming a chamber. The housing can be of a clamshell design, being hinged on one side and having hasps, latches or the like on the other side to keep the shroud positioned once it is placed around the coated field joint area of a pipeline. An environment monitor is disposed in the chamber to measure conditions such as relative humidity and temperature.

A device measures a frictional force and a film thickness of a lubricating oil film in different surface velocity directions. The device includes an experiment bench. A translation stage is mounted to the experiment bench, and is linearly movable. A main shaft system is mounted to the experiment bench. A glass disc is mounted to the main shaft system and is rotatable. An arcuate guide rail is disposed on the translation stage. A rotary base is mounted to the arcuate guide rail and is movable along the arcuate guide rail. A loading system is mounted to the rotary base. A steel ball of the loading system and the glass disc are movable relative to each other. A rotary bearing in the rotary base is configured to convert a frictional force generated from the relative movement to a pressure allowed to be collected by a pressure sensor on the rotary base.

A method of evaluating a thickness of a film on a substrate includes detecting atomic force responses of the film to exposure of electromagnetic radiation in the infrared portion of the electromagnetic spectrum. The use of atomic force microscopy to evaluate thicknesses of thin films avoids underlayer noise commonly encountered when optical metrology techniques are utilized to evaluate film thicknesses. Such underlayer noise adversely impacts the accuracy of the thickness evaluation.