The present invention provides a reflective polarized-light separating diffraction-element usable in a wide wavelength region including an ultraviolet region, and an optical measurement device comprising the same. The reflective polarized-light separating diffraction-element comprises: a substrate (1); a reflection surface (2) formed on a surface of the substrate (1); and a lattice structured body assembly (3) that is provided on the reflection surface (2) and shows a form birefringence (Δn*). The lattice structured body assembly (3) consists of lattice structured bodies (3A, 3B, 3C and 3D) of four patterns having lattice structures of different azimuths. The lattice structured bodies (3A, 3B, 3C and 3D) of a plurality of patterns are aligned on the reflection surface 2 in a predetermined direction such that the azimuths of the lattice structures change in a structurally periodic manner.

A polarimeter may include a non-polarizing beamsplitter to split an input beam into a first beam and a second beam, a corner-cube retroreflector to retroreflect the first beam as a polarization-split beam, and a mirror to retroreflect the second beam as a retroreflected second beam. A beam profile of the polarization-split beam includes six regions with different states of polarization associated with a different order of reflections in the corner-cube retroreflector. The non-polarizing beamsplitter may combine the polarization-split beam and the retroreflected second beam as an intensity-split beam having six intensity regions associated with interference of the polarization-split beam with the retroreflected second beam. The polarimeter may further include a detector to measure an intensity of at least some of the six intensity regions and a controller to determine a polarization of the input beam based on the intensities of the at least some of the six intensity regions.

A polarimeter may include a non-polarizing beamsplitter to split an input beam into a first beam and a second beam, a corner-cube retroreflector to retroreflect the first beam as a polarization-split beam, and a mirror to retroreflect the second beam as a retroreflected second beam. A beam profile of the polarization-split beam includes six regions with different states of polarization associated with a different order of reflections in the corner-cube retroreflector. The non-polarizing beamsplitter may combine the polarization-split beam and the retroreflected second beam as an intensity-split beam having six intensity regions associated with interference of the polarization-split beam with the retroreflected second beam. The polarimeter may further include a detector to measure an intensity of at least some of the six intensity regions and a controller to determine a polarization of the input beam based on the intensities of the at least some of the six intensity regions.

An image sensor capable of recording both spectral and polarization properties of light using a single chip device includes an at least 2048 by 2048 array of superpixels. Each superpixel includes an array of spectral pixels, and an adjacent array of polarization pixels. Each spectral pixel includes a spectral filter and a stack of photodiodes, where each photodiode has a different quantum efficiency and is, therefore, sensitive to a different wavelength of light passed by the spectral filter. Each polarization pixel includes a polarization filter and a stack of photodiodes, similar to the spectral pixel photodiode stacks.

An image sensor capable of recording both spectral and polarization properties of light using a single chip device includes an at least 2048 by 2048 array of superpixels. Each superpixel includes an array of spectral pixels, and an adjacent array of polarization pixels. Each spectral pixel includes a spectral filter and a stack of photodiodes, where each photodiode has a different quantum efficiency and is, therefore, sensitive to a different wavelength of light passed by the spectral filter. Each polarization pixel includes a polarization filter and a stack of photodiodes, similar to the spectral pixel photodiode stacks.

An apparatus measures the transverse profile of vectorial optical field beams, including both the phase and the polarization spatial profile. The apparatus contains a polarization separation module, a weak perturbation module, and a detection module. Characterizing the transverse profile of vector fields provides an optical metrology tool for both fundamental studies of vectorial optical fields and a wide spectrum of applications, including microscopy, surveillance, imaging, communication, material processing, and laser trapping.

An apparatus measures the transverse profile of vectorial optical field beams, including both the phase and the polarization spatial profile. The apparatus contains a polarization separation module, a weak perturbation module, and a detection module. Characterizing the transverse profile of vector fields provides an optical metrology tool for both fundamental studies of vectorial optical fields and a wide spectrum of applications, including microscopy, surveillance, imaging, communication, material processing, and laser trapping.

A quantization range setting unit (31) of an encoder (30) sets a quantization range for each Stokes parameter of a Stokes vector acquired from a Stokes vector calculation unit (20). The quantization range is set for the Stokes parameter indicating intensity, and is then set for the other Stokes parameters. A quantization unit (32) calculates the Stokes parameter indicating intensity as a predetermined quantization bit number, and calculates the quantization bit numbers of the other Stokes parameters on the basis of the predetermined quantization bit number and the quantization ranges set for the respective Stokes parameters. The quantization unit (32) performs a quantization process on the Stokes parameters on the basis of the quantization ranges and the quantization bit numbers, to generate quantized polarization information. A decoder (40) performs inverse quantization compatible with the encoder 30 on the quantized polarization information, and generates the Stokes vectors before quantization. The amount of polarization information data can be reduced.

A quantization range setting unit (31) of an encoder (30) sets a quantization range for each Stokes parameter of a Stokes vector acquired from a Stokes vector calculation unit (20). The quantization range is set for the Stokes parameter indicating intensity, and is then set for the other Stokes parameters. A quantization unit (32) calculates the Stokes parameter indicating intensity as a predetermined quantization bit number, and calculates the quantization bit numbers of the other Stokes parameters on the basis of the predetermined quantization bit number and the quantization ranges set for the respective Stokes parameters. The quantization unit (32) performs a quantization process on the Stokes parameters on the basis of the quantization ranges and the quantization bit numbers, to generate quantized polarization information. A decoder (40) performs inverse quantization compatible with the encoder 30 on the quantized polarization information, and generates the Stokes vectors before quantization. The amount of polarization information data can be reduced.

The present invention relates to a light line triangulation apparatus with a measurement space for receiving a measurement object, a light projector, adapted to project a light line into the measurement space and/or onto the measurement object, an imager for detecting the light line in the measurement space, wherein the imager comprises imaging pixels arranged in a plurality of columns and rows. The apparatus of the invention is characterized in that the imager comprises multiple identical sets of polarization filters, wherein each set of polarization filters comprises at least two polarization filters with different polarization directions, wherein a respective polarization filter covers one of the columns.