A process monitor includes a photodetector that separately measures intensities of radiant light from a semiconductor member being annealed, in a plurality of wavelength ranges that are different from each other, and a processing device that obtains a physical quantity related to the semiconductor member that changes due to annealing, based on the intensities in the plurality of wavelength ranges measured by the photodetector.

An anti-copy electronic device contains: a wireless signal controller having a sensor, and the wireless signal controller and the sensor are accommodated in a casing. The sensor has humidity detection, pressure detection, lights detection, color temperature detection, ultraviolet (UV) detection, and special gases detection in an interior space of the casing. After the casing is removed, the sensor detects a change of humidity, pressure, lights, color temperature, ultraviolet (UV), and special gases in the interior space and sends an indication signal to the wireless signal controller so that the wireless signal controller destroys a password setting program of the wireless signal controller, thus avoiding copy of the password setting program.

An anti-copy electronic device contains: a wireless signal controller having a sensor, and the wireless signal controller and the sensor are accommodated in a casing. The sensor has humidity detection, pressure detection, lights detection, color temperature detection, ultraviolet (UV) detection, and special gases detection in an interior space of the casing. After the casing is removed, the sensor detects a change of humidity, pressure, lights, color temperature, ultraviolet (UV), and special gases in the interior space and sends an indication signal to the wireless signal controller so that the wireless signal controller destroys a password setting program of the wireless signal controller, thus avoiding copy of the password setting program.

An apparatus for processing substrates includes a continuum radiation source, a source manifold optically coupled to the continuum radiation source and comprising: a plurality of beam guides, each having a first end that optically couples the beam guide to the continuum radiation source; and a second end. The apparatus also includes a detector manifold to detect radiation originating from the source manifold and transmitted through a processing area, and one or more transmission pyrometers configured to analyze the source radiation and the transmitted radiation to determine an inferred temperature proximate the processing area.

An apparatus for processing substrates includes a continuum radiation source, a source manifold optically coupled to the continuum radiation source and comprising: a plurality of beam guides, each having a first end that optically couples the beam guide to the continuum radiation source; and a second end. The apparatus also includes a detector manifold to detect radiation originating from the source manifold and transmitted through a processing area, and one or more transmission pyrometers configured to analyze the source radiation and the transmitted radiation to determine an inferred temperature proximate the processing area.

Disclosed herein are methods and apparatus for making a determination about an eye comprising detecting light reflected out of an eye of a subject from a retina of the eye of the subject and making a determination about the eye of the subject based upon the reflected light, wherein the light is adjusted for color temperature when making the determination about the eye.

Disclosed herein are methods and apparatus for making a determination about an eye comprising detecting light reflected out of an eye of a subject from a retina of the eye of the subject and making a determination about the eye of the subject based upon the reflected light, wherein the light is adjusted for color temperature when making the determination about the eye.

A system simulates hyperspectral imaging data or multispectral imaging data for a simulated sensor. Blackbody radiance of real-world thermal imagery data is computed using a Planck function, which generates a simulated spectral hypercube. Spectral emissivity data for background materials are multiplied by a per-pixel weighting function, which generates weighted spectral emissivity data. The simulated spectral hypercube is multiplied by the weighted spectral emissivity data, which generates background data in the simulated spectral hypercube. Simulated targets are inserted the background data using the Planck function. The simulated spectral hypercube is modified, and then it is used to estimate a mission measure of effectiveness of the simulated sensor.

An additive manufacturing apparatus includes a laser and a detection system. The laser emits a laser beam to heat a powder bed to form a melt pool, and the melt pool emits light proportional to a temperature of the melt pool. The detection system includes a spectral disperser and one of a) two or more on-axis sensors or b) a line scanner. The two or more on-axis sensors or the line scanner are/is located along an axis of the emitted light, the detection system receives the emitted light from the melt pool, and an intensity of the emitted light detected by the a) two or more on-axis sensors or the b) line scanner is compared with a blackbody spectral map at a particular wavelength of the emitted light to determine a temperature of the melt pool.

An additive manufacturing apparatus includes a laser and a detection system. The laser emits a laser beam to heat a powder bed to form a melt pool, and the melt pool emits light proportional to a temperature of the melt pool. The detection system includes a spectral disperser and one of a) two or more on-axis sensors or b) a line scanner. The two or more on-axis sensors or the line scanner are/is located along an axis of the emitted light, the detection system receives the emitted light from the melt pool, and an intensity of the emitted light detected by the a) two or more on-axis sensors or the b) line scanner is compared with a blackbody spectral map at a particular wavelength of the emitted light to determine a temperature of the melt pool.