A method for quantifying an exposure dose for a surface is disclosed. The method may include emitting one or more beams of 222 nm light onto a portion of the surface using one or more far ultraviolet (UV) light sources capable of emitting 222 nm light, the portion of the surface being coated with one or more fluorescent coatings. The method may include capturing images of the portion of the surface. The method may include adjusting one or more image characteristics for the captured images using one or more filtering methods. The method may include generating a histogram of the adjusted images based on the one or more filtering methods. The method may include determining a pixel surface area for the generated histogram. The method may include calculating the exposure dose for the surface based on the generated pixel surface area and a predetermined calibration curve.

A method for quantifying an exposure dose for a surface is disclosed. The method may include emitting one or more beams of 222 nm light onto a portion of the surface using one or more far ultraviolet (UV) light sources capable of emitting 222 nm light, the portion of the surface being coated with one or more fluorescent coatings. The method may include capturing images of the portion of the surface. The method may include adjusting one or more image characteristics for the captured images using one or more filtering methods. The method may include generating a histogram of the adjusted images based on the one or more filtering methods. The method may include determining a pixel surface area for the generated histogram. The method may include calculating the exposure dose for the surface based on the generated pixel surface area and a predetermined calibration curve.

Provided are an image analysis method, an image analysis device, a program, and a recording medium capable of more easily eliminating an influence of an illuminance distribution in a case where an object is imaged.

The embodiment of the present invention acquires first image data obtained by imaging an object, which develops color according to an amount of external energy in a case where the external energy is applied, with a first sensitivity, acquires second image data obtained by imaging the object with a second sensitivity different from the first sensitivity, calculates a ratio of an image signal value indicated by the first image data with respect to an image signal value indicated by the second image data, and estimates the amount of the external energy applied to the object, based on a correspondence relationship between the amount of the external energy and the ratio, and a calculation result of the ratio in a calculation step.

The present disclosure relates to a driving assistance system, includes: a light detection and ranging module configured to detect position parameters of objects around the light detection and ranging module; a LiFi driving module connected to the light detection and ranging module and being capable of receiving the position parameters and modulating the position parameters to generate a LiFi signal; and a lighting module connected to the LiFi driving module, and configured to provide lighting and transmit the LiFi signal.

The present disclosure relates to a driving assistance system, includes: a light detection and ranging module configured to detect position parameters of objects around the light detection and ranging module; a LiFi driving module connected to the light detection and ranging module and being capable of receiving the position parameters and modulating the position parameters to generate a LiFi signal; and a lighting module connected to the LiFi driving module, and configured to provide lighting and transmit the LiFi signal.

A wavelength checker includes an optical waveguide chip. A known arrayed-waveguide diffraction grating is formed on the optical waveguide chip. The wavelength checker includes a light conversion unit made of a conversion material that converts infrared light into visible light. The light conversion unit is arranged on an output side of a plurality of first output waveguides of the optical waveguide chip to be capable of receiving light emitted from the plurality of first output waveguides. The light conversion unit is formed on a side surface of a support facing an output end surface of the optical waveguide chip. The support is fixed to a main board.

A measurement method includes: (a) measuring an emission intensity for each wavelength of light detected from a plasma generated in a plasma processing apparatus at each different exposure time by a light receiving element; (b) specifying, with respect to each of a plurality of different individual wavelength ranges that constitutes a predetermined wavelength range, a distribution of the emission intensity in the individual wavelength range measured at an exposure time at which an emission intensity of a predetermined wavelength included in the individual wavelength range becomes an emission intensity within a predetermined range; (c) selecting a distribution of the emission intensity in the individual wavelength range from the distribution of the emission intensity specified in (b); and (d) outputting the distribution of the emission intensity selected for each individual wavelength range.

A measurement method includes: (a) measuring an emission intensity for each wavelength of light detected from a plasma generated in a plasma processing apparatus at each different exposure time by a light receiving element; (b) specifying, with respect to each of a plurality of different individual wavelength ranges that constitutes a predetermined wavelength range, a distribution of the emission intensity in the individual wavelength range measured at an exposure time at which an emission intensity of a predetermined wavelength included in the individual wavelength range becomes an emission intensity within a predetermined range; (c) selecting a distribution of the emission intensity in the individual wavelength range from the distribution of the emission intensity specified in (b); and (d) outputting the distribution of the emission intensity selected for each individual wavelength range.

There is provided a fiber optic temperature probe having a base, a first tube connected to the base, a second tube provided coaxially within the first tube, a probe tip extending through an opening in a distal end of the first tube; and an optical fiber extending from within the base through an opening in the proximal end of the first tube and being substantially coaxial with respect to the first tube. There is also provided a fiber optic temperature probe having a base, a first tube connected to the base, a probe tip extending through an opening in a distal end of the first tube, an optical fiber extending from within the base through an opening in the proximal end of the first tube and being substantially coaxial with respect to the first tube, and a first lens positioned between the probe tip and the optical fiber.

An optical system (150) is disclosed and includes an optical sensor (154), a plurality of photosensitive pixels (178) disposed on the optical sensor, a wavelength-selective optical filter (158) in optical communication with the photosensitive pixels, the wavelength-selective optical filter being disposed remotely from the optical sensor, and a plurality of spatially-variant areas (220, 224, 228, 232) disposed in the optical filter, at least one area of the plurality of spatially-variant areas including a downconverter (400, 500).