G01B7/31

WAFER NOTCH POSITIONING DETECTION
20230096018 · 2023-03-30 ·

An optical system may include a light source to provide a beam of light. The optical system may include a reflector to receive and redirect the beam of light. The optical system may include a light gate having an opening to permit the beam of light, from the reflector, to travel through the opening. The optical system may include a light sensor to receive a portion of the beam of light after the beam of light travels through the opening, and convert the portion of the beam of light to a signal. The optical system may include a processing device to determine whether a notch of a wafer is in an allowable position based on the signal.

WAFER NOTCH POSITIONING DETECTION
20230096018 · 2023-03-30 ·

An optical system may include a light source to provide a beam of light. The optical system may include a reflector to receive and redirect the beam of light. The optical system may include a light gate having an opening to permit the beam of light, from the reflector, to travel through the opening. The optical system may include a light sensor to receive a portion of the beam of light after the beam of light travels through the opening, and convert the portion of the beam of light to a signal. The optical system may include a processing device to determine whether a notch of a wafer is in an allowable position based on the signal.

COIL SKEW DETECTION AND CORRECTION TECHNIQUES FOR ELECTRIC-POTENTIAL DRIVEN SHADE, AND/OR ASSOCIATED METHODS

Certain example embodiments relate to electric-potential driven shades usable with insulating glass (IG) units, IG units including such shades, and/or associated methods. In such a unit, a dynamic shade is located between the substrates defining the IG unit, and is movable between retracted and extended positions. The dynamic shade includes on-glass layers including a transparent conductor and an insulator or dielectric film, as well as a shutter. The shutter includes a resilient polymer, a conductor, and optional ink. If shutter coil skew is detected, voltage(s) may be applied one or more areas of the on-glass transparent conductor to compensate for or otherwise attempt to correct the detected coil skew.

COIL SKEW DETECTION AND CORRECTION TECHNIQUES FOR ELECTRIC-POTENTIAL DRIVEN SHADE, AND/OR ASSOCIATED METHODS

Certain example embodiments relate to electric-potential driven shades usable with insulating glass (IG) units, IG units including such shades, and/or associated methods. In such a unit, a dynamic shade is located between the substrates defining the IG unit, and is movable between retracted and extended positions. The dynamic shade includes on-glass layers including a transparent conductor and an insulator or dielectric film, as well as a shutter. The shutter includes a resilient polymer, a conductor, and optional ink. If shutter coil skew is detected, voltage(s) may be applied one or more areas of the on-glass transparent conductor to compensate for or otherwise attempt to correct the detected coil skew.

Angle measuring device and method for operating an angle measuring device

An angle measuring device includes first and second component groups and a bearing. The first component group includes a scale element having a first graduation. The second component group has a first modular unit, including a position sensor, and a second modular unit, including first, second, and third position transducers, and a compensation coupling. The first and second modular units are connected in a torsionally stiff but axially and radially flexible manner. The angle measuring device is operable in first and second modes. In the first mode, the first graduation is scannable by the position sensor to determine a first angular position. In the second mode, the first graduation or a further graduation situated on the scale element is scannable by the position transducers to determine further angular positions. A corrected relative angular position is determinable based on the first angular position and the further angular positions.

Angle measuring device and method for operating an angle measuring device

An angle measuring device includes first and second component groups and a bearing. The first component group includes a scale element having a first graduation. The second component group has a first modular unit, including a position sensor, and a second modular unit, including first, second, and third position transducers, and a compensation coupling. The first and second modular units are connected in a torsionally stiff but axially and radially flexible manner. The angle measuring device is operable in first and second modes. In the first mode, the first graduation is scannable by the position sensor to determine a first angular position. In the second mode, the first graduation or a further graduation situated on the scale element is scannable by the position transducers to determine further angular positions. A corrected relative angular position is determinable based on the first angular position and the further angular positions.

LIFTING SYSTEM
20230085108 · 2023-03-16 · ·

A lifting system for a metallurgical plant including an object with one or more trunnions and a lifting device with one or more lifting hooks for receiving the trunnions, wherein the lifting system further includes a detection system, the detection system includes a receiver, a sensor, a magnet and a transmitter, and wherein the magnet and the sensor are aligned upon correct alignment of at least one lifting hook and one trunnion such that a signal is submitted to the receiver.

LIFTING SYSTEM
20230085108 · 2023-03-16 · ·

A lifting system for a metallurgical plant including an object with one or more trunnions and a lifting device with one or more lifting hooks for receiving the trunnions, wherein the lifting system further includes a detection system, the detection system includes a receiver, a sensor, a magnet and a transmitter, and wherein the magnet and the sensor are aligned upon correct alignment of at least one lifting hook and one trunnion such that a signal is submitted to the receiver.

Method for estimating an angular deviation between the magnetic axis and a reference axis of a magnetic object

A method for estimating an angular deviation between a reference axis of a magnetic object and a magnetic axis co-linear to a magnetic moment of the magnetic object, including: a) positioning the magnetic object facing at least one magnetometer; b) rotating the magnetic object about the reference axis; c) measuring, during the rotating, the magnetic field, using the magnetomenter; and d) estimating the angular deviation from the magnetic field measurements.

Method for estimating an angular deviation between the magnetic axis and a reference axis of a magnetic object

A method for estimating an angular deviation between a reference axis of a magnetic object and a magnetic axis co-linear to a magnetic moment of the magnetic object, including: a) positioning the magnetic object facing at least one magnetometer; b) rotating the magnetic object about the reference axis; c) measuring, during the rotating, the magnetic field, using the magnetomenter; and d) estimating the angular deviation from the magnetic field measurements.