The disclosed embodiments relate to multimodal imaging system comprising a fiber-coupled fluorescence imaging system, which operates based on ultra-violet (UV) excitation light, and a fiber-coupled optical coherence tomography (OCT) imaging system. The multimodal imaging system also includes a fiber optic interface comprising a single optical fiber, which facilitates light delivery to a sample-of-interest and collection of returned optical signals for both the fluorescence imaging system and the OCT imaging system. During operation of the system, the single optical fiber carries both UV light and coherent infrared light through two concentric light-guiding regions, thereby facilitating generation of precisely co-registered optical data from the fluorescence imaging system and the OCT imaging system.

Embodiments of systems and methods for measuring a surface topography of a semiconductor chip are disclosed. In an example, a method for measuring a surface topography of a semiconductor chip is disclosed. A plurality of interference signals and a plurality of spectrum signals are received by at least one processor. Each of the interference signals and spectrum signals corresponds to a respective one of a plurality of positions on a surface of the semiconductor chip. The spectrum signals are classified by the at least one processor into a plurality of categories using a model. Each of the categories corresponds to a region having a same material on the surface of the semiconductor chip. A surface height offset between a surface baseline and at least one of the categories is determined by the at least one processor based, at least in part, on a calibration signal associated with the region corresponding to the at least one of the categories. The surface topography of the semiconductor chip is characterized by the at least one processor based, at least in part, on the surface height offset and the interference signals.

Improved optical coherence tomography systems and methods to measure retinal data are presented. The systems may be compact, provide in-home monitoring, and have automation to allow the patient to measure himself or herself.

Exemplary systems, devices, methods, apparatus and computer-accessible media for providing and/or utilizing optical frequency domain imaging (OFDI) and fluorescence of structures and, e.g., multimodality imaging using OFDI techniques and fluorescence imaging techniques are described. For example, an arrangement can provide at least one electro-magnetic radiation to an anatomical structure. Such exemplary arrangement can include at least one optical core and at least one cladding at least partially surrounding the fiber(s). A region between the optical core(s) and the cladding(s) can have an index that is different from indexes of the optical core(s) and the cladding(s). The arrangement can also include at least one apparatus which is configured to transmit the radiation(s) via the optical core(s) and the cladding(s) to the anatomical structure.

Methods and apparatus are provided for imaging a response of a sample to radiative heating. A method in accordance with one embodiment has steps of: illuminating a first area of the sample with a radiative heating beam; illuminating a portion of the first area with a probe beam; collecting light exiting the sample due to interaction of the probe beam with the sample; superimposing the light exiting the sample with a reference beam derived from the probe beam, wherein the reference is characterized by an optical phase relative to the probe beam; detecting a spatial portion of the light exiting the sample and the reference beam with at least one detector to generate an interference signal; and processing the interference signal to obtain an image of the sample associated with absorption of the radiative heating beam.

Systems, methods, and computer readable medium are provided for determining interferometric data and spectral data associated with combustion conditions of a flame in a combustion chamber using a sensor head including a first vacuum cavity, a diaphragm operatively interfaced to an inner portion of the combustion chamber, and an optical sensor interrogator configured on a computing device and coupled to the sensor head via optical fibers. The optical sensor interrogator including an interferometer configured to determine interferometric data associated with the flame based on light transmitted and reflected via a first optical fiber and a spectrometer configured to determine spectral data associated with the flame based on light transmitted via a second optical fiber.

Systems and methods for measuring a surface topography of a semiconductor chip are disclosed. A disclosed system comprises a light source configured to provide low coherent light to a first beam splitter, a scanner configured to use the low coherent light reflected from the first beam splitter to scan positions on a surface of a semiconductor chip, a second beam splitter configured to receive reflected signals from the positions on the surface of the semiconductor chip, a detector configured to detect interference signals from a first output of the second beam splitter, wherein each of the interference signals corresponds to a respective one of the positions, and a spectrometer configured to detect spectrum signals from a second output of the second beam splitter, wherein each of the spectrum signals corresponds to the respective one of the positions.

The present disclosure relates to a tracking system for tracking the position and orientation of an object in an environment, the tracking system including: (a) a tracking base positioned in the environment; (b) a tracking target mountable to the object, wherein in use the tracking base is linked to the tracking target by: (i) a bidirectional light beam transmitted therebetween; and, (ii) a unidirectional light beam transmitted therebetween, said unidirectional light beam parallel to the bidirectional light beam; and, (c) at least one controller configured to determine a roll angle of the tracking target relative to the tracking base, the roll angle determined at least in part by signals received from a sensor housed in at least one of the tracking base and the tracking target that detects the unidirectional light beam.

Apparatus for detecting a 3D structure of an object, comprising at least three laser emitters and a beam splitter that splits the laser radiation of the laser emitters into a reference radiation and an illumination radiation. The illumination radiation strikes the object to be measured, is reflected by the object as object radiation and interferes with the reference radiation. A detector receives the interference patterns formed from the interference of the reference and object radiation and an analysis unit analyzes the interference patterns. At least two of the laser emitters emit laser radiation in the invisible range and the analysis unit detects the object in three dimensions based on the interference patterns of the invisible laser radiation. At least one of the laser emitters emits colored laser radiation and the analysis unit deduces the object's color based on the intensity of the colored object radiation reflected by the object.

Embodiments of systems and methods for measuring a surface topography of a semiconductor chip are disclosed. In an example, a method for measuring a surface topography of a semiconductor chip is disclosed. A plurality of interference signals each corresponding to a respective one of a plurality of positions on a surface of the semiconductor chip are received by at least one processor. The plurality of interference signals are transformed by the at least one processor into a plurality of spectrum signals each corresponding to the respective one of the positions on the surface of the semiconductor chip. The spectrum signals are classified by the at least one processor into a plurality of categories using a model. Each of the categories corresponds to a region having a same material on the surface of the semiconductor chip. A surface height offset between a surface baseline and at least one of the categories is determined by the at least one processor based, at least in part, on a calibration signal associated with the region corresponding to the at least one of the categories. The surface topography of the semiconductor chip is characterized by the at least one processor based, at least in part, on the surface height offset and the interference signals.