Patent classifications
G01J3/0205
Contact-type endoscope SERS probe, and related methods
A contact-type endoscope surface enhanced Raman scattering (SERS) probe includes a gradient-index (GRIN) lens, a transparent substrate adhered to the GRIN lens, and a rough metallic layer adhered to an opposite side of the transparent substrate from the GRIN lens. The GRIN lens focuses light from a Raman spectrometer onto the rough metallic layer, and the rough metallic layer is positioned at the distal end of the contact-type endoscope SERS probe.
Method and system for performing terahertz near-field measurements
This disclosure relates to a method for measuring an electric field in the near-field region of an optically excited sample. The method includes optically exciting at least part of the sample. This step includes directing excitation light onto an interface between the sample and a medium. The excitation light is incident onto the interface under an angle of incidence such that total internal reflection of the excitation light occurs at the interface. The method further includes measuring the electric field using a terahertz near-field probe, wherein the terahertz near-field probe is positioned on one side of the interface and the excitation light approaches the interface on another side of the interface. This disclosure further relates to a system and computer program for measuring an electric field in the near-field region of an optically excited sample.
Compressed-sensing ultrafast spectral photography systems and methods
Among the various aspects of the present disclosure is the provision of systems and methods of compressed-sensing ultrafast spectral photography.
METHOD AND APPARATUS FOR COLOUR IMAGING A THREE-DIMENSIONAL STRUCTURE
A device for determining the surface topology and associated color of a structure, such as a teeth segment, includes a scanner for providing depth data for points along a two-dimensional array substantially orthogonal to the depth direction, and an image acquisition means for providing color data for each of the points of the array, while the spatial disposition of the device with respect to the structure is maintained substantially unchanged. A processor combines the color data and depth data for each point in the array, thereby providing a three-dimensional color virtual model of the surface of the structure. A corresponding method for determining the surface topology and associate color of a structure is also provided.
APPARATUS AND METHOD FOR SPECTROSCOPIC ANALYSIS ON INFRARED RAYS
Provided herein is an infrared spectroscopy technique capable of performing spectroscopic analysis on infrared rays in a broad infrared range (including a near infrared range, a short infrared range, a mid-infrared range, a far infrared range, and an extreme infrared range). An apparatus and a method for spectroscopic analysis on infrared rays are provided, without using an image sensor having a limited response range, to generate a signal in which transmitted light for each wavelength passes through a plurality of filters having different transmittances for each wavelength and is spatially pattern-coded, restore the signal into an infrared transmittance image, discriminate a wavelength according to a transmittance of the filter from the infrared transmittance image, calculate an intensity of the light for each wavelength, and output infrared spectrum information.
Apparatus for optical applications, spectrometer system and method for producing an apparatus for optical applications
The present invention relates to an apparatus for optical applications, a spectrometer system and method for producing an apparatus for optical applications, and in particular to an apparatus comprising an optical waveguide having a first refractive index along a light propagation axis interrupted by a plurality of scattering portions having a second refractive index. Each scattering portion has a long axis substantially perpendicular to the light propagation axis as well as a short axis substantially perpendicular to the light propagation axis and the long axis. A receiver unit or a transmitter unit is arranged on a side of the optical waveguide, the long axis being substantially perpendicular, i.e. normal to the plane of this side on which the receiver unit or transmitter unit is arranged. Accordingly, simplification and miniaturization of an optical apparatus can be realized.
Highly stable semiconductor lasers and sensors for III-V and silicon photonic integrated circuits
Building blocks are provided for on-chip chemical sensors and other highly-compact photonic integrated circuits combining interband or quantum cascade lasers and detectors with passive waveguides and other components integrated on a III-V or silicon. A MWIR or LWIR laser source is evanescently coupled into a passive extended or resonant-cavity waveguide that provides evanescent coupling to a sample gas (or liquid) for spectroscopic chemical sensing. In the case of an ICL, the uppermost layer of this passive waveguide has a relatively high index of refraction that enables it to form the core of the waveguide, while the ambient air, consisting of the sample gas, functions as the top cladding layer. A fraction of the propagating light beam is absorbed by the sample gas if it contains a chemical species having a fingerprint absorption feature within the spectral linewidth of the laser emission.
Optical filter, spectrometer including the optical filter, and electronic apparatus including the optical filter
An optical filter, a spectrometer including the optical filter, and an electronic apparatus including the optical filter are disclosed. The optical filter includes a first reflector including a plurality of first structures that are periodically two-dimensionally arranged, each of the first structures having a ring shape, and a second reflector spaced apart from the first reflector and including a plurality of second structures that are periodically two-dimensionally arranged.
METHOD FOR OPTICAL MONITORING AND/OR DETERMINATION OF PROPERTIES OF SAMPLE
In the method for optical monitoring and/or determination of properties on samples, monochromatic electromagnetic radiation with a predetermined wavelength is sequentially directed from several radiation sources onto a sample influenced by an electronic evaluation unit. The respective intensity specific to the wavelength of the electromagnetic radiation scattered and/or reflected by the sample is detected by at least one detector and fed to the electronic evaluation unit for spectrally resolved evaluation in order to use it to monitor and/or determine properties of the respective sample.
AMBIENT LIGHT SOURCE CLASSIFICATION
An image-sensing device is disclosed, the image-sensing device comprising a multispectral sensor and a processor communicably coupled to the multispectral sensor. The processor is configured to determine an ambient light source classification based on a comparison of predefined spectral data to data corresponding to an output of the multispectral sensor. Also disclosed is a method of classifying an ambient light source by sensing a spectrum of light with a multispectral sensor; and determining an ambient light source classification based on a comparison of predefined spectral data to data corresponding to an output of the multispectral sensor. An associated computer program, computer-readable medium and data processing apparatus are also disclosed.