G01B9/02027

Multichannel Optical Receivers
20170363415 · 2017-12-21 ·

Methods and apparatus are presented for multichannel optical coherence tomography. Light from a wavelength tuneable or steppable optical source is separated into one or more sample beams and one or more reference beams, and the one or more sample beams directed onto a sample to form one or more interaction regions. A plurality of returning probe beams are collected and mixed with the one or more reference beams to form an interference pattern comprising a plurality of interferograms having at least two distinct carrier frequencies. The multichannel optical apparatus can be provided with polarisation discrimination by mixing the returning probe beams with two orthogonally polarised reference beams to form one or more interference patterns each comprising a plurality of interferograms having at least two distinct carrier frequencies. In preferred embodiments each interferogram has a distinct carrier frequency, which may be provided by ensuring that each returning probe beam has a distinct propagation angle with respect to a reference beam. Also presented is a means of generating a plurality of beamlets from a sample beam using a nonreciprocal optical splitter configured to split a beam propagating in a forwards direction into a plurality of beamlets, and to transmit without splitting a beam propagating in the reverse direction.

Scan pattern and signal processing for optical coherence tomography

An OCT system for measuring a retina as part of an eye health monitoring and diagnosis system. The OCT system includes an OCT interferometer, where the interferometer comprises a light source or measurement beam and a scanner for moving the beam on the retina of a patient's eye, and a processor configured to execute instructions to cause the scanner to move the measurement beam on the retina in a scan pattern. The scan pattern is a continuous pattern that includes a plurality of lobes. The measurement beam may be caused to move on the retina by the motion of a mirror that intercepts and redirects the measurement beam. The mirror position may be altered by the application of a drive signal to one or more actuators that respond to the drive signal by rotating the mirror about an axis or axes.

Apparatus for detecting a 3D structure of an object
09835435 · 2017-12-05 · ·

Apparatus for detecting a 3D structure of an object, comprising at least three laser emitters and a beam splitter that splits the laser radiation of the laser emitters into a reference radiation and an illumination radiation. The illumination radiation strikes the object to be measured, is reflected by the object as object radiation and interferes with the reference radiation. A detector receives the interference patterns formed from the interference of the reference and object radiation and an analysis unit analyzes the interference patterns. At least two of the laser emitters emit laser radiation in the invisible range and the analysis unit detects the object in three dimensions based on the interference patterns of the invisible laser radiation. At least one of the laser emitters emits colored laser radiation and the analysis unit deduces the object's color based on the intensity of the colored object radiation reflected by the object.

Wavelength encoded multi-beam optical coherence tomography

Optical coherence tomography (OCT) apparatuses and methods include a first electro-magnetic radiation (EMR) source providing EMR to a first optical path associated with a sample and a second optical path associated with a reference. A multi-beam generator unit (MBGU) generates first and second EMR beams having different wavelength contents. A scanning system illuminates the sample with the first and second EMR beams, at a first and second time, at a first and second location. An interference module generates interference signals based on received EMR returning from the reference and the first and second EMR beams returning from the sample. A detector generates detection signals based on received interference signals and a processor generates OCT data based on the processed detection signals. In some embodiments, three EMR beams having different wavelength contents with linearly independent vectors illuminate at least one same location of the sample.

METHOD FOR CALIBRATION OF AN OPTICAL MEASUREMENT SYSTEM AND OPTICAL MEASUREMENT SYSTEM
20230168077 · 2023-06-01 · ·

The invention provides a method for calibration of an optical measurement system, which may be a heterodyne interferometer system, wherein a first optical axis and a second optical axis have a different optical path length, the method comprises: .sup.∘measuring a first measurement value along the first optical axis using a first measurement beam, .sup.∘measuring a second measurement value along the second optical axis using a second measurement beam, .sup.∘changing a wavelength of the first measurement beam and the second measurement beam, .sup.∘measuring a further first measurement value along the first optical axis using the first measurement beam with changed wavelength, measuring a further second measurement value along the second optical axis using the second measurement beam with changed wavelength, .sup.∘determining a cyclic error of the optical measurement system on the basis of the measured values, and .sup.∘storing a corrective value based on the cyclic error.

