A lensmeter system may include a mobile device having a camera. The camera may capture a first image of a pattern through a lens that is separate from the camera, while the lens is in contact with a pattern. The mobile device may determine the size of the lens based on the first image and known features of the pattern. The camera may capture a second image of the pattern, while the lens is at an intermediate location between the camera and the pattern. The second image may be transformed to an ideal coordinate system, and processed determine a distortion of the pattern attributable to the lens. The mobile device may measure characteristics of the lens based on the distortion. Characteristics of the lens may include a spherical power, a cylinder power, and/or an astigmatism angle.

An eyeglasses lens measurement device measures an eyeglasses lens of eyeglasses. The eyeglasses lens measurement device includes a light source that emits a measurement light flux toward the eyeglasses lens, a transmissive display that transmits the measurement light flux from the light source and displays an index pattern formed by arranging a plurality of indexes, a detector that detects the measurement light flux passing through the eyeglasses lens and the transmissive display, and a controller. The controller is configured to control a display of the index pattern, acquire an optical characteristic of the eyeglasses lens, based on a detection result of the detector, and acquire lens information different from the optical characteristic of the eyeglasses lens, based on a detection result of the detector.

This method for retrieving at least one optical parameter of an ophthalmic lens comprises: obtaining an image of a first and second patterns by using an image capture device located at a first position; from that image, obtaining a first set of data from at least a part of the first pattern that is seen through the lens by the image capture device and obtaining a second set of data from at least a part of the second pattern that is seen directly i.e. outside the lens by the image capture device; retrieving the at least one optical parameter by using the first and second sets of data and taking account of relative positions of the image capture device, the lens and the first and second patterns.

A system and method for high-throughput testing and module integration of rotationally variant optical lens systems is provided. In some examples, the system may be a metrology system that includes a light source to generate optical illumination. The metrology system may also include a null element. The null element may generate, using the optical illumination from the light source, a prescribed wavefront corresponding to a unit under test (UUT). In addition, the metrology system may further include a null element fixture to position the null element with respect to the unit under test (UUT).

A system and method of characterizing through-focus visual performance of an IOL using metrics based on an area under the modulation transfer function for different spatial frequencies at different defocus positions of the IOL. Also disclosed is a system and method of characterizing through-focus visual performance of an IOL using a metric based on an area under a cross-correlation coefficient for an image of a target acquired by the IOL at different defocus positions of the IOL.

A process is provided for determining characteristics of a lens, the process including obtaining a captured image of a pattern through a corrective lens; transforming the captured image to an ideal coordinate system; processing the captured image to determine an overall distortion from a reference pattern to the pattern of the captured image; determining a distortion of the captured pattern attributable to the corrective lens; and measuring at least one characteristic of the corrective lens. In some embodiments, the overall distortion is determined by detecting, in the captured image, at least one captured pattern landmark; determining a transformation from at least one ideal pattern landmark to the at least one captured pattern landmark; and determining for the corrective lens, from the transformation, a spherical power measurement, a cylinder power measurement, and an astigmatism angle measurement.

Embodiments of the invention provide a method of determining one or more characteristics of a target object, comprising recording one or more diffraction patterns at a detector, wherein each diffraction pattern is formed by a target object scattering incident radiation, determining a phase map for at least a region of the target object based on the one or more diffraction patterns, and determining a refractive property of the target object based on the phase map.

An apparatus and a method for optical measurement of an internal contour of a spectacle frame are disclosed. The apparatus contains an optical unit, which is configured to capture light reflected from an illuminated section of the inner contour of the spectacle frame. The optical unit is insertable into the inner contour of the spectacle frame and, when inserted as intended, is rotatable relative to the spectacle frame. The optical unit contains at least one light source, an objective, and at least one optical sensor, wherein the light source is configured to generate a light section, wherein at least one section of the inner contour is illuminable by the light section, wherein the objective is configured to image the illuminated section of the inner contour onto the optical sensor, and wherein the optical sensor is configured to capture the light reflected by the illuminated section of the inner contour.

A test pattern (170) comprising a set of dots (174) which define a first ellipse (176) of best fit in which the major and minor axes R1, R2 are equal (i.e. a circle) is displayed on a plane surface and a digital image of the (usually distorted) test pattern seen through a lens is captured. A second ellipse of best fit joining the dots in the set is derived from the distorted test pattern in the image. Characteristics of the first and second ellipses are compared to determine the degree and nature of distortion to the test pattern, from which the power of the lens is calculated. The major and minor axes of the first and second ellipses may be compared. The test pattern can include a number of said sets of dots distributed over an area of the surface with each set being analysed to determine the optical parameters of the lens at multiple locations.

An automatic leveling system includes a platform, a leveling device provided on the platform, a loading tray provided on the leveling device, three reflecting devices provided on the loading tray, an image acquisition device provided above the loading tray, a height positioning device provided on an end of the image acquisition device facing the loading tray, a light source configured to emit light, and a controller coupled to the image acquisition device. The height positioning device processes light emitted by the light source into three paths of light to the three reflecting devices. The three reflecting devices reflect the three paths of light. The image acquisition device acquires the three paths of reflected light into a light signal. The controller detects deflection values of the loading tray according to the light signal and controls the leveling device to level the loading tray.