Patent classifications
G01B5/28
MEASUREMENT DEVICE
A measurement device includes: a probe part including a probe configured to measure a surface of an object to be measured and is attached so as to swing around a swing center according to a shape of the surface of the object to be measured; a scale configured to measure displacement by swinging of the probe part; a scale head configured to read a scale mark of the scale; and an arm part to which the probe part is attached, the arm part is attached so as to swing around the swing center integrally with the probe part, and the scale is attached to the arm part. When thermal expansion coefficients of the probe part, the arm part and the scale are α, β and γ respectively, the measurement device satisfies a condition of
MEASUREMENT DEVICE
A measurement device includes: a probe part including a probe configured to measure a surface of an object to be measured and is attached so as to swing around a swing center according to a shape of the surface of the object to be measured; a scale configured to measure displacement by swinging of the probe part; a scale head configured to read a scale mark of the scale; and an arm part to which the probe part is attached, the arm part is attached so as to swing around the swing center integrally with the probe part, and the scale is attached to the arm part. When thermal expansion coefficients of the probe part, the arm part and the scale are α, β and γ respectively, the measurement device satisfies a condition of
Surface texture probe and measurement apparatus with a vibrational membrane
A surface texture probe and a surface texture measurement apparatus with a vibrational membrane are provided. The probe includes a housing and a vibrational membrane, a stylus holder, a vertical guide assembly, a guide adjustment assembly and a stylus. An inner end of the vibrational membrane is attached to an upper end of the stylus holder. An outer end of the vibrational membrane is fixed to a vibrational membrane connection assembly fixedly connected to the housing. The vertical guide assembly is fixed inside the housing and slidably connected to the stylus holder and configured to guide the stylus holder to move in a vertical direction. The stylus is fixed to a lower end of the stylus holder. The guide adjustment assembly is mounted on the vertical guide assembly and configured to adjust a sliding friction force between the vertical guide assembly and the stylus holder.
Surface texture probe and measurement apparatus with a vibrational membrane
A surface texture probe and a surface texture measurement apparatus with a vibrational membrane are provided. The probe includes a housing and a vibrational membrane, a stylus holder, a vertical guide assembly, a guide adjustment assembly and a stylus. An inner end of the vibrational membrane is attached to an upper end of the stylus holder. An outer end of the vibrational membrane is fixed to a vibrational membrane connection assembly fixedly connected to the housing. The vertical guide assembly is fixed inside the housing and slidably connected to the stylus holder and configured to guide the stylus holder to move in a vertical direction. The stylus is fixed to a lower end of the stylus holder. The guide adjustment assembly is mounted on the vertical guide assembly and configured to adjust a sliding friction force between the vertical guide assembly and the stylus holder.
Measurement of surface profiles using unmanned aerial vehicles
Systems, methods, and apparatus for acquiring surface profile information (e.g., depths at multiple points) from limited-access structures and objects using an autonomous or remotely operated flying platform (such as an unmanned aerial vehicle). The systems proposed herein use a profilometer to measure the profile of an area on a surface where visual inspection has indicated that the surface has a potential anomaly. After the system has gathered data representing the surface profile in the area containing the potential anomaly, a determination may be made whether the collected image data indicates that the structure or object should be repaired or may be used as is.
Measurement of surface profiles using unmanned aerial vehicles
Systems, methods, and apparatus for acquiring surface profile information (e.g., depths at multiple points) from limited-access structures and objects using an autonomous or remotely operated flying platform (such as an unmanned aerial vehicle). The systems proposed herein use a profilometer to measure the profile of an area on a surface where visual inspection has indicated that the surface has a potential anomaly. After the system has gathered data representing the surface profile in the area containing the potential anomaly, a determination may be made whether the collected image data indicates that the structure or object should be repaired or may be used as is.
Method for calibrating parameters of surface texture measuring apparatus
A method for calibrating parameters includes a measurement step that obtains measurement data by scanning a defined surface; a correction step that obtains corrected data by correcting the measurement data based on the parameters; a determination step that calculates a roundness of the corrected data and determines whether the calculated roundness is equal to or less than a predetermined value; and an adjustment step that increases or reduces at least one of the parameters when the roundness is determined to be greater than the predetermined value, and the correction step, the determination step, and the adjustment step are repeated until the roundness is determined to be equal to or less than the predetermined value.
MEASURING DEVICE FOR MEASURING UNEVENESS OF A SURFACE OF AN ITEM
The present invention relates to a measuring device for characterising a shape of a surface of an item, such as a wind turbine blade fibre layup, wherein the measuring device comprises: a frame comprising a holding frame, a first set of two or more probes movably held in the holding frame, each probe having a respective probe end for contacting the surface of the item, and electronic sensing means configured to provide for each probe a respective electrical signal representative of a position of the probe relative to the holding frame. A method for calibrating such a device is provided. Further, a method for characterising a shape of a surface of an item is provided.
SURFACE TEXTURE MEASURING MACHINE AND SURFACE TEXTURE JUDGMENT METHOD
A surface texture measuring machine includes: a parameter setting unit configured to set one or more parameters related to a surface texture of a workpiece; a measurement unit configured to calculate a measurement value corresponding to each of the parameters on the basis of displacement measurement data obtainable by scanning a surface of the workpiece or a master workpiece; a judgment value calculation unit configured to calculate a judgment value corresponding to each of the parameters with an assumption that the measurement value of the master workpiece is defined as a reference value and a value having a predetermined ratio relative to the reference value is defined as a tolerance; and a judgment unit configured to compare the measurement value of the workpiece and the judgment value for each of the parameters.
SURFACE TEXTURE MEASURING MACHINE AND SURFACE TEXTURE JUDGMENT METHOD
A surface texture measuring machine includes: a parameter setting unit configured to set one or more parameters related to a surface texture of a workpiece; a measurement unit configured to calculate a measurement value corresponding to each of the parameters on the basis of displacement measurement data obtainable by scanning a surface of the workpiece or a master workpiece; a judgment value calculation unit configured to calculate a judgment value corresponding to each of the parameters with an assumption that the measurement value of the master workpiece is defined as a reference value and a value having a predetermined ratio relative to the reference value is defined as a tolerance; and a judgment unit configured to compare the measurement value of the workpiece and the judgment value for each of the parameters.