COMPACT SNAPSHOT DUAL-MODE INTERFEROMETRIC SYSTEM
20230168075 · 2023-06-01 ·

Systems, devices and methods for measuring surface roughness and surface shape of an optical element using a dual-mode interferometer are disclosed. The devices implement optical filters, with a compact form, that allows measurement of both surface characteristics without rearranging the system components. One example interferometric system includes a laser light source and a low coherence light source that alternatively provide light to a collimator, followed by a polarizer, and a polarizing beam splitter. The system further includes two optical filters, a quarter waveplate, two objectives and a reference optical component. Each light source produces a set of interferograms, where one set of interferograms is used to measure the surface shape and another set of interferograms is used to measure the surface roughness of the optical component.

Differential sinusoidal phase modulation laser interferometric nanometer displacement measuring apparatus and method

The disclosure discloses a differential sinusoidal phase modulation laser interferometric nanometer displacement measuring apparatus and method. The beam output from the single-frequency laser is converted into a 45° linearly polarized beam after passing through the polarizer, then projected onto two sets of sinusoidal phase modulation interferometers consisting of the beam splitter, the electro-optic phase modulator, the half wave plate, three pyramid prisms, two polarization beam splitters, thereby forming measurement and reference interference signals which are received by two photodetectors. A high-frequency sinusoidal voltage signal is applied to the electro-optic phase modulator placed in the common reference arm of the two interferometers, thereby modulating the interference signal into a high-frequency AC signal. By detecting the difference between the phase change amounts of the two interference signals when the measured object moves, the measured displacement can be obtained.

Parallel optical coherence tomography apparatuses, systems, and related methods
09782065 · 2017-10-10 · ·

Provided is a snapshot spectral domain optical coherence tomographer comprising a light source providing a plurality of beamlets; a beam splitter, splitting the plurality of beamlets into a reference arm and a sample arm; a first optical system that projects the sample arm onto multiple locations of a sample; a second optical system for collection of a plurality of reflected sample beamlets; a third optical system projecting the reference arm to a reflecting surface and receiving a plurality of reflected reference beamlets; a parallel interferometer that provides a plurality of interferograms from each of the plurality of sample beamlets with each of the plurality of reference beamlets; an optical image mapper configured to spatially separate the plurality of interferograms; a spectrometer configured to disperse each of the interferograms into its respective spectral components and project each interferogram in parallel; and a photodetector providing photon quantification.

SWEPT FREQUENCY PHOTONIC INTEGRATED CIRCUIT FOR ABSOLUTE METROLOGY
20220049945 · 2022-02-17 ·

A digital measuring device implemented on a photonic integrated circuit, the digital measuring device including a tunable laser source implemented on the photonic integrated circuit configured to sweep over a frequency range to provide multi-wavelength light, a first waveguide structure implemented on the photonic integrated circuit configured to direct a first portion of light from the laser source at a moving object and receive light reflected from the moving object, a second waveguide structure implemented on the photonic integrated circuit configured to combine a second portion of light from the laser source with the light reflected from the moving object to produce a measurement beam, and a first detector implemented on the photonic integrated circuit configured to detect intensity values of the measurement beam to measure a distance between the digital measuring device and the moving object.

OPTICAL COHERENCE TOMOGRAPHY IMAGING SYSTEM AND METHOD
20170248405 · 2017-08-31 · ·

An optical imaging system includes an optical radiation source (410, 510), a frequency clock module outputting frequency clock signals (420), an optical interferometer (430), a data acquisition (DAQ) device (440) triggered by the frequency clock signals, and a computer (450) to perform multi-dimensional optical imaging of the samples. The frequency clock signals are processed by software or hardware to produce a record containing frequency-time relationship of the optical radiation source (410, 510) to externally clock the sampling process of the DAQ device (440). The system may employ over-sampling and various digital signal processing methods to improve image quality. The system further includes multiple stages of routers (1418, 1425) connecting the light source (1410) with a plurality of interferometers (1420a-1420n) and a DAQ system (1450) externally clocked by frequency clock signals to perform high-speed multi-channel optical imaging of samples.