Patent classifications
G01M11/0257
Apparatus and System for Visual Inspection of Fiber Ends and Image Analysis Tool for Detecting Contamination
A visual inspection device and apparatus is disclosed for inspecting fiber ends of a connector by capturing an image of the connector end face, and implementing an image analysis tool for detecting contamination from the captured image. The visual inspection tool includes components for providing a larger field of view to capture the entire connector end face in a single image, and the image analysis tool is able to accurately and efficiently detect contamination from the captured image.
Aspheric lens eccentricity detecting device based on wavefront technology and detecting method thereof
The present invention discloses an aspheric lens eccentricity detecting device based on wavefront technology and a detecting method thereof. The device comprises: an upper optical fiber light source, an upper collimating objective lens, an upper light source spectroscope, an upper beam-contracting front lens, an upper beam-contracting rear lens, an upper imaging detector, an upper imaging spectroscope, an upper wavefront sensor, a lens-under-detection clamping mechanism, a lower light source spectroscope, a lower beam-contracting front lens, a lower beam-contracting rear lens, a lower imaging spectroscope, a lower wavefront sensor, a lower imaging detector, a lower collimating objective lens and a lower optical fiber light source. The present invention achieves non-contact detection, with no risk of damaging the lens, and there is no moving part in the device, so the system reliability and stability are high; and in the present invention, various eccentricity errors in the effective aperture of the aspheric lens can be detected at a time, thereby avoiding errors caused by splicing detection, and also greatly reducing the detection time, thus being applicable to online detection on an assembly line.
COMBINATION DETECTOR FOR DETECTING VISUAL AND OPTICAL PROPERTIES OF AN OPTICAL SYSTEM AND ASSOCIATED TESTING APPARATUS FOR AN OPTICAL SYSTEM
A combination detector for detecting a visually identifiable property and an optical property of an optical system. A phase visualization element converts an incoming light bundle to one or more output light bundles in which the spatial phase distribution of the incoming light bundle is visually apparent. The phase visualization element is arranged relative to a detection surface of an image sensor such that the output light bundle or the output light bundles is/are incident only on a first partial region of the detection surface, while a second partial region of the detection surface is exposed in the direction of incidence in order to detect the incoming light bundle which is uninfluenced by the phase visualization element. An apparatus for testing the optical system includes a light source for generating a measuring light bundle and a combination detector as described.
Method and test system for assessing the quality of a multi-channel micro- and/or subwavelength-optical projection unit
A method for assessing the quality of a multi-channel micro- and/or subwavelength-optical projection unit is disclosed. The method comprises the following steps: At least a predefined portion of the optical projection unit is illuminated so that an image is generated by at least two channels of the predefined portion of the multi-channel optical projection unit. At least one characteristic quantity is determined based on the analysis of the image, wherein a value of the characteristic quantity is associated with a characteristic feature of the projection unit, a defect of the projection unit and/or a defect class of the projection unit. The quality of the projection unit is assessed based on the at least one characteristic quantity. Moreover, a test system for assessing the quality of a multi-channel micro- and/or subwavelength-optical projection unit and a computer program are disclosed.
Optical fiber endface inspection microscope having adapter tip detection and autoconfiguration
There are provided an optical-fiber connector endface inspection microscope system and a method for inspecting an endface of an optical-fiber connector. The inspection microscope device is releasably connectable to an adapter tip configured to interface with the optical-fiber connector to inspect the endface thereof. The adapter tip is one among a plurality of adapter tip types adapted to inspect respective types of optical-fiber connectors. The optical-fiber connector endface inspection microscope system comprises a tip detection system adapted to recognize the type of the adapter tip among the plurality of adapter tip types; and is configured to analyze inspection images to produce an inspection result for the endface, at least partly based on a fiber type corresponding to the recognized adapter tip and/or other information read by the tip detection system.
Calibrated focus sensing
An apparatus for evaluating focus, including (a) a stage configured to hold a specimen; and (b) an optical train including a radiation source, calibration optic, objective and detector, the optical train forming a first path wherein radiation from the radiation source is directed to the calibration optic and then a first portion of the radiation is directed to the detector, thereby forming a first image on the detector, wherein a second portion of the radiation follows a second path from the calibration optic then through the objective to the specimen, wherein the optical train forms a third path wherein radiation reflected from the specimen is transmitted through the objective, then to the detector, thereby forming a second image on the detector, and wherein the radiation that forms the first image is astigmatic.
System and method for testing a spectral response speed of a tunable filter
A system for testing a spectral response speed of a tunable filter is disclosed, which includes a collimating light source, a beam splitting element, a focusing lens, and an image recording device of light spot position arranged successively. The tunable filter is disposed between the collimating light source and the beam splitting element and configured to be continuously tuned within a certain wavelength range during testing. The beam splitting element is used to form light beams of different wavelength bands passing through the tunable filter into diffracted beams or refracted beams corresponding to different wavelength bands. The focusing lens is used to perform focusing. The image recording device of light spot position is used to record change information about positions where the diffracted beams or refracted beams corresponding to different wavelength bands are imaged.
Testing box proofed against light flares during the testing of image-capturing devices
A camera-testing box for testing optical properties of an image-capturing device includes a box body, a light source, a photographic film, a mask, and a base. The light source is disposed inside the light-free box body. The photographic film is disposed on a side of the light source inside the box body. The mask is disposed on a side of the photographic film away from or facing the light source, and the mask includes a transparent area and a shielding area to reduce flare-causing light reflected by screws and other extraneous objects in the camera-testing box. The base is disposed inside the box body, and on a side of the mask away from the light source. The base supports the to-be-tested image-capturing device.
ABERRATION ESTIMATING METHOD, ABERRATION ESTIMATING APPARATUS, AND STORAGE MEDIUM
An aberration estimating method includes acquiring a light intensity distribution of an optical image of an object formed via a target optical system, acquiring an approximated aberration of the target optical system based on the light intensity distribution, determining an initial value of the aberration of the target optical system based on the approximated aberration, and estimating an aberration of the target optical system using the initial value.
OPTICAL MEASUREMENT METHOD AND SYSTEM AND OPTICAL DEVICE MANUFACTURING SYSTEM
An optical measurement method and system and an optical device manufacturing system are provided. The optical measurement system includes an image generation system, an image measurement system and a control system. The image generation system is configured for generating test image information and outputting light containing the test image information to a device under test. The image measurement system is configured for obtaining detected image information according to the light passing through the device under test. The control system is configured for obtaining an aberration parameter according to imaging quality of the detected image information. The optical measurement method and system and an optical device manufacturing system can simulate any wavefront, and an assembled lens element can be simulated directly according to the compensation of an unassembled lens element to achieve a final imaging effect.