A laser analysis device includes a laser analysis unit that a sample is irradiated with laser light, a cover that covers a periphery of the laser analysis unit, so as to prevent the laser light from being emitted to outside, and has a slit in at least a part of the cover, a fastener configured to open and close the slit, and an interlock mechanism including a key provided on the fastener and a detector that detects a state in which the fastener is fully closed, in which in a state where the detector has detected that the fastener is fully closed, laser light having a predetermined intensity or more is introduced into the laser analysis unit.

A system includes a processor receiving spectrometer data representative of a scanned sample and generated by a spectrometer and a cloud server including a server processor. The server processor receives the spectrometer data generated by the spectrometer from the processor, analyzes the spectrometer data, identifies, based on a machine learning application, one or more unique characteristics of the spectrometer data which uniquely identifies the scanned sample and provides to the processor data representative of a graphical display, which includes an indication of whether or not the scanned sample includes the one or more unique characteristics of the spectrometer data.

An illuminator system for semiconductor chip testing has a rotary plate and a first light source and second light source mounted on the rotary plate. A controller is configured to rotate the rotary plate to provide a desired light output. A light output of the illuminator system is aligned to the desired first or second light source. A first semiconductor chip receives illumination from the desired source. The rotary plate is rotated until the desired light source is aligned to the light output. A quality or characteristic of light emitted by the first light source can be measured, and then the first light source can be adjusted, or an alert can be generated, if the quality or characteristic falls outside of a preconfigured range.

Systems and methods are provided for a UV-VIS spectrophotometer, such as a UV-VIS detector unit included in a high-performance liquid chromatography system. In one example, a system for the UV-VIS detector unit may include a first light source, a signal detector, a flow path positioned intermediate the first light source and the signal detector, a second light source, and a reference detector. The first light source, the signal detector, and the flow path may be aligned along a first axis, and the second light source and the reference detector may be aligned along a second axis, different than the first axis.

Systems and methods are provided for a UV-VIS spectrophotometer, such as a UV-VIS detector unit included in a high-performance liquid chromatography system. In one example, a system for the UV-VIS detector unit may include a first light source, a signal detector, a flow path positioned intermediate the first light source and the signal detector, a second light source, and a reference detector. The first light source, the signal detector, and the flow path may be aligned along a first axis, and the second light source and the reference detector may be aligned along a second axis, different than the first axis.

The present disclosure relates to an optical sensor, comprising: a first circuit board having at least a data processing unit and an interface to a second circuit board, wherein the interface is connected with the data processing unit; and the second circuit board having an LED, a thermistor and a capacitor, which is connected in parallel with the thermistor, wherein the capacitor is embodied specifically for the LED, and an interface to the first circuit board, wherein LED, thermistor and capacitor are connected with the interface. The present disclosure relates also to a method for identifying an LED in an optical sensor.

A protection device for an Optical Emission Spectrometer (OES) and a method of protecting a detector to which purge gas is supplied, in an OES, are disclosed. The protection device comprises a timer, which measures a parameter, such as a humidity value, indicative of a shut down time period following cessation of application of purge gas to the detector. The protection device comprises a processor, which determines a start-up time period, based on the parameter, during which purge gas is supplied to the detector prior to cooling of the detector. The processor may selectively trigger commencing or maintaining application of purge gas to the detector or cooling of the detector in dependence on the parameter.

A rotational speed sensor, a manufacturing method thereof, a driving method thereof, and an electronic device are provided. The rotational speed sensor includes liquid crystal cell, rotational speed sensing module and rotational speed determining module; rotational speed sensing module is configured to convert rotational speed into voltage signal and apply voltage signal to liquid crystal cell; and at least a part of optical signal propagation module of rotational speed determining module is located in liquid crystal cell. Spectrum drift time of optical signal propagated in optical signal propagation module is variable as refractive index of liquid crystal molecules in liquid crystal cell changes; optical signal transmitting module in rotational speed determining module transmits optical signal to optical signal propagation module; optical signal receiving module in rotational speed determining module receives optical signal propagated by optical signal propagation module and analyzes spectrum to determine rotational speed.

Provided is an identification apparatus wherein each spectral light beam corresponding to a predetermined wavenumber shift is projected to the imaging portion) so that a distance between a projection position of the spectral light beam corresponding to the predetermined wavenumber shift on the imaging portion and a changed projection position as a result of the different excitation wavelength is shorter than a distance at the imaging lens between an optical path of the spectral light beam corresponding to the predetermined wavenumber shift and a changed optical path as a result of the different excitation wavelength.

In some implementations, a device may identify, based on spectroscopic data, a pseudo steady state end point indicating an end of a pseudo steady state associated with the blending process. The device may identify a reference block and a test block from the spectroscopic data based on the pseudo steady state end point. The device may generate a raw detection signal associated with the reference block and a raw detection signal associated with the test block. The device may generate a statistical detection signal based on the raw detection signal associated with the reference block and the raw detection signal associated with the test block. The device may determine whether the blending process has reached a steady state based on the statistical detection signal.