An immersion probe with a variable connection length is configured to compensate for longitudinal and/or radial length variations in an immersion sublance connected to the immersion probe. The immersion probe is characterized by an adjustable portion that changes length upon engagement with a coupling end of an immersion sublance. The immersion probe can have a sensor head. An immersion assembly of the immersion probe connected to an immersion sublance can be used to take measurements or samples of molten metal in a converter furnace.

An immersion probe with a variable connection length is configured to compensate for longitudinal and/or radial length variations in an immersion sublance connected to the immersion probe. The immersion probe is characterized by an adjustable portion that changes length upon engagement with a coupling end of an immersion sublance. The immersion probe can have a sensor head. An immersion assembly of the immersion probe connected to an immersion sublance can be used to take measurements or samples of molten metal in a converter furnace.

The present invention relates to a method for contactlessly measuring the amount of menstrual blood in a menstrual cup. The amount of menstrual blood that has been stored in a menstrual cup can be simply measured by using a contactless sensor means, thereby enabling the user to periodically check the amount of menstrual blood. This enables early detection and treatment of uterine fibroid, which may even lead to hysterectomy.

A method of detecting removal of a maintenance hatch includes transmitting an optical pulse along an optical fiber, wherein a first portion of the optical fiber is proximate to the maintenance hatch. The method further includes detecting backscatter light from the optical fiber using a sensor. The method further includes determining information related to the first portion of the optical fiber based on a comparison of the detected backscatter light and a trained model. The method further includes identifying whether the maintenance hatch has been removed based on the determined information.

The present disclosure describes methods and apparatus for remote sensing with data analytics. The methods and apparatus have many applications including monitoring the quality of grain during storage and/or transport. The present disclosure describes a way to collect temperature and other environmental data to describe and predict quality of stored grains, current and future, based on a myriad factors including fumigation, external temperature and humidity, in storage grain temperature and humidity.

Disclosed is a method for determining a mixing temperature of an asphalt mixture which includes the following steps: S100, obtaining a test result of surface energy of hot-melt asphalt; S200, obtaining, according to a calculation formula for total adhesion work and in combination with the test result of the surface energy of the hot-melt asphalt, total adhesion work of an asphalt and aggregate interface at different mixing temperatures; S300, determining a temperature range corresponding to peak values of the total adhesion work of the asphalt and aggregate interface; and S400, calculating a median value of the temperature range determined in S300, so as to determine an optimum mixing temperature of the asphalt mixture.

A system and method for rapidly determining ambient temperature in a fluid-analyte meter. The meter includes a housing defining an interior space and an area for receiving a fluid sample. A processor and a first temperature sensor are disposed within the interior space of said the housing. A second temperature sensor is disposed on the housing. One or more processors are configured to determine a first temperature value from temperature data received from the first temperature sensor. The processor(s) are also configured to apply a variable current to a temperature-adjustment source such that the second temperature sensor is adjusted to a predetermined steady-state temperature value different from the first temperature value. The processor(s) are further configured to determine an ambient temperature of an exterior space of the housing based on the applied variable current, pre-determined steady-state temperature, and received first temperature values.

An apparatus includes a vessel configured to be pressurized and heated at a well site to match desired process conditions at which a demulsifier is to break an emulsion of crude oil. The vessel includes a first end, a second end, an inlet pipe, and an outlet pipe. The inlet pipe receives crude oil and a demulsifier and mixes the crude oil and the demulsifier to form a mixture. The apparatus includes a heater surrounding at least a portion of the vessel. The heater is configured to provide heat to the mixture. The apparatus includes a guided wave radar configured to generate a reference pulse of microwave energy and detect a surface echo reflected from the mixture.

An apparatus includes a vessel configured to be pressurized and heated at a well site to match desired process conditions at which a demulsifier is to break an emulsion of crude oil. The vessel includes a first end, a second end, an inlet pipe, and an outlet pipe. The inlet pipe receives crude oil and a demulsifier and mixes the crude oil and the demulsifier to form a mixture. The apparatus includes a heater surrounding at least a portion of the vessel. The heater is configured to provide heat to the mixture. The apparatus includes a guided wave radar configured to generate a reference pulse of microwave energy and detect a surface echo reflected from the mixture.

Implementations described herein generally relate to semiconductor manufacturing, and more specifically to a temperature measurement device. In one implementation, the temperature measurement device includes a substrate and a stack of metal layers coupled to the substrate. Each metal layer of the stack of metal layers extends continuously uninterrupted from edge to edge of the substrate. The first metal layer has a lower electrical resistivity than the second metal layers. The electrical resistivity of the stack is based on the electrical resistivity of the first metal layer, which is temperature dependent. Utilizing a known relationship between temperature measurements and resistivity measurements, the temperature measurement device can measure and store temperature information in various substrate processing processes.