A hyperspectral imager (HSI) includes a first thin film filter, the first thin film filter including a first quarter wave mirror, a second quarter wave mirror, and a low-refractive-index wedge between the first quarter wave mirror and the second quarter wave mirror. The low-refractive-index wedge has a height dimension such that a distance between the first quarter wave mirror and the second quarter wave mirror increases linearly along a length of the low-refractive-index wedge.

A hyperspectral camera based on a continuously variable film filter and a coating method thereof can solve interference between partial bands of the hyperspectral camera based on the continuously variable film filter. The hyperspectral camera includes: a camera body and a detector chip, wherein a continuously variable film is coated on the detector chip; a semi-transmission half-cut filter is provided in front of the continuously variable film, and a distance between the semi-transmission half-cut filter and the continuously variable film is 0 mm. According to the present invention, the semi-transparent half-cut filter and the detector chip are integrated without any gap therebetween. As a result, optical interference caused by incident light sequentially passing through the semi-transparent half-cut filter and the detector chip is greatly reduced, which can reduce distortion of spectral signals, and finally satisfy wide-band application requirements which can be truly realized based on such technology.

An optical filter includes an active filter region including at least one of a spectral filter and a polarizing filter; and a reference filter region configured to sense an amount of light passing through the active filter region, wherein the reference filter region includes a gray filter and at least one of a black filter and a transparent filter, wherein the gray filter has a transmittance that is higher than a transmittance of the black filter and lower than a transmittance of the transparent filter.

An optical device may include an optical filter disposed over a first surface of one or more substrates. The optical filter may include an aperture and may be configured to pass light that is received via the aperture and that is associated with one or more wavelength ranges via the one or more substrates based on an angle of incidence of the light on the optical filter. The optical device may include one or more optical elements disposed over a second surface of the one or more substrates that are configured to direct light beams of the light that are associated with a particular wavelength range, of the one or more wavelength ranges, to a particular set of sensor elements of an optical sensor. The optical filter may include a thin film optical interference filter and the one or more optical elements may include one or more metamaterial structures.

An optical device may include an optical filter disposed over a first surface of one or more substrates. The optical filter may include an aperture and may be configured to pass light that is received via the aperture and that is associated with one or more wavelength ranges via the one or more substrates based on an angle of incidence of the light on the optical filter. The optical device may include one or more optical elements disposed over a second surface of the one or more substrates that are configured to direct light beams of the light that are associated with a particular wavelength range, of the one or more wavelength ranges, to a particular set of sensor elements of an optical sensor. The optical filter may include a thin film optical interference filter and the one or more optical elements may include one or more metamaterial structures.

An optical device may include an optical filter disposed over a first surface of one or more substrates. The optical filter may include an aperture and may be configured to pass light that is received via the aperture and that is associated with one or more wavelength ranges via the one or more substrates based on an angle of incidence of the light on the optical filter. The optical device may include one or more optical elements disposed over a second surface of the one or more substrates that are configured to direct light beams of the light that are associated with a particular wavelength range, of the one or more wavelength ranges, to a particular set of sensor elements of an optical sensor. The optical filter may include a thin film optical interference filter and the one or more optical elements may include one or more metamaterial structures.

The purpose is to reduce the influence on the measurement due to high order diffracted light without arranging a filter for removing high order diffracted light between a diffraction grating and a PDA. The correction method includes a correction coefficient determination step of determining a correction coefficient related to a ratio of a portion of a detection signal value to the detection signal value, the portion of the detection signal value being derived from a second order diffracted light of light in the first wavelength range contained in the detection signal value of a long wavelength side photodiode for detecting light in the second wavelength range in the photodiode array, and a correction unit configured to obtain a corrected detection signal value derived from light in the second wavelength range from a different detection signal value of the long wavelength side photodiode by using the correction coefficient determined by the correction coefficient determination step.

A hyperspectral camera based on a continuously variable film filter and a coating method thereof can solve interference between partial bands of the hyperspectral camera based on the continuously variable film filter. The hyperspectral camera includes: a camera body and a detector chip, wherein a continuously variable film is coated on the detector chip; a semi-transmission half-cut filter is provided in front of the continuously variable film, and a distance between the semi-transmission half-cut filter and the continuously variable film is 0 mm. According to the present invention, the semi-transparent half-cut filter and the detector chip are integrated without any gap therebetween. As a result, optical interference caused by incident light sequentially passing through the semi-transparent half-cut filter and the detector chip is greatly reduced, which can reduce distortion of spectral signals, and finally satisfy wide-band application requirements which can be truly realized based on such technology.

A Fabry-Perot cavity array and a spectrum detector, where the Fabry-Perot cavity array includes a first element having a first step and a second element having a second step, the first step and the second step are a two-dimensional step structure; a first step side of the first element is arranged opposite to a second step side of the second element, and a step height change direction of the first step is different from a step height change direction of the second step; a step surface of the first step and a step surface of the second step are plated with a reflective film. By fitting two elements having a two-dimensional step structure, a Fabry-Perot cavity array having a three-dimensional step structure is formed, and it is simple in structure and easy to be processed and implemented.

The purpose is to reduce the influence on the measurement due to high order diffracted light without arranging a filter for removing high order diffracted light between a diffraction grating and a PDA. The correction method includes a correction coefficient determination step of determining a correction coefficient on a rate of a detection signal value derived from a second order diffracted light of light in the first wavelength range contained in a detection signal value of a long wavelength side photodiode for detecting light in the second wavelength range in the photodiode array, and a correction unit configured to obtain a detection signal value derived from light in the second wavelength range from a detection signal value of the long wavelength side photodiode by using the correction coefficient determined by the correction coefficient determination step.