A thermal processing system for performing thermal processing can include a workpiece support plate configured to support a workpiece and heat source(s) configured to heat the workpiece. The thermal processing system can include window(s) having transparent region(s) that are transparent to electromagnetic radiation within a measurement wavelength range and opaque region(s) that are opaque to electromagnetic radiation within a portion of the measurement wavelength range. A temperature measurement system can include a plurality of infrared emitters configured to emit infrared radiation and a plurality of infrared sensors configured to measure infrared radiation within the measurement wavelength range where the transparent region(s) are at least partially within a field of view the infrared sensors. A controller can be configured to perform operations including obtaining transmittance and reflectance measurements associated with the workpiece and determining, based on the measurements, a temperature of the workpiece less than about 600° C.

An infrared-detecting device, includes an infrared detector configured to emit a signal representative of the thermal radiation of a hotspot, and a light source configured to emit an incident beam, preferably in a window of UV or visible wavelength. The infrared-detecting device furthermore comprises a synchronizing device connected to the light source and to the infrared detector or to the processing module, and configured to emit a synchronization signal, the infrared detector being configured to be activated in a preset time window depending on said synchronization signal.

A thermal processing system for performing thermal processing can include a workpiece support plate configured to support a workpiece and heat source(s) configured to heat the workpiece. The thermal processing system can include window(s) having transparent region(s) that are transparent to electromagnetic radiation within a measurement wavelength range and opaque region(s) that are opaque to electromagnetic radiation within a portion of the measurement wavelength range. A temperature measurement system can include a plurality of infrared emitters configured to emit infrared radiation and a plurality of infrared sensors configured to measure infrared radiation within the measurement wavelength range where the transparent region(s) are at least partially within a field of view the infrared sensors. A controller can be configured to perform operations including obtaining transmittance and reflectance measurements associated with the workpiece and determining, based on the measurements, a temperature of the workpiece less than about 600° C.

Described herein is a modulation device for periodically modulating light emitted by a light source. The modulation device includes at least one enclosing tube being rotatable about a cylinder axis of the enclosing tube. The enclosing tube includes at least one aperture disposed within a cylindrical wall of the enclosing tube. The modulation device further includes at least one driving system for rotating the enclosing tube about the cylinder axis. Also described herein are a modulated illumination device and a spectrometer device.

Described herein is a modulation device for periodically modulating light emitted by a light source. The modulation device includes at least one enclosing tube being rotatable about a cylinder axis of the enclosing tube. The enclosing tube includes at least one aperture disposed within a cylindrical wall of the enclosing tube. The modulation device further includes at least one driving system for rotating the enclosing tube about the cylinder axis. Also described herein are a modulated illumination device and a spectrometer device.

A method and a system method for real-time wide-field dynamic temperature sensing of an object, the method comprising producing wide-field illumination to upconverting nanoparticles at the object plane, collecting a light emitted by the upconverting nanoparticles, dividing a collected light into a reflected component and a transmitted component; imaging the reflected component into a first image, imaging the transmitted component into a second image; processing the images; and reconstruction of the object from resulting proceed images.

A pyroelectric presence identification system includes focal plane array and a processor coupled to the focal plane array. The focal plane array includes a first image sensor and a plurality of second image sensors configured to convert radiant energy into an electrical signal. The processor is configured to control the focal plane array in a sleep mode wherein the first image sensor is utilized to detect gross motion of at least one presence and the plurality of second image sensors are de-energized.

A pyroelectric presence identification system includes focal plane array and a processor coupled to the focal plane array. The focal plane array includes a first image sensor and a plurality of second image sensors configured to convert radiant energy into an electrical signal. The processor is configured to control the focal plane array in a sleep mode wherein the first image sensor is utilized to detect gross motion of at least one presence and the plurality of second image sensors are de-energized.

A method of estimating non-linearity in a response of an optical detector comprises emitting optical radiation at different intensities. The method includes, at each intensity: amplitude modulating the emitted optical radiation at a modulating frequency to produce amplitude modulated optical radiation; detecting the amplitude modulated optical radiation with the optical detector to produce a detected waveform; and generating a Fourier transform of the detected waveform that includes a fundamental frequency equal to the modulating frequency and harmonics thereof. The method further includes estimating the non-linearity in the response of the optical detector based on a change in an amplitude of a second harmonic of the fundamental frequency relative to an amplitude of the fundamental frequency across the Fourier transforms corresponding to the different intensities.

A method and system for imaging a target scene using a microbolometer array having multiple lines of microbolometer pixels are disclosed. Each line is switchable between an exposed state and a shielded state, where the line is exposed to the target scene and a reference scene, respectively. The method may include alternating between generating a target frame of the target scene and generating a reference frame of the reference scene, each of which in a rolling shutter mode. The method may also include, concurrently with the generating steps, alternating between sequentially shielding each line after its readout in the exposed state for its next readout in the shielded state, and sequentially exposing each line after its readout in the shielded state for its next readout in the exposed state. The method may also include adjusting the target frames using the reference frames to generate thermal images of the target scene.