A method of calibrating a driving parameter of an optical component across an operating wavelength range of the component. The method comprises placing a layer of material in a light path, the layer of material being substantially planar and substantially transparent and having a thickness of the order of wavelengths in said range and operating said component to vary said driving parameter whilst detecting light transmitted through said layer of material to obtain driving parameter versus light intensity data. The obtained data is then compared with characterizing data previously derived for said layer of material in order to calibrate said driving parameter.

A temperature compensation method for wavelength monitoring using spectrometers on photonic integrated chips and a related temperature-compensated wavelength monitoring device include an optical filter of the chip filters a source signal to provide at least one spectral reference line to a first spectrometer to detect thermal wavelength drifts thereof. At least one spectral line to be monitored is received by the same or another spectrometer of the chip to detect wavelength shifts thereof. The detected thermal drift of the reference line is compared to calibrated thermal drifts for the reference line which is associated with a calibrated thermal drift for the spectral response curve of the spectrometer receiving the spectral line to be monitored. A thermal drift rate for the response curve of the optical filter differs from a thermal drift rate for the response curve of the first spectrometer at least by an amount.

Systems and methods are provided for a UV-VIS spectrophotometer, such as a UV-VIS detector unit included in a high-performance liquid chromatography system. In one example, a system for the UV-VIS detector unit may include a first light source, a signal detector, a flow path positioned intermediate the first light source and the signal detector, a second light source, and a reference detector. The first light source, the signal detector, and the flow path may be aligned along a first axis, and the second light source and the reference detector may be aligned along a second axis, different than the first axis.

Systems and methods are provided for a UV-VIS spectrophotometer, such as a UV-VIS detector unit included in a high-performance liquid chromatography system. In one example, a system for the UV-VIS detector unit may include a first light source, a signal detector, a flow path positioned intermediate the first light source and the signal detector, a second light source, and a reference detector. The first light source, the signal detector, and the flow path may be aligned along a first axis, and the second light source and the reference detector may be aligned along a second axis, different than the first axis.

An intensity distribution acquirer acquires a first detected intensity distribution detected by a detector with a sample position at which a sample is not present irradiated with light by a standard light source, and acquires a second detected intensity distribution detected by the detector with the sample position at which a sample is not present irradiated with light by an irradiation light source during a first measuring work. An irradiation intensity calculator calculates a radiation intensity at each wavelength of irradiation light of the irradiation light source based on the first detected intensity distribution, the second detected intensity distribution and radiation characteristics of the standard light source. An irradiation photon count calculator calculates an irradiation photon count at each wavelength of irradiation light of the irradiation light source based on an irradiation intensity at each wavelength.

Methods and assemblies may be used for determining and using standardized spectral responses for calibration of spectroscopic analyzers. The methods and assemblies may be used to calibrate or recalibrate a spectroscopic analyzer when the spectroscopic analyzer changes from a first state to a second state, the second state being defined as a period of time after a change to the spectroscopic analyzer causing a need to calibrate or recalibrate the spectroscopic analyzer. The calibration or recalibration may result in the spectroscopic analyzer outputting a standardized spectrum, such that the spectroscopic analyzer outputs a corrected material spectrum for an analyzed material, and defining the standardized spectrum. The corrected material spectrum may include signals indicative of material properties of an analyzed material, the material properties of the material being substantially consistent with material properties of the material output by the spectroscopic analyzer in the first state.

A self-calibrating spectrometer that captures a sample spectrum image of a sample via a light dispersion device and a calibration spectrum image of a calibration light source having a known spectrum (e.g., in the same image frame using a bifurcated fiber optic cable). Spectral data is extracted from the sample spectrum image and wavelength calibrated by matching calibration spectral data extracted from the calibration spectrum image to the known spectrum of the calibration light source, mapping each pixel position of the calibration spectrum image to a wavelength of the known spectrum of the calibration light source, and mapping each pixel position of the sample spectral data to a wavelength based on the pixel position-to-wavelength mapping. In some embodiments, extracted features from the wavelength calibrated spectral data are used by classification module, trained on a dataset of features extracted from spectral data of known samples, to classify the sample.

Spectrophotometer system configured to characterize and/or measure spectrally (wavelength)-dependent properties of material components (such as molecular, viral, and/or bacterial analytes) associated with or of an object prior to the time when optical fingerprints of such material components start to degrade, and associated methods. System can be enhanced by a capability of selecting specific wavelengths of operation for such system to optimize cost-efficiency of the system.

The invention relates to a method for compensation for different sensitivities at different wavelengths in a spectrometric measuring system, including steps of calibrating the measuring system in a wavelength range with respect to one or more known reference standards, creating a wavelength-dependent compensation algorithm for linearization, and adjusting the measuring system using the compensation algorithm. The invention further discloses a corresponding measuring system.

A computer-implemented method to improve the accuracy of a calculation of a biomarker value from a spectral measurement. The computer-implemented method comprises receiving a primary spectral measurement from a primary detector, receiving, a secondary measurement from a secondary detector, and calculating a value of the biomarker using a biomarker algorithm. The biomarker algorithm takes an input from the primary spectral measurement and a calibration parameter from the secondary measurement.