G01J2009/0253

INTERFEROMETER WITH AT LEAST ONE DISPERSIVE ELEMENT
20220326086 · 2022-10-13 ·

An interferometer for use in remote sensing systems includes a beam splitter that separates an input wave into a reflected wave, which travels along a first optical path within an upper interferometer arm, and a transmitted wave, which travels along a second optical path within a lower interferometer arm. The reflected and transmitted waves are subsequently recombined by the beam splitter for imaging onto a sensor. A highly dispersive element is incorporated into at least one of the pair of interferometer arms. Due to anomalous dispersion, a frequency shift in a wave transmitted through a dispersive element changes the optical path length within its corresponding arm. As a result, the recombined wave produces an interference pattern with a measurable phase change that can be utilized to calculate the original frequency shift in the input wave with great precision and potential sub-Hertz sensitivity.

LASER INTERFEROMETER
20220276098 · 2022-09-01 ·

A laser interferometer includes a light source configured to emit first laser light, an optical modulator including a vibrator and configured to modulate, by the vibrator, the first laser light into second laser light having a different frequency, an optical path switching unit disposed in a first optical path through which the first laser light travels and configured to switch a direction of travel of the first laser light between the first optical path and a second optical path different from the first optical path, a reflector including a light-reflecting surface configured to move along the second optical path and reflect the first laser light traveling through the second optical path, and a photoreceptor configured to receive first interference light of the second laser light and third laser light generated by reflection of the first laser light on an object to be measured, and second interference light of the second laser light and fourth laser light generated by reflection of the first laser light on the light-reflecting surface and output a light-receiving signal.

Coherent light detection system and method
11047742 · 2021-06-29 · ·

A method for detecting coherent light that includes configuring a spatial interferometer, receiving the coherent light through the spatial interferometer, and disposing a photo detector adjacent to the spatial interferometer. The spatial interferometer is configured such that a coherent light passing through the spatial interferometer interferes with itself. The interference of the coherent light with itself creates a light fringe. The light fringe projects onto the photo detector. The photo detector has an array of pixels operable to detect an intensity of coherent light. The array of pixels provides a plurality of outputs corresponding to coherent light received by discrete pixels of the array of pixels. The method includes determining an interference pattern of the light fringe based on the plurality of outputs of the array of pixels, and determining one or more wavelengths of the coherent light from the interference pattern.

Method and device for analysing an electromagnetic wave in high definition
11029214 · 2021-06-08 · ·

The present invention relates to a method comprising reception of an incident electromagnetic wave (9) by a diffractive element (2) and conversion of this incident electromagnetic wave (9) into a diffracted electromagnetic wave (10) by the diffractive element (2); reception of the diffracted electromagnetic wave (10) by a matrix-array sensor (4) comprising a matrix-array of pixels that are aligned along one or two axes of pixel alignment (13, 14). The method comprises a plurality of acquisitions, by the matrix-array sensor (4), of a signal of the diffracted electromagnetic wave (10) corresponding to a plurality of relative positions between the diffractive element (2) and the matrix-array sensor (4). The invention also relates to a device (1) implementing this method.

COHERENT LIGHT DETECTION SYSTEM AND METHOD
20210148764 · 2021-05-20 ·

A method for detecting coherent light that includes configuring a spatial interferometer, receiving the coherent light through the spatial interferometer, and disposing a photo detector adjacent to the spatial interferometer. The spatial interferometer is configured such that a coherent light passing through the spatial interferometer interferes with itself. The interference of the coherent light with itself creates a light fringe. The light fringe projects onto the photo detector. The photo detector has an array of pixels operable to detect an intensity of coherent light. The array of pixels provides a plurality of outputs corresponding to coherent light received by discrete pixels of the array of pixels. The method includes determining an interference pattern of the light fringe based on the plurality of outputs of the array of pixels, and determining one or more wavelengths of the coherent light from the interference pattern.

Wavelength shifting in spectrally-controlled interferometry
10816408 · 2020-10-27 · ·

A light source capable of spectral modulation is modulated conventionally to produce a correlogram at the test surface position of an SCI interferometer. The mean wavelength of the light source is changed to obtain multiple corresponding phase-shifted correlograms that can be processed by applying conventional multiple-wavelength interferometric analysis to determine physical attributes of the test surface. One simple way to achieve this result is by splitting the light beam produced by the source into at least three simultaneous beams passed through filters with corresponding different mean-wavelength transmission bands. Because the correlograms are produced simultaneously, they can be used to practice instantaneous phase-shifting interferometry using conventional analysis algorithms.

Radius-of-curvature measurement by spectrally-controlled interferometry
10746537 · 2020-08-18 · ·

The ROC value of a test surface is measured with a single spectrally-controlled interferometric measurement using a reference source of known ROC. The test surface is placed at the confocal position of the reference surface and the light source is modulated so as to produce localized interference fringes at the location of the test surface. The interference fringes are then processed with conventional interferometric analysis tools to establish the exact position of the test surface in relation to the reference surface, thereby determining the distance between the test surface and the reference surface. The radius of curvature of the test surface is obtained simply by subtracting such distance from the known radius of curvature of the reference surface.

System for Measuring Optical Phase of a Specimen Using Defocused Images Thereof
20200249095 · 2020-08-06 ·

An optical system for determining the optical phase of an object of interest located at an input plane of the system. The system may include a variable-focus optical imaging system for creating an image of the object of interest at an output plane of the imaging system. An optical detector may be provided at the output plane for receiving the image of the object. A controller may be operably connected to the vari-focal element to adjust the optical power of the variable-focus optical imaging system. The controller may also be configured to create a plurality of defocused images of the object at the output plane and be connected to the detector to capture each of the plurality of defocused images.

Optical alignment based on spectrally-controlled interferometry
10422700 · 2019-09-24 · ·

In order to align the various components of an instrument, the beam produced by a spectrally-controlled light source is aligned with the optical axis of the instrument and the first component is placed at its predetermined position along the optical axis. Then, configuring the spectral modulation of the source such that one surface of the component is used as the reference surface, the spectrum of the source is modulated so as to produce a correlogram formed by reflections from the reference surface and from the other surface of the optical component. The correct alignment of the component is determined by adjusting its position so as to cause the correlogram to conform to the bullseye configuration that meets predetermined design parameters. The procedure is repeated with each other component of the instrument, the alignment of each component being based on interference fringes created independently of other components.

METHOD AND DEVICE FOR ANALYSING AN ELECTROMAGNETIC WAVE IN HIGH DEFINITION
20190285481 · 2019-09-19 · ·

The present invention relates to a method comprising reception of an incident electromagnetic wave (9) by a diffractive element (2) and conversion of this incident electromagnetic wave (9) into a diffracted electromagnetic wave (10) by the diffractive element (2); reception of the diffracted electromagnetic wave (10) by a matrix-array sensor (4) comprising a matrix-array of pixels that are aligned along one or two axes of pixel alignment (13, 14). The method comprises a plurality of acquisitions, by the matrix-array sensor (4), of a signal of the diffracted electromagnetic wave (10) corresponding to a plurality of relative positions between the diffractive element (2) and the matrix-array sensor (4). The invention also relates to a device (1) implementing this method.