Even when series data is acquired under an acquisition condition in which a part of valid components is not included, significant information is acquired from the series data highly accurately. A signal-processing device 600 of the present invention includes: a data acquisition unit 601 that acquires series data or data included therein; and a data-processing unit 602 that generates variable band data that is data related to a bandwidth of a variable band expressed by a predetermined constant multiple in a positive/negative direction of a variability parameter that is a parameter acquired by application of a time window of a predetermined time length to target series data, which is the acquired series data or series data including the acquired data, after a removal of a moving average and that is a parameter indicating variability of the target series data in the time window.

The present invention provides an automatic deviation correction control method for a hoisting system, comprising the following steps: obtaining a lateral displacement X and an advancing included angle α generated by the deflection of the hoisting system; when the lateral displacement X is not 0 and the advancing included angle α is not 0, determining whether the lateral displacement X and the advancing included angle α satisfy a preset condition; if the lateral displacement X and the advancing included angle α do not satisfy the preset condition, controlling the hoisting system to correct the deviation toward a center line; and if the lateral displacement X and the advancing included angle α satisfy the preset condition, controlling the hoisting system to correct the deviation toward the center line in a reverse direction.

A device and method are provided for determining whether a laminate is bonded or debonded from its substrate. The device and method provide simple, accurate, rapid, cost-effective, and reliable means for assessing the bonding state of a laminated substrate.

A device and method are provided for determining whether a laminate is bonded or debonded from its substrate. The device and method provide simple, accurate, rapid, cost-effective, and reliable means for assessing the bonding state of a laminated substrate.

A system and method model a time series from missing data by imputing missing values, denoising measured but noisy values, and forecasting future values of a single time series. A time series of potentially noisy, partially-measured values of a physical process is represented as a non-overlapping matrix. For several classes of common model functions, it can be proved that the resulting matrix has a low rank or approximately low rank, allowing a matrix estimation technique, for example singular value thresholding, to be efficiently applied. Applying such a technique produces a mean matrix that estimates latent values, of the physical process at times or intervals corresponding to measurements, with less error than previously known methods. These latent values have been denoised (if noisy) and imputed (if missing). Linear regression of the estimated latent values permits forecasting with an error that decreases as more measurements are made.

A system and method model a time series from missing data by imputing missing values, denoising measured but noisy values, and forecasting future values of a single time series. A time series of potentially noisy, partially-measured values of a physical process is represented as a non-overlapping matrix. For several classes of common model functions, it can be proved that the resulting matrix has a low rank or approximately low rank, allowing a matrix estimation technique, for example singular value thresholding, to be efficiently applied. Applying such a technique produces a mean matrix that estimates latent values, of the physical process at times or intervals corresponding to measurements, with less error than previously known methods. These latent values have been denoised (if noisy) and imputed (if missing). Linear regression of the estimated latent values permits forecasting with an error that decreases as more measurements are made.

There are described a method, apparatus, and kit for validating an upgrade to a data acquisition system (DAS). The method comprises acquiring measurement data from a composite part using an upgraded DAS, the composite part representing a family of parts and having features from different parts of the family of parts incorporated thereon; comparing the measurement data to reference data defining tolerances for the measurement data; and validating the upgrade to the DAS based on the comparing of the measurement data to the reference data.

There are described a method, apparatus, and kit for validating an upgrade to a data acquisition system (DAS). The method comprises acquiring measurement data from a composite part using an upgraded DAS, the composite part representing a family of parts and having features from different parts of the family of parts incorporated thereon; comparing the measurement data to reference data defining tolerances for the measurement data; and validating the upgrade to the DAS based on the comparing of the measurement data to the reference data.

A method for offset calibration of a rotation rate sensor signal of a rotation rate sensor. In a first step, an ascertainment is made that the rotation rate sensor is in an idle state. In a second step, after the first step, a filter parameter is determined as a function of the measured rotation rate sensor values, measured in the idle state, of the rotation rate sensor. In a third step, after the second step, a filtered measured rotation rate sensor value is determined with the aid of the filter parameter. An offset is determined with the aid of the filtered measured rotation rate sensor value.

A method for offset calibration of a rotation rate sensor signal of a rotation rate sensor. In a first step, an ascertainment is made that the rotation rate sensor is in an idle state. In a second step, after the first step, a filter parameter is determined as a function of the measured rotation rate sensor values, measured in the idle state, of the rotation rate sensor. In a third step, after the second step, a filtered measured rotation rate sensor value is determined with the aid of the filter parameter. An offset is determined with the aid of the filtered measured rotation rate sensor value.