A method comprising: measuring a plurality of measurement capacitances using a capacitance measurement device; calculating a plurality of deposition coefficients for the deposition parameter corresponding to each of the plurality of the measurement capacitances, a plurality of exposure coefficients for the exposure parameter corresponding to each of the plurality of the measurement capacitances, and a plurality of etching coefficients for the etching parameter corresponding to each of the plurality of the measurement capacitances; calculating a corrected deposition coefficient for the plurality of the deposition coefficients, a corrected exposure coefficient for the plurality of the exposure coefficients, and a corrected etching coefficient for the plurality of the etching coefficients; and calculating the capacitance based on a capacitance calculation equation including the deposition parameter, the corrected deposition coefficient, the exposure parameter, the corrected exposure coefficient, the etching parameter, and the corrected etching coefficient.

The device for monitoring internal pipe deposit accumulation is a capacitance-based sensor for monitoring changes in thickness of deposits accumulating on an internal surface of a pipe. The device includes a pipe segment having opposed first and second open ends with at least one valve releasably sealing at least one of the first and second open ends. A first electrode, in the form of an electrically conductive cylindrical shell, is mounted on and surrounds a portion of an external surface of the pipe segment. A second electrode, in the form of an electrically conductive rod, is mounted coaxially within an interior of the pipe segment. An electrical power source is electrically connected across the first and second electrodes to form a cylindrical capacitor and changes in capacitance of the cylindrical capacitor are monitored by a controller.

A method may comprise measuring at least one of the conductivity or resistance on a surface of a substrate comprising an antimicrobial system; comparing the measured conductivity or resistance to a reference value; and/or determining a presence or an absence of the antimicrobial system on the surface.

A device for locating studs on a surface such as a wall is disclosed. The device comprises a housing, a plurality of magnets disposed in the housing, a level placed between the plurality of magnets and line lasers in which one line laser is provided at one end of the housing and another line laser is provided at an opposite end of the housing. A flux density of the plurality of magnets is used to determine a location and a distance between the studs on the surface. The level is used to accurately determine the position of the studs. The line lasers are configured to emit laser beams at each side of the housing to label location of successive studs for remainder of the surface based on the distance calculated using the plurality of magnets and the level.

A device for accounting for environmental capacitances caused by an external object when detecting the presence and surface location of an electrically conductive coating on a transparent and/or translucent medium includes: a capacitive sensor that provides multiple capacitances; electronics that are responsive to the capacitances; an excitation source that generates a train of pulses, voltage or current to determine capacitances at the capacitive sensor; a selective indicator; and, a capacitive sensing plate that affects, or is affected by, the pulses, voltage or current from the excitation source.

Provided herein are systems, methods and apparatuses for a thickness measurement device based on a capacitive array.

A method for producing an insulated electric wire includes a step of preparing a conductor having a linear shape; a step of forming an insulating coating so as to cover a surface on an outer peripheral side of the conductor to obtain an insulated electric wire that includes the conductor and the insulating coating covering the conductor; and a step of measuring a first electrostatic capacity between the insulated electric wire and a first electrode disposed outside in a radial direction of the insulated electric wire so as to face an outer peripheral surface of the insulated electric wire while transporting the insulated electric wire in a longitudinal direction of the conductor, and inspecting a formation state of the insulating coating, the formation state including a formation state of a defective portion in the insulating coating, on the basis of a change in the first electrostatic capacity.

Probe systems and methods for calibrating capacitive height sensing measurements. A probe system includes a probe assembly with a probe support body that supports a capacitive displacement sensor that terminates in a sensing tip relative to a substrate and that is configured to generate an uncalibrated capacitive height measurement. A method of utilizing the probe system to generate a calibrated capacitive height measurement includes receiving a height calibration structure architecture; calculating a layer impedance magnitude of each substrate layer of the height calibration structure; and calculating a total layer impedance magnitude of the height calibration structure. The method further includes measuring a measured impedance magnitude and calculating the calibrated capacitive height measurement.

A device and method for detecting a film thickness are provided. The device includes: a common electrode, a detection electrode, a common electrode voltage generating circuit, and a detection electrode signal processing circuit. A detection channel for a film to be detected is formed between a first common surface and a first detection surface. The common electrode voltage generating circuit is configured to generate a voltage on the common electrode, as to induce an effective signal voltage on the detection electrode. The detection electrode signal processing circuit includes: a reset voltage time sequence control circuit, a time sequence control circuit for transferring the effective signal voltage on the detection electrode and a differential amplifier.

A boring apparatus including a drill having a drill bit; a capacitance sensor; and an alarm; wherein the capacitance sensor is electrically connected to the drill bit and detects a change in capacitance associated with a substrate material in proximity to the drill bit.