An optical device stack includes at least one of a photodetector or an optical emitter and a metasurface. The metasurface is disposed over a light-receiving surface of the photodetector or a light emission surface of the optical emitter. The metasurface includes a first conductive layer having an electrically-tunable optical property and an array of conductive nanostructures disposed on a first side of the first conductive layer. A second conductive layer is disposed on a second side of the first conductive layer. An electrical insulator is disposed between the first conductive layer and the second conductive layer. A change in an electrical bias between the metasurface and the second conductive layer, from a first electrical bias to a second electrical bias, tunes the electrically-tunable optical property from a first state to a second state, and changes an electrically-tunable optical filtering property of the metasurface.

Provided herein is an infrared spectroscopy technique capable of performing spectroscopic analysis on infrared rays in a broad infrared range (including a near infrared range, a short infrared range, a mid-infrared range, a far infrared range, and an extreme infrared range). An apparatus and a method for spectroscopic analysis on infrared rays are provided, without using an image sensor having a limited response range, to generate a signal in which transmitted light for each wavelength passes through a plurality of filters having different transmittances for each wavelength and is spatially pattern-coded, restore the signal into an infrared transmittance image, discriminate a wavelength according to a transmittance of the filter from the infrared transmittance image, calculate an intensity of the light for each wavelength, and output infrared spectrum information.

A spectrometer for detecting an electromagnetic (EM) wave spectrum having one or more wavelength components within a spectral band of interest, and a method of detecting an electromagnetic (EM) wave spectrum having one or more wavelength components within a spectral band of interest. The method uses an entrance aperture; a dispersion and imaging optics containing at least one dispersion element; an exit aperture; a collection optics; and at least one single-pixel detector, each single-pixel detector sensitive to one or more of the wavelength components; and the method comprises the steps of spatially encoding at least one entrance slit of the entrance aperture along a direction substantially transverse to a direction of dispersion of the dispersion and imaging optics; creating, using the dispersion and imaging optics, dispersed images of the entrance aperture on a plane of the exit aperture, such that respective images at the different wavelength components are offset by different amounts of displacements along the direction of dispersion; spatially encoding a plurality of exit slits of the exit aperture along the direction substantially transverse to the direction of dispersion, wherein the exit aperture comprises a plurality of exit slits arranged in the direction of dispersion; gathering, using the collection optics, a total EM wave energy that enters the entrance aperture and exits the exit aperture to one of the at least one single-pixel detectors; changing at least one of an encoding pattern of the at least one entrance slits and an encoding pattern of the plurality of exit slits for a number of times; and measuring the output of the at least one detector for respective ones of the number of times for reconstructing the EM wave spectrum.

An optical device stack includes at least one of a photodetector or an optical emitter and a metasurface. The metasurface is disposed over a light-receiving surface of the photodetector or a light emission surface of the optical emitter. The metasurface includes a first conductive layer having an electrically-tunable optical property and an array of conductive nanostructures disposed on a first side of the first conductive layer. A second conductive layer is disposed on a second side of the first conductive layer. An electrical insulator is disposed between the first conductive layer and the second conductive layer. A change in an electrical bias between the metasurface and the second conductive layer, from a first electrical bias to a second electrical bias, tunes the electrically-tunable optical property from a first state to a second state, and changes an electrically-tunable optical filtering property of the metasurface.

An optical sensor device includes an optical sensor; an optical filter; a phase mask configured to distribute a plurality of light beams associated with a subject in an encoded pattern; a movement component configured to move the phase mask; and one or more processors configured to: obtain, from the optical sensor, a first set of sensor data that indicates information related to first light that originates at the subject and passes through the phase mask when the phase mask is located at a first position; obtain, from the optical sensor, a second set of sensor data that indicates information related to second light that originates at the subject and passes through the phase mask when the phase mask is located at a second position; determine and provide, based on the first set of sensor data and the second set of sensor data, information associated with the subject.

A system includes a first spectral modulator, a second spectral modulator, a light guide optically, a photodetector, and an electronic control device. The first spectral modulator receives sample light, and modulates the sample light according to a first spectral response pattern to produce first modulated light. The second spectral modulator receives the first modulated light from the first spectral modulator via the light guide, modulates the first modulated light according to a second spectral response pattern to produce second modulated light, and transmits the second modulated light to the photodetector. The photodetector measures an intensity of the second modulated light incident on the photodetector, and generates one or more signals corresponding to the intensity of the second modulated light. The electronic control device determines a spectral distribution of the sample light based on the one or more signals.

A filter array used in a light detection device, which generates image data corresponding to each of N wavelength bands (N being an integer greater than or equal to 2) included in a specific wavelength range, includes optical filters. The optical filters include various types of optical filters with different light transmittance with respect to each wavelength band. M.sub.i≥0.1 with respect to each wavelength band, where M.sub.i=μ.sub.i−σ.sub.i, μ.sub.i denoting an average value of light transmittance of the optical filters with respect to light having a wavelength included in an i-th wavelength band (i being an integer greater than or equal to 1 and less than or equal to N) of the N wavelength bands, σ.sub.i denoting a standard deviation of the light transmittance of the optical filters with respect to the light having the wavelength included in the i-th wavelength band.

A spectral imaging system comprises: a spatial encoder comprising a first light encoding device comprising a first mask for spatial encoding, the first mask being configured with one or more encoding patterns; a spectral encoder comprising: a dispersion arrangement for splitting spatially encoded light from the first light encoding device into a plurality of components; and a second light encoding device comprising a second mask for spectral encoding of the plurality of components, the second mask having one or more encoding patterns; and at least one single-pixel photodetector positioned to measure light that is encoded by the masks. The spatial encoder is operable to spatially encode light by generating a sequence of different patterns or partial patterns of the one or more encoding patterns of the first mask. The spectral encoder is operable to spectrally encode light by relative movement between the dispersion arrangement and the second mask.

Embodiments are directed to an optical spectrometry method, comprising: generating a sequence of 2D Hadamard masks along the time dimension, wherein each 2D Hadamard mask is arranged with a wavelength dimension and a coefficient dimension; detecting an optical signal from light transmitted through the sequence of 2D Hadamard masks; and reconstructing a spectrum to be detected by analyzing the optical signal, wherein each 2D Hadamard mask in the sequence of 2D Hadamard masks comprises a plurality of columns along the wavelength dimension, each column corresponding to a different Hadamard coefficient, and having different respective sequency values along the time dimension.

An apparatus is provided that includes a detector configured to detect, cumulatively during an exposure period, spatially modulated light. The apparatus also includes modulation means for applying multiple different effective spatial modulations to received light, during the exposure period. A different effective spatial modulation is applied to received light in dependence upon a time during the exposure period of the detector and a frequency of the light, to produce spatially modulated light for detection by the detector.