A system for measuring pump efficiency includes a pump configured to pump a fluid, a suction pipe disposed upstream of a suction side of the pump, a discharge pipe disposed downstream of a discharge side of the pump, a first pipe section disposed between the suction pipe and the suction side of the pump, and a second pipe section disposed between the discharge pipe and the discharge side of the pump. Each of the first pipe section and the second pipe section includes a temperature sensing pipe liner configured to measure a temperature of the fluid in the first pipe section, and a thermal insulator disposed radially outward of the temperature sensing pipe liner.

An electronic system can be used to monitor temperature. The electronic system can include a characterized dielectric located adjacent to a plurality of heat-producing electronic devices. The electronic system can also include a leakage measurement circuit that is electrically connected to the characterized dielectric. The leakage measurement circuit can be configured to measure current leakage through the characterized dielectric. The leakage measurement circuit can also be configured to convert a leakage current measurement into a corresponding output voltage. A response device, electrically connected to the leakage measurement circuit can be configured to, in response to the output voltage exceeding a voltage threshold corresponding to a known temperature, initiate a response action.

In some examples, a temperature distribution sensor may include a laser source to emit a laser beam that is tunable over a wavelength range. The wavelength range may be less than a Raman bandwidth in a device under test (DUT), or of-the-order-of the Raman bandwidth in the DUT. A pulsed source may apply a pulse drive signal to the laser beam or to a modulator to modulate the laser beam that is to be injected into the DUT. A bandpass filter may be operatively disposed between the laser source and the DUT, and may be configured to an anti-Stokes wavelength that is narrower than the Raman bandwidth. A photodiode may be operatively disposed between the bandpass filter and the DUT to acquire, from the DUT, anti-Stokes optical time-domain reflectometer traces for two preset wavelengths of the laser beam to determine a temperature distribution for the DUT.

In some examples, a temperature distribution sensor may include a laser source to emit a laser beam that is tunable over a wavelength range. The wavelength range may be less than a Raman bandwidth in a device under test (DUT), or of-the-order-of the Raman bandwidth in the DUT. A pulsed source may apply a pulse drive signal to the laser beam or to a modulator to modulate the laser beam that is to be injected into the DUT. A bandpass filter may be operatively disposed between the laser source and the DUT, and may be configured to an anti-Stokes wavelength that is narrower than the Raman bandwidth. A photodiode may be operatively disposed between the bandpass filter and the DUT to acquire, from the DUT, anti-Stokes optical time-domain reflectometer traces for two preset wavelengths of the laser beam to determine a temperature distribution for the DUT.

A spray quenching system including a quench box configured to receive a part for quenching. The system may include mechanical arms disposed within the quench box and thermocouples disposed on the mechanical arms that may be moved to contact the part surface. The system may include non-contact temperature sensors within the quench box that measure the temperature part surface, and spray nozzles within the quench box that spray the part with a quenching fluid. The system may include a controller in electronic communication with the mechanical arms, the spray nozzles, the thermocouples, and the non-contact temperature sensors, that is configured to initiate a quenching process, receive temperature data, analyze the temperature data to determine a temperature difference value, determine that the temperature difference value exceeds a threshold temperature difference value, and adjust the quenching process if the temperature difference value exceeds the threshold temperature difference value.

A method, apparatus, touch chip, and electronic device for determining a temperature status of a touch screen. The method for determining a temperature status of a touch screen includes: determining, based on a plurality of sampled characteristic values of each temperature monitoring node in each sampling period, a raw characteristic value of the temperature monitoring node in a the sampling period, the temperature monitoring being selected from a plurality of capacitance nodes in a touch array; and calculating, based on raw characteristic values of all temperature monitoring nodes in each sampling period, a raw characteristic statistic value in each sampling period, and determining the temperature status of the touch screen based on a raw characteristic statistic values in sampling periods.

A method, apparatus, touch chip, and electronic device for determining a temperature status of a touch screen. The method for determining a temperature status of a touch screen includes: determining, based on a plurality of sampled characteristic values of each temperature monitoring node in each sampling period, a raw characteristic value of the temperature monitoring node in a the sampling period, the temperature monitoring being selected from a plurality of capacitance nodes in a touch array; and calculating, based on raw characteristic values of all temperature monitoring nodes in each sampling period, a raw characteristic statistic value in each sampling period, and determining the temperature status of the touch screen based on a raw characteristic statistic values in sampling periods.

A temperature measurement system for determining a performance of a smoke generating device includes a temperature measuring device. The temperature measuring device includes an elongated carrier and a number of thermal sensors disposed within the elongated carrier. The elongated carrier is configured to be inserted into an elongated chamber of the smoke generating device. Each of the thermal sensors includes a sensing end exposed on an outer surface of the elongated carrier. When the elongated carrier is inserted into the elongated chamber, the sensing ends respectively detect a temperature of a number of heating members of the smoke generating device.

A method and a system for fault verification of an electronic device are provided. The electronic device includes a device to-be-verified. The method includes the following. A first power-supply voltage is applied to the electronic device until the device to-be-verified satisfies a material-failure condition. A second power-supply voltage is applied to the electronic device to determine whether the electronic device has safety risk. The first power-supply voltage is higher than the second power-supply voltage, and the safety risk is caused by material failure in the device to-be-verified. The method and the system for fault verification of an electronic device can verify safety risk caused by material failure in internal components of the electronic device.

A method and a system for fault verification of an electronic device are provided. The electronic device includes a device to-be-verified. The method includes the following. A first power-supply voltage is applied to the electronic device until the device to-be-verified satisfies a material-failure condition. A second power-supply voltage is applied to the electronic device to determine whether the electronic device has safety risk. The first power-supply voltage is higher than the second power-supply voltage, and the safety risk is caused by material failure in the device to-be-verified. The method and the system for fault verification of an electronic device can verify safety risk caused by material failure in internal components of the electronic device